| Patent No. | Patent Title: |
| 8174283 | Calibration technique for measuring gate resistance of power MOS ... |
| 8164325 | Displacement sensor |
| 8154275 | Apparatus and method for testing sense amplifier thresholds on an... |
| 8149011 | Stress programming of transistors |
| 8148991 | Efficient resistivity measurement method by multi-point simultane... |
| 8138771 | Touch controller with read-out line |
| 8134380 | Test probe structure |
| 8130005 | Electrical guard structures for protecting a signal trace from el... |
| 8130008 | Integrated circuit with a radiation-sensitive thyristor structure |
| 8125238 | Automatic test equipment |
| 8125236 | Main board and system for memory mounting test |
| 8120373 | Stiffener assembly for use with testing devices |
| 8115507 | Circuit and method for parallel testing and semiconductor device |
| 8111061 | Multi-output determination circuit |
| 8106675 | Test system |
| 8093919 | Test circuit, method, and semiconductor device |
| 8093890 | Hall-effect switch circuit allowing low voltage operation |
| 8093916 | Method of characterizing a semiconductor device and semiconductor... |
| 8089296 | On-chip measurement of signals |
| 8085056 | Circuit for testing internal voltage of semiconductor memory appa... |
| 8081009 | Printed circuit board testing fixture |
| 8072226 | Nanostructure sensors |
| 8072209 | Position sensor with variable direction of magnetization and meth... |
| 8067953 | Semiconductor device for measuring ultra small electrical current... |
| 8063654 | Apparatus and method for testing of stacked die structure |
| 8063653 | Temperature control device and temperature control method |
| 8054070 | Nanomagnet-based magnetic anomaly detector |
| 8049487 | Power measurement circuit |
| 8049492 | Position measuring apparatus |
| 8044677 | Electrical system, voltage reference generation circuit, and cali... |
| 8035408 | Socket fixture for testing warped memory modules on a PC motherbo... |
| 8030915 | Integrated sensor with capacitive coupling rejection to the mecha... |
| 8018239 | Method and device for measuring powder properties |
| 8013600 | Mountable eddy current sensor for in-situ remote detection of sur... |
| 8004301 | Testing device for printed circuit boards |
| RE42637 | Probe card |
| 8004274 | Inductive position sensor |
| 8004282 | Method of measuring and imaging RXO (near wellbore resistivity) u... |
| 7999563 | Chuck for supporting and retaining a test substrate and a calibra... |
| 7994809 | Transfer mechanism for target object to be inspected |
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