U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Solis, Jose M.


Primary examiner statistics: 1 patents; average approval time: 411 days
Assistant examiner statistics: 958 patents; average approval time: 753 days

Patents as Assistant Examiner


1                      
NumberTitleIssue Date
6236219Programmable voltage divider and method for testing the impedance of a programmable element
A programmable voltage divider has normal and test modes of operation. The divider includes first and second supply nodes, a divider node that provides a data value, and a first divider element that is coupled between the first supply node and the divider...
05/22/2001
6229318Electrical resistance type humidity sensor
An electrical resistance type humidity sensor is herein disclosed which comprises a humidity sensor in which electrodes are formed on a woodceramics substrate having linear characteristics with humidity, and a temperature sensor for temperature correction...
05/08/2001
6229316Measuring method by spectrum analyzer
A spectrum analyzer in which automatic setting of parameters such as band width is done by the analyzer without manual operator input and noise measurements are determined and displayed to the operator. This is accomplished by an input signal being suppli...
05/08/2001
6225812Method and apparatus for measuring the density of a substance having free water compensation
A method and apparatus for measuring the amount of free water contained within a substance includes a waveguide having front and back sides disposed opposite each other. The waveguide defines a chamber for propagating a microwave signal therethrough. The ...
05/01/2001
6208148Battery charger
An end-of-charge detection technique for a battery charger is described. The technique involves the detection of a voltage drop at the end of charging and eliminates the effect of noise spikes....
03/27/2001
6204656Miniature sensor for lubricant analysis
A fluid contamination analyzer employs one or more micro-miniature sensors which provide for a substantial reduction in sensor dimensions form prior art dimensions of approximately 2 in.×2 in. to approximately 1 mm×1 mm. The sensors are incorporated int...
03/20/2001
6204678Direct connect interconnect for testing semiconductor dice and wafers
An interconnect and system for testing semiconductor dice, and a test method using the interconnect are provided. The interconnect includes a substrate having patterns of contact members for electrically contacting the dice. The interconnect also includes...
03/20/2001
6201400Bulls-eye mid-frequency impedance probe
The bulls-eye mid-frequency impedance probe has probe electrodes of a larger surface area that conform to the test surface to provide a very low impedance coupling between the probe and surface, unlike other open end coaxial probes. This probe provides ac...
03/13/2001
6191593Method for the non-invasive sensing of physical matter on the detection surface of a capacitive sensor
A capacitance sensor detects the absence/presence of physical matter on a sensing surface of the sensor. The capacitive sensor is a multi-cell sensor wherein each cell has one or more buried, protected, and physically inaccessible capacitor plates. The se...
02/20/2001
6191570System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment
A method for testing node isolation on a circuit board. The method utilizes an automated test system having a plurality of test channels, wherein each test channel has a digital driver with a first input and a first output, and a digital receiver with a s...
02/20/2001
6188225Circuit and method for checking the contacting of a switch or pushbutton
In a circuit for checking the correct contacting of a switch or pushbutton in a d.c. circuit, the switch or pushbutton is connected alternatively with at least one input and at least one output of a controller or microprocessor, and a capacitor arrangemen...
02/13/2001
6172505Electronic battery tester
An apparatus for electronically testing or monitoring the condition of a storage battery is provided. The apparatus includes an inductance cancellation circuit for use in a Kelvin probe of an electronic battery tester. The induction cancellation circuit r...
01/09/2001
6172507Circuit configuration for measuring resistance and leakage
A circuit configuration for measuring resistance and/or leakage between two nodes, which includes a current source for feeding a test current into one of the two nodes and a circuit element that detects the voltage resulting between the two nodes. The out...
01/09/2001
6169394Electrical detector for micro-analysis systems
A micro-electric detector provides conductivity or impedance based measurements of a test sample placed in a microchannel of a micro-analysis system. The detector includes a pair of electrodes disposed on opposing sidewalls of the microchannel to create a...
01/02/2001
6169406Very low frequency high voltage sinusoidal electrical testing method, systems and apparatus
Very low frequency (VLF) high voltage (HV) sinusoidal electrical test waves provide for testing AC electrical power installations and equipment having large electrical capacitances. VLF HV sinusoidal electrical waves are suitable for testing characteristi...
01/02/2001
6160406Condom testing apparatus
A condom testing apparatus utilizing an arcing electrical current to detect holes and excessively thin wall areas in a condom mounted on a conductive testing mandrel, where the condom is passed across a conductive fabric member to test the main body and t...
12/12/2000
6157184Insulated electrostatic voltage indicator
An indicator for mounting on a power cord (FIG. 3) for almost instantaneously indicating the presence or absence of a single-phase AC voltage potential on a monitored power cord for a grounded AC power distribution system. The indicator comprises a housin...
12/05/2000
6154041Method and apparatus for measuring thickness of semiconductor substrates
A method and apparatus for measuring sheet resistance and thickness of thin films and substrates. A four-point probe assembly engages the surface of a film on a substrate, and the thickness of the substrate is determined from the point of contact between ...
11/28/2000
6150824Contactless system for detecting subtle surface potential charge patterns
A contactless process for detecting electrical patterns on the outer surface of a member comprising providing a member having a charge pattern on an outer surface, repetitively measuring the charge pattern on the outer surface of the member with an electr...
11/21/2000
6147500EDM with jump motion detecting reactive force
An electric discharge machine for machining a workpiece by an electric discharge by supplying a machining fluid to a gap between an electrode and the workpiece and supplying pulses to the workpiece while providing the electrode with a jump motion having a...
11/14/2000
6140825Method and apparatus for evaluating quality of resistance welds
A method for evaluating quality of a resistance weld is provided, in which a nugget generation state during a welding process is evaluated by observable numerical values based on physical phenomena, and which can afford a wide application range in welding...
10/31/2000
6140821Method and system for the recognition of insulation defects
The invention concerns a method for the recognition of insulation defects in a circuit adapted for connection to a low-ohmic current source or sink having off-load voltage Un0, Towards this end the circuit is initially subjected, in a separated...
10/31/2000
6137283Process and machine for signal waveform analysis
Highly accurate time interval measurement is achieved for an electrical waveform. The electrical waveform is sampled and converted to a series of voltages, and the series of voltages is interpolated in order to form a time tag list, using interpolations t...
10/24/2000
6130531Phase angle measurement method and system in electric power systems
A system and method for measuring phase-angle in electrical power systems includes inputting a reference signal into a receiving terminal of a communication system at a reference station and then sending the reference signal through the communication syst...
10/10/2000
6130540Measurement system for electric disturbances in a high-voltage switchboard plant
In a measurement system for electric disturbances in a metalen-capsulated high-voltage switchgear having at least one measurement probe for each phase for decoupling of electromagnetic interference signals, both the interference signals and the useful vol...
10/10/2000
6130530Tester for power transformers and capacitors
A tester for power transformers and capacitors includes a pulse generator for applying a pulsating test signal to a pair of test leads which may be connected across the terminals of the device to be tested. Also connected across the test leads are a capac...
10/10/2000
6127829Method and apparatus for the efficient test of the center frequency of bandpass filters
A method and apparatus for determining the center frequency of a bandpass filter. The center frequency of a bandpass filter is determined by applying a bias voltage to a bandpass filter circuit receiving a pair of differential input voltages and producing...
10/03/2000
6124717Low frequency suppression circuit for a time domain reflectometer
An improved time domain reflectometer (TDR) includes a capacitor coupled in series between a transmission medium under test and the TDR receiver input. A switch, operating under microprocessor control, selectively couples and uncouples the capacitor to a ...
09/26/2000
6121782Method for measuring yield and moisture
A method and apparatus for measuring at least one parameter including mass flow rate or moisture content of material moved by a conveyor are disclosed herein. The method includes the steps of applying an electric field to the material using a non-intrusiv...
09/19/2000
6121777Apparatus for detecting at least one property of a cable
A method detects at least one property, such as cable length, of a multiconductor cable linked to a module by way of a logic and evaluation circuit within the module. The cable has at least one supply conductor connected by the module to a first potential...
09/19/2000
6118281Method for determining the shielding effect of a shielded cabling path
A method for determining the shielding effectiveness of a shielded and, particularly, permanently installed cabling path wherein the cabling path has an inside conductor connected via a patching cable at a first end to a transmitter which emits an electri...
09/12/2000
6118269Electric meter tamper detection circuit for sensing electric meter removal
An electric meter tamper detection system for sensing removal of an electric meter from a corresponding meter socket and for generating a tamper signal is disclosed. In this system, the tamper signal is relayed to a headend when the electric meter--connec...
09/12/2000
6118268Thermoelectric measuring device
A thermoelectric measurement converter is disclosed, which forms the output signal as the product of the instantaneous values of two input signals; wherein the measurement converter comprises at least one electronic resistor and at least one temperature s...
09/12/2000
6107803Streaming current sensor
A streaming current sensor on which the placement of the sample outlet lower on the vertical axis than the sample inlet so as to increase the accuracy, reliability, and sensitivity of the sensor in comparison to those of the prior art, by enabling contami...
08/22/2000
6107806Device for magnetically sensing current in plate structure
A device (16) for sensing current flowing in a generally flat plate structure (10) contains a magnetic head (18) and signal processing circuitry (20). The magnetic head (a) senses changes in current-induced magnetic flux as the head is positioned over the...
08/22/2000
6100703Polarization-sensitive near-field microwave microscope
A microwave microscope for measuring electrical characteristics of a sample, such as a semiconductor wafer, with fine resolution. A probe includes a microwave waveguide capable of supporting the two lowest orthogonal modes from a microwave source, e.g. of...
08/08/2000
6097191Testing high intensity discharge lamp fixtures
A diagnostic device and associated operational procedure are used to both verify the integrity of components of high intensity discharge light fixtures and also troubleshoot problems in the wiring connecting the light fixture to the AC power source (trans...
08/01/2000
6094042Probe compensation for losses in a probe cable
A probe tip for connecting an instrument to a circuit under test is disclosed. The probe tip is interchangeable with other probe tips to provide different attenuations of the signal under test to the instrument. The signal from the circuit under test is c...
07/25/2000
6094053Method and apparatus for identifying electronic circuits in a distributed electronic system
In one embodiment of the present invention, a distributed electronic system includes a plurality of electronic modules. Each of the electronic modules is coupled to one battery in a series connection of batteries. The electronic modules are coupled to a c...
07/25/2000
6091236System and method for measuring and analyzing electrical signals on the shaft of a machine
The present invention provides a system and method for monitoring an electrical signal appearing on a rotating machine shaft. The system comprises a probe assembly for placement against the rotating machine shaft that is in electrically conductive contact...
07/18/2000
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