U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Moffat, Jonathan


Primary examiner statistics: 0 patents; average approval time: N/A
Assistant examiner statistics: 120 patents; average approval time: 962 days

Patents as Primary Examiner

Patent No. Patent Title:
No patents.

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
7454318 Method and terminal for detecting fake and/or modified smart card
7454294 Monitoring Z-values for clinical data interpretation
7451058 Adaptive pace estimation device and method
7447601 Power supply controller method and structure
7440857 Method and a system for detecting and locating an adjustment erro...
7437255 Method and system for calibrating triaxial acceleration sensors
7433799 Method of determining shape data
7433784 Method to determine properties of a sedimentary body from thickne...
7430490 Capturing and rendering geometric details
7430487 System and method for implementing a programmable DMA master with...
7428467 Method for tangential force variation and angular acceleration fl...
7428470 Method for monitoring edge exclusion during chemical mechanical p...
7418351 Methods for analysis of measurement errors in measured signals
7415387 Die and wafer failure classification system and method
7415388 Method for the automatically determining the indirect and direct ...
7412343 Methods for delay-fault testing in field-programmable gate arrays
7412347 Method and apparatus for measuring physical parameters
7409302 Method and apparatus for vibration detection and vibration analys...
7409314 Method for first pass filtering of anomalies and providing a base...
7406388 Calibration process management system and data structure
7406398 System and method for determining pump underperformance
7403868 Apparatus for detecting or predicting tool breakage
7395169 Memory test engine
7392145 Speedometer drive apparatus and method
7386415 System and method for increasing sensor resolution using interpol...
7383142 Method and apparatus for resolving individual signals in detector...
7383136 Fundamental mistuning model for determining system properties and...
7366620 Evaluation method of fine pattern feature, its equipment, and met...
7363173 Techniques for analyzing non-uniform curvatures and stresses in t...
7356425 Method and system for camera autocalibration
7353124 Device and method for voltage regulator with low standby current
7349817 Apparatus and method for reducing peak-to-average power ratio in ...
7343253 Coriolis mode processing techniques
7337072 Fluid sample testing system
7337086 System and method for combining diagnostic evidences for turbine ...
7333913 Clearance measurement system and method of operation
7333908 Techniques for generating test patterns in high speed memory devi...
7330797 Apparatus and method for measuring settlement of solids in a mult...
7328138 Method and system of measurement and optimization of noise in ser...
7328134 Enterprise integration test tool
 
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