| Patent No. | Patent Title: |
| 7728311 | Charged particle radiation therapy |
| 7598509 | Laser produced plasma EUV light source |
| 7541577 | Methods for analyzing ion mobility data |
| 7534996 | Velocity imaging tandem mass spectrometer |
| 7534999 | Quantum beam aided atomic force microscopy and quantum beam aided... |
| 7531799 | Charged particle beam column |
| 7531820 | Arrangement and method for the generation of extreme ultraviolet ... |
| 7528389 | Profile adjustment in plasma ion implanter |
| 7528369 | Charged droplet spray probe |
| 7525103 | Technique for improving uniformity of a ribbon beam |
| 7518108 | Electrospray ionization ion source with tunable charge reduction |
| 7518110 | Pattern measuring method and pattern measuring device |
| 7514214 | Selective functionalization of carbon nanotube tips allowing fabr... |
| 7511287 | Systems and methods that mitigate contamination and modify surfac... |
| 7511270 | Nanotube probe and a method for manufacturing the same |
| 7507980 | Disinfecting device utilizing ultraviolet radiation |
| 7504621 | Method and system for mass analysis of samples |
| 7498566 | Automated quality control mechanism for a nuclear detector |
| 7491932 | Multipole ion guide having longitudinally rounded electrodes |
| 7491953 | Ion implantation device and a method of semiconductor manufacturi... |
| 7488932 | Apparatus for producing atomic beam |
| 7488961 | Charged particle beam irradiation method and charged particle bea... |
| 7488959 | Apparatus and method for partial ion implantation |
| 7485880 | Charged particle beam scan and irradiation method, charged partic... |
| 7485859 | Charged beam apparatus and method that provide charged beam aeria... |
| 7485882 | Hand held magnetic induction thermography system |
| 7482597 | Method and device for generating Alfvén waves |
| 7482580 | Dynamic adjustment of ion monitoring periods |
| 7482577 | System and method of sorting materials using holographic laser st... |
| 7476884 | Device and method for generating extreme ultraviolet (EUV) radiat... |
| 7476889 | Radiation detectable and protective articles |
| 7476877 | Wafer charge monitoring |
| 7462817 | Mass spectrometer and method of analyzing isomers |
| 7459702 | Apparatus and method for polishing gemstones and the like |
| 7449689 | Dimension measuring SEM system, method of evaluating shape of cir... |
| 7446329 | Erosion resistance of EUV source electrodes |
| 7446313 | Scanning electron microscope |
| 7429728 | Distance of flight spectrometer for MS and simultaneous scanless ... |
| 7425700 | Systems and methods for discovery and analysis of markers |
| 7420184 | Particle-optical apparatus with temperature switch |
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