U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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...During the Civil War, the Confederacy established its own Patent Office which issued 266 patents, a third of which concerned implements of war.

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Examiner: Hollington, Jermele


Primary examiner statistics: 323 patents; average approval time: 326 days
Assistant examiner statistics: 293 patents; average approval time: 950 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
7570074 Electronic overload relay for mains-fed induction motors
7463050 System and method for controlling temperature during burn-in
7463048 Packaged circuit module for improved installation and operation
7459921 Method and apparatus for a paddle board probe card
7456642 Handheld electronic test probe assembly
7449908 Process monitor for monitoring an integrated circuit chip
7449900 Probe card and testing method of semiconductor chip, capacitor an...
7449904 Integrated circuit burn-in methods and apparatus
7446545 Anisotropically conductive sheet
7446547 Cooling apparatus and testing machine using the same
7443181 High performance probe system
7439757 Apparatus and method for inspecting liquid crystal display
7436198 Test pattern of semiconductor device and test method using the sa...
7432729 Methods of testing electronic devices
7432726 Probe
7432699 Transformer with protection against direct current magnetization ...
7429868 Socket assembly for testing semiconductor device
7429856 Voltage source measurement unit with minimized common mode errors
7427857 Resistor structures to electrically measure unidirectional misali...
7427856 Current sensing apparatus
7423418 Module part
7414421 Insertable calibration device
7411408 Measurement method using solar simulator
7411382 Current detection apparatus
7408366 Probe tips and method of making same
7408370 Lighting device
7408374 Systems and methods for controlling of electro-migration
7403029 Massively parallel interface for electronic circuit
7397263 Sensor differentiated fault isolation
7394270 Semiconductor device, method and apparatus for testing same, and ...
7394240 Current sensor
7388388 Thin film with MEMS probe circuits and MEMS thin film probe head ...
7388365 Method and system for inspecting specimen
7382150 Sensitivity switchable detection circuit and method
7378834 Electronic assembly tester and method for optoelectronic device
7378861 Optical alignment loops for the wafer-level testing of optical an...
7375543 Electrostatic discharge testing
7372289 Semiconductor integrated circuit device and power supply voltage ...
7372251 Semiconductor integrated circuit and memory test method
7368927 Probe head having a membrane suspended probe

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
7173443 Semiconductor test system
7123034 Contactor assembly for common grid array devices
7009378 Time division multiplexed optical measuring system
6987381 Apparatus for adjusting waveform display position in waveform dis...
6967490 Real-time in-line testing of semiconductor wafers
6967492 Spring contact probe device for electrical testing
6965244 High performance probe system
6958619 Inspecting apparatus and inspecting method for circuit board
6937036 Interface device an interface between testing equipment and an in...
6924657 Real-time in-line testing of semiconductor wafers
6919717 Capacitor coupled voltage transformer and its input voltage param...
6917215 Semiconductor integrated circuit and memory test method
6911835 High performance probe system
6911815 Semiconductor test system and method of operating the same
6909302 Real-time in-line testing of semiconductor wafers
6909275 Electrical circuit for driving a load
6909299 System for testing multiple groups of IC-chips which concurrently...
6906540 Method for chemically etching photo-defined micro electrical cont...
6903566 Semiconductor device tester
6900627 Apparatus and method for testing semiconductor integrated circuit
6900650 System and method for controlling temperature during burn-in
6897671 System and method for reducing heat dissipation during burn-in
6897645 Docking system and method for docking in automated testing system...
6894509 Methods and systems for capacitive motion sensing and position co...
6894519 Apparatus and method for determining electrical properties of a s...
6894514 Circuit pattern detecting apparatus and circuit pattern inspectin...
6891392 Substrate impedance measurement
6888360 Surface mount technology evaluation board having varied board pad...
6885210 System and method for measuring transistor leakage current with a...
6885197 Indexing rotatable chuck for a probe station
6885212 Semiconductor device and test method for the same
6882172 System and method for measuring transistor leakage current with a...
6882139 Electronic component, tester device and method for calibrating a ...
6879169 Method for manufacturing and batch testing semiconductor devices
6879176 Conductance-voltage (GV) based method for determining leakage cur...
6876217 Method for testing semiconductor circuit devices
6876192 Testing system in a circuit board manufacturing line for a automa...
6876214 Method and apparatus for configurable hardware augmented program ...
6867579 Testing system in a circuit board manufacturing line for automati...
6867611 Temperature-controlled thermal platform for automated testing
 
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