| Patent No. | Patent Title: |
| 5594243 | Laser desorption ionization mass monitor (LDIM) |
| 5574280 | Focused ion beam apparatus and method |
| 5559331 | Split-ring infrared detector |
| 5532495 | Methods and apparatus for altering material using ion beams |
| 5504335 | Fluid treatment device and method |
| 5486702 | Scan technique to reduce transient wafer temperatures during ion ... |
| 5481117 | Shipping container for a nuclear fuel assembly |
| 5473165 | Method and apparatus for altering material |
| 5471059 | Multiple-detector system for detecting charged particles |
| 5471063 | Fluid disinfection system |
| 5468967 | Double reflection cathodoluminescence detector with extremely hig... |
| 5468966 | System for tomographic determination of the power distribution in... |
| 5468959 | Scanning probe microscope and method for measuring surfaces by us... |
| 5468958 | Quadrupole ion trap with switchable multipole fractions |
| 5468957 | Ejection of ions from ion traps by combined electrical dipole and... |
| 5466931 | Mass spectrometry method using notch filter |
| 5463221 | Electron beam measuring apparatus |
| 5463218 | Detection of very large molecular ions in a time-of-flight mass ... |
| 5463219 | Mass spectrometer system and method using simultaneous mode detec... |
| 5459315 | Quadrupole mass analyzer including spring-clamped heat sink plate... |
| 5457317 | Electron microscope, a camera for such an electron microscope, an... |
| 5455427 | Lithographic electron-beam exposure apparatus and methods |
| 5453616 | Probe microscope having error correction piezoelectric scanner |
| 5451794 | Electron beam current measuring device |
| 5449901 | Fine surface observing apparatus |
| 5449920 | Large area ion implantation process and apparatus |
| 5448061 | Method of space charge control for improved ion isolation in an i... |
| 5444263 | Instrument for the visual recognition of authenticity features in... |
| 5444243 | Wien filter apparatus with hyperbolic surfaces |
| 5442186 | Radioactive source re-encapsulation including scored outer jacket |
| 5442183 | Charged particle beam apparatus including means for maintaining a... |
| 5442185 | Large area ion implantation process and apparatus |
| 5440137 | Screw mechanism for radiation-curing lamp having an adjustable ... |
| 5440131 | Wiper assembly for ultraviolet-light reactor tubes |
| 5440132 | Systems and methods for controlling the temperature and uniformit... |
| 5440123 | Method for preparation of transmission electron microscope sample... |
| 5438204 | Twin-mask, and method and system for using same to pattern m... |
| 5438203 | System and method for unipolar magnetic scanning of heavy ion bea... |
| 5436447 | Method and apparatus for determining relative ion abundances in m... |
| 5434420 | Industrial material processing electron linear accelerator |
Bizarre Patents 
PatentStorm News
