U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Berman, Jack I.


Primary examiner statistics: 2790 patents; average approval time: 2789 days
Assistant examiner statistics: 340 patents; average approval time: 728 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
7989764 Ion trap mass spectrometry method
7732766 Method for measuring information transfer limit in transmission e...
7569812 Remote reagent ion generator
7544937 Charged particle beam device for high spatial resolution and mult...
7525086 Spray glow discharge ionization method and system
7495215 Probe for a scanning magnetic force microscope, method for produc...
7495231 MALDI sample plate imaging workstation
7485879 Electron beam writing apparatus and writing method
7485854 Sampling device for introduction of samples into analysis system
7476880 Writing a circuit design pattern with shaped particle beam flashe...
7473907 Illumination system for a wavelength of ≦ 193 nm, with sensors ...
7465946 Alternative fuels for EUV light source
7465923 Testing method for semiconductor device, testing apparatus theref...
7465920 Ionization method and apparatus for mass analysis
7462849 Sterilizing lamp
7462821 Instrumentation, articles of manufacture, and analysis methods
7462838 Electrostatic deflection control circuit and method of electronic...
7462842 Device, EUV lithographic device and method for preventing and cle...
7462845 Removable liners for charged particle beam systems
7462843 Apparatus and methods for ion beam implantation
7462820 Isotope separation process and apparatus therefor
7462850 Radical cleaning arrangement for a lithographic apparatus
7462824 Combined ambient desorption and ionization source for mass spectr...
7462826 Atmospheric pressure charged particle discriminator for mass spec...
7462848 Optics for generation of high current density patterned charged p...
7462828 Inspection method and inspection system using charged particle be...
7459699 Method of determining processing position in charged particle bea...
7459700 Anthrax remediation and response
7459682 Spin-polarized electron source and spin-polarized scanning tunnel...
7459692 Electron confinement inside magnet of ion implanter
7459679 Method and apparatus for mass selective axial transport using pul...
7459701 Stage apparatus, lithographic apparatus and device manufacturing ...
7459680 Method of analysis using energy loss spectrometer and transmissio...
7459673 Atomic device
7459703 Ion implant beam angle integrity monitoring and adjusting
7459704 Ion source configuration for production of ionized clusters, ioni...
7459674 Optical tweezers
7459676 MALDI/LDI source
7459675 Mass spectrometer ionization source
7459677 Mass spectrometer for trace gas leak detection with suppression o...

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
5138157 Neutral particle beam propagation direction determining apparatus...
4908512 Apparatus and methods of use in the mass analysis of chemical sam...
4874946 Method and apparatus for analyzing the internal chemistry and ...
4874942 Rotation, acceleration, and gravity sensors using quantum-mechani...
4853551 Safety interlock for x-ray particle size analyzer
4847506 Hardening of spacecraft structures against momentary high level ...
4843239 Compact double focussing mass spectrometer
4839523 Ion implantation apparatus for semiconductor manufacture
4839521 Treatment chamber for the photopolymerization of dental plastics
4833329 System for generating and containerizing radioisotopes
4833330 Anticontaminator for transmission electron microscopes
4831266 Detector objective for particle beam apparatus
4831267 Detector for charged particles
4829178 Apparatus for surface analysis
4829190 Automatic hydraulic clamping mechanism for a window foil holder o...
4827139 Spent nuclear fuel shipping basket and cask
4827137 Soft vacuum electron beam patterning apparatus and process
4825088 Lightweight titanium cask assembly for transporting radioactive m...
4824242 Non-invasive oximeter and method
4823004 Tunnel and field effect carrier ballistics
4823011 Ion-projection lithographic apparatus with means for aligning the...
4820928 Lithography apparatus
4820921 Method of beam centering
4818873 Apparatus for automatically controlling the magnification factor ...
4818862 Characterization of compounds by time-of-flight measurement utili...
4818885 Electron beam writing method and system using large range deflect...
4818878 Double-container unit for transporting and storing radioactive wa...
4818869 Method of isolating a single mass or narrow range of masses and/o...
4816693 Apparatus and method for uniform ion dose control
4814615 Method and apparatus for detecting defect in circuit pattern of a...
4812040 Hollow cathode plasma plume
4812652 Imaging method and apparatus for electron microscopes
4812661 Method and apparatus for hybrid I.C. lithography
4810879 Charged particle energy analyzer
4810882 Mass spectrometer for positive and negative ions
4810886 Electron microscope
4810878 Ion source for mass spectrometer
4808831 Container for wet and dry radioactive samples
4806771 Solid, soft, light metal impact skirts for radioactive waste and ...
4803355 Mass spectrometer
 
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