U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Underwood, J


Primary examiner statistics: 0 patents; average approval time: N/A
Assistant examiner statistics: 53 patents; average approval time: 1140 days

Patents as Primary Examiner

Patent No. Patent Title:
No patents.

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
7400407 Meter for measuring the turbidity of fluids using reflected light
7394530 Surface inspection technology for the detection of porosity and s...
7375806 Method for inspecting the quality criteria of flat textile struct...
7372580 Three-dimensional shape detecting device, three-dimensional shape...
7369230 Apparatus and method for measuring particulate flow rate
7365837 Vision inspection apparatus using a full reflection mirror
7365835 Dark-field laser-scattering microscope for analyzing single macro...
7355693 Pattern inspection apparatus
7355686 Optical system including molded optical element and method of man...
7355724 Three-dimensional measurement system
7352461 Particle detecting method and storage medium storing program for ...
7352465 Sample conditioning and environmental control techniques for gas ...
7345750 Method of accelerated testing of illuminated device components
7345764 Apparatus and method for a slim format spectrometer
7345754 Fourier filters and wafer inspection systems
7342654 Detection of impurities in cylindrically shaped transparent media
7333196 Evaluation apparatus and evaluation method
7330278 Optical displacement measurement device
7330262 Methods and apparatus for determining the content materials of a ...
7321426 Optical metrology on patterned samples
7319522 Systems and methods for in situ spectroscopic measurements
7317524 Method and device for detecting surface defects on the neck ring ...
7316322 Quality evaluation apparatus for fruits and vegetables
7317519 Swept-angle SPR measurement system
7315379 Evaluating method and apparatus thereof
7312849 Substrate alignment apparatus and method, and exposure apparatus
7312871 Method and apparatus for alignment of components
7312878 Method for manufacturing a scale, a scale manufactured according ...
7307725 Surface inspection apparatus, polarization illuminating device an...
7307254 Scanning electron microscope
7298470 Defect inspection device for metal ring end faces of a continuous...
7283223 Cytometer having telecentric optics
7280213 Light detection device
7274458 Thermoplastic film having metallic nanoparticle coating
7274451 Optical beam translation device and method utilizing a pivoting o...
7271889 Device and method for inspecting an object
7271912 Method of determining analyte concentration in a sample using inf...
7271895 Fluorescent sensor on basis of multichannel structures
7268871 Measuring head for planar measurement of a sample
7268877 Method and apparatus for orienting semiconductor wafers in semico...
 
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