U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Alli, Iyabo S


Primary examiner statistics: 0 patents; average approval time: N/A
Assistant examiner statistics: 205 patents; average approval time: 210 days

Patents as Primary Examiner

Patent No. Patent Title:
No patents.

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
8189901 Seed sorter
8184897 Method and apparatus for determining an optical threshold and a r...
8179532 Method and apparatus for monitoring the condition of a projector ...
8174693 Calibration optic for a solar/earth spectrometer
8169622 Optical sensor for mounting to a washing machine or dish washer
8169612 System and method for performing ellipsometric measurements on an...
8165382 Glazing inspection method
8164753 Alignment mark arrangement and alignment mark structure
8164758 Internal inspection system and method
8159676 Ratiometric surface plasmon coupled emission detector
8149402 Optical system for a flow cytometer
8144338 Pattern measurement apparatus and pattern measurement method
8144341 Making method of sample for evaluation of laser irradiation posit...
8144969 Pattern evaluation method, computer-readable recording medium, an...
8144973 Multi-modal imaging
8144317 Method to locate and eliminate manufacturing defects in a quartz ...
8144327 Photoacoustic apparatus, and probe for receiving photoacoustic wa...
8144328 Methods and apparatus for normalizing optical emission spectra
8134712 Apparatus and method for estimation of ore quality using color co...
8125652 Wafer center finding with charge-coupled devices
8125634 Optical additive solc filter for deep ultraviolet applications
8125635 Compact, low cost raman monitor for single substances
8125651 Substrate detection device and substrate conveyance apparatus
8121391 Device for measuring the thickness of printed products
8111894 Computer Tomography (CT) C-arm system and method for examination ...
8111389 Method of inspecting defects in circuit pattern of substrate
8111384 Method for measuring thermo-optically induced material phase-chan...
8107068 Raman spectroscopy system and Raman spectroscopy detection method
8102538 Method and apparatus for colour imaging a three-dimensional struc...
8094293 Glass thickness measurement using fluorescence
8085405 Detecting element, and target substance detecting device and meth...
8085404 Gas analyzer and gas analyzing method
8085396 Raman analysis
8085398 Concave compensated cell for the collection of radiated light
8081311 System for multispectral imaging
8077307 Illumination system for optical inspection
8072597 Method and its apparatus for inspecting particles or defects of a...
8072589 System and method for photoemission-based defect detection
8072613 System for measuring the inner space of a container and method of...
8064058 Light distribution measurement system
 
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