| Patent No. | Patent Title: |
| 7463368 | Laser projection system, intelligent data correction system and m... |
| 7456941 | Measuring device for measuring the refraction properties of optic... |
| 7456966 | Alignment mark system and method to improve wafer alignment searc... |
| 7456945 | Photonic device package with aligned lens cap |
| 7456967 | Mark position detection apparatus |
| 7453581 | Method of and apparatus for determining focus of an imaging syste... |
| 7453558 | Measuring device for measuring the refraction properties of optic... |
| 7453570 | Mark position measuring method and apparatus |
| 7446864 | Defect inspection method and defect inspection system using the m... |
| 7446876 | Vacuum ultra-violet reflectometer with stray light correction |
| 7446885 | Device for measuring in three dimensions a topographical shape of... |
| 7443497 | Mask inspection DNIR placement based on location of tri-tone leve... |
| 7443503 | Polarization measuring apparatus |
| 7443496 | Apparatus and method for testing defects |
| 7443489 | Surface enhanced spectroscopy-active composite nanoparticles |
| 7443498 | Method and apparatus for inspecting a mura defect, and method of ... |
| 7440086 | Methods and systems for creating a recipe for a defect review pro... |
| 7440106 | Apparatus on a spinning preparation for detecting foreign objects... |
| 7436513 | Wafer pre-alignment apparatus and method |
| 7436509 | Machine for inspecting glass containers |
| 7433057 | Method for accurate high-resolution measurements of aspheric surf... |
| 7433039 | Apparatus and methods for reducing tool-induced shift during over... |
| 7430049 | Method and device for analyzing the surface of a substrate |
| 7428063 | Overlay measurement apparatus |
| 7414737 | Positioning device for positioning a user by using both eyes as p... |
| 7414738 | Measuring device for measuring the degree of transmission of a co... |
| 7411681 | System for automated determination of retroreflectivity of road s... |
| 7411688 | Method and system for laser intensity calibration in a three-dime... |
| 7408643 | Method and apparatus for inspecting samples, and method for manuf... |
| 7403281 | Raman spectrometer |
| 7400394 | Co-deployed optical referencing for responsive dust-based sensing... |
| 7400392 | Apparatus for handling of a disklike member, especially for handl... |
| 7385710 | Measuring device |
| 7372560 | Pattern inspection apparatus |
| 7369243 | Optical measuring apparatus and optical measuring method |
| 7362436 | Method and apparatus for measuring optical overlay deviation |
| 7362453 | Method for the characterization of a film |
| 7362438 | COD measuring method and device |
| 7355702 | Confocal observation system |
| 7349103 | System and method for high intensity small spot optical metrology |
Celebrity Inventors 
PatentStorm News
