| Patent No. | Patent Title: |
| 8169605 | Apparatus and method for inspecting liquid crystal display |
| 8085401 | Ozone concentration sensor |
| 8072598 | Condensation particle counter |
| 8014004 | Determining physical property of substrate |
| 8004693 | Lens holder and lens shape measuring apparatus |
| 8004668 | Fluorescent color calibrator for calibrating RGB pixel values |
| 7990549 | Method and apparatus for optically measuring periodic structures ... |
| 7990529 | Detection circuit and foreign matter inspection apparatus for sem... |
| 7990546 | High throughput across-wafer-variation mapping |
| 7990527 | Refractive-index sensor |
| 7986417 | Laser projection systems and methods |
| 7986405 | Foreign matter inspection method and foreign matter inspection ap... |
| 7982874 | Method and apparatus for measuring particle sizes in a liquid fie... |
| 7978331 | Attenuated total reflection optical probe and apparatus therewith... |
| 7978330 | Detecting a target using an optical augmentation sensor |
| 7978320 | Light angle detection device, method for fabrication thereof and ... |
| 7969577 | Inspection apparatus, an apparatus for projecting an image and a ... |
| 7961313 | Photoacoustic point spectroscopy |
| 7940391 | Pre-aligned metrology system and modules |
| 7940383 | Method of detecting defects on an object |
| 7940380 | Rotary position detector and associated methods |
| 7929154 | Laser irradiation apparatus and laser irradiation method and meth... |
| 7924438 | Method for measuring wear in the refractory lining of a metallurg... |
| 7920265 | Apparatus and method for noise reduction in modulated optical ref... |
| 7916308 | Method and optical profiler |
| 7907270 | Inspection apparatus and method, and production method for patter... |
| 7907275 | Type selective and polarization selective device for Raman spectr... |
| 7898673 | Systems and methods for focusing optics |
| 7880883 | Fluid flow computation, visualization, and analysis |
| 7872741 | Method and apparatus for scatterfield microscopical measurement |
| 7859664 | Plurality of samples and method for selecting a target sample the... |
| 7852481 | Apparatus and method for measuring optical property |
| 7847938 | Alignment system for optical lithography |
| 7843559 | System for detection of wafer defects |
| 7826069 | Laser projection systems and methods |
| 7821638 | Alignment mark |
| 7817277 | Fiber optic probe and related apparatus, systems and methods for ... |
| 7808628 | Method for nanoscale spatial registration of scanning probes with... |
| 7796246 | 3-D shape measuring method for auto-grinding equipment of LCD col... |
| 7796256 | Oil-immersion enhanced imaging flow cytometer |
Bizarre Patents 
PatentStorm News
