U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Akanbi, Isiaka


Primary examiner statistics: 0 patents; average approval time: N/A
Assistant examiner statistics: 34 patents; average approval time: 58 days

Patents as Primary Examiner

Patent No. Patent Title:
No patents.

Patents as Assistant Examiner

Patent No. Patent Title:
8189194 Direct illumination machine vision technique for processing semic...
8180143 Method and system for estimating contact patterns
8179529 Alignment systems and methods
8169623 Optical apparatus and method for measuring the attitude of an obj...
8169604 Parameter detection system
8164761 Differential focus blade clearance probe and methods for using sa...
8159673 Light amount detector, misalignment amount detector, and image de...
8149404 Method for aligning wafer and alignment apparatus using the metho...
8139842 Device and method for inspecting rechargeable battery connection ...
8139234 Method and apparatus for measuring optical extinction in a thin f...
8139219 Apparatus and method for semiconductor wafer alignment
8139218 Substrate distortion measurement
8139216 Optical package alignment systems and protocols
8135204 Computer-implemented methods, carrier media, and systems for crea...
8134709 Method of aligning a substrate
8130383 Optical signal analysis apparatus and optical signal analysis met...
8125642 Process to optically align a photoreceiver with a laser transmitt...
8120761 Method and apparatus for position judgment
8115931 Photoacoustic detector for measuring fine dust
8107059 Non-invasive probe for measuring body components and a non-invasi...
8102540 Coriolis flow sensor with optically reflective motion sensor
8089638 Stage with displacement magnification mechanism for measuring
8077314 Measuring a characteristic of a multimode optical fiber
8059279 Method and system for inspecting tire surface
8059274 Low-loss polarized light diversion
8054471 System and method for analyzing displacements and contouring of s...
8054453 Broad band referencing reflectometer
8049902 Mobile vehicle
8049892 Apparatus and method for camera-based color measurements
8049890 System and method for passive alignment of components in an optic...
8045164 Position finding system and method for use in aligning laser devi...
8040527 Refractive production of a concentrically fanned structured bundl...
8040518 Cavity enhanced trace gas detection gradiometer
7724379 3-Dimensional shape measuring method and device thereof
 
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