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| Number | Title | Issue Date |
| RE41743 | Optical fiber cable inlet device A watertight inlet device for inserting a cable containing optical fibers into a chamber or a container, e.g. into a splice box. The device includes a metal solepiece for securing the strength members of the optical cable, and which plugs into and fixes to a tubular... | 09/21/2010 |
| 7463363 | Method and apparatus for ultrasonic laser testing The present invention for detecting ultasonic displacements includes a detection laser to generate a first pulsed laser beam to generate the ultrasonic surface displacements on a surface of the target. A seocond pulsed laser beam to detect the ultrasonic surface dis... | 12/09/2008 |
| 7460246 | Method and system for sensing light using interferometric elements Certain embodiments of the invention provide a light sensor comprising at least one interferometric element that absorbs light in at least one wavelength. The interferometric element comprises a first surface and a second surface substantially parallel to the first ... | 12/02/2008 |
| 7440115 | System and methods for wavefront measurement A method and apparatus for characterizing an object with a wavefront from the object is disclosed. In one embodiment, the apparatus includes: a reticle positioned in a path of the wavefront, the reticle comprising two superimposed linear grating patterns; at least o... | 10/21/2008 |
| 7440108 | Imaging spectrometer including a plurality of polarizing beam splitters The present invention relates to an imaging apparatus and comprises input and output polarisers, a first polarising beam splitter and at least one additional polarising beam splitter, a light sensitive detector and focussing means arranged on an axis. The input pola... | 10/21/2008 |
| 7433053 | Laser inspection using diffractive elements for enhancement and suppression of surface features Apparatus for optical inspection of a sample includes a radiation source, adapted to irradiate a spot on the sample with coherent radiation, and collection optics, adapted to collect the radiation scattered from the spot so as to form a beam of scattered radiation. ... | 10/07/2008 |
| 7428058 | Apparatus and method for in situ and ex situ measurements of optical system flare Apparatus and methods for in situ and ex situ measurements of spatial profiles of the modulus of the complex amplitude and intensity of flare generated by an optical system. The in situ and ex situ measurements comprise interferometric and non-interferometric measur... | 09/23/2008 |
| 7426039 | Optically balanced instrument for high accuracy measurement of dimensional change An instrument for measuring dimensional changes in materials, such as ultra-low thermal expansion materials, contains an optically balanced measuring loop. Both an object beam and a loop beam propagate around the measuring loop. The object beam encounters both oppos... | 09/16/2008 |
| 7423760 | Method and apparatus for monitoring an interferometer An apparatus and to a method of monitoring an interferometer, comprising the steps of: coupling a first optical signal into the interferometer and into a wavelength reference element, detecting a first resulting interference signal being a result of interference of ... | 09/09/2008 |
| 7405817 | Method and apparatus for classifying defects of an object A method for classifying defects of an object includes irradiating lights having different polarizations onto the object to create an inspection spot on the object, collecting scattered lights generated by the irradiated lights scattering from the inspection spot, a... | 07/29/2008 |
| 7394551 | Vacuum ultraviolet referencing reflectometer A spectroscopy system is provided which operates in the vacuum ultraviolet spectrum. More particularly, a system utilizing reflectometry techniques in the vacuum ultraviolet spectrum is provided for use in metrology applications. To ensure accurate and repeatable me... | 07/01/2008 |
| 7388674 | Laser tracking interferometer A laser tracking interferometer directs a laser beam to a retroreflector serving as an object to be measured to sense a displacement of the retroreflector using interference with a laser beam back reflected from the retroreflector. The laser tracking interferometer ... | 06/17/2008 |
| 7385705 | Imaging spectroscopy based on multiple pan-chromatic images obtained from an imaging system with an adjustable point spread function Generating a multispectral or hyperspectral image of an image source with an optical system having an adjustable, wavenumber-dependent point spread function, by collecting panchromatic images of the image source, each of which corresponds to a selected point spread ... | 06/10/2008 |
| 7372579 | Apparatus and method for monitoring trench profiles and for spectrometrologic analysis An apparatus for monitoring a trench profile of a substrate includes a radiation-emitting unit for irradiating the substrate with infrared radiation. The intensity and/or polarization state of the infrared radiation reflected from the substrate is measured at a mult... | 05/13/2008 |
| 7369251 | Full-field optical measurements of surface properties of panels, substrates and wafers Techniques and systems for using optical interferometers to obtain full-field optical measurements of surfaces, such as surfaces of flat panels, patterned surfaces of wafers and substrates. Applications of various shearing interferometers for measuring surfaces are ... | 05/06/2008 |
| 7365861 | Method and apparatus for determining telecentricity and microlithography projection exposure apparatus An apparatus having a wavefront measuring device (1, 2, 7), which is designed to determine a wavefront tilt in one or more non-parallel transverse directions perpendicular to an optical axis of the optical imaging system, at a plurality of measurement points ... | 04/29/2008 |
| 7359058 | Miniature fourier transform spectrophotometer The Miniature Fourier Transform Spectrophotometer provides the capability, in a miniaturized device, of determining the light absorption/transmission spectra of a collected sample of gas or liquid though Fourier Transform spectroscopy techniques. The device takes an... | 04/15/2008 |
| 7355692 | System and method for inspecting electrical circuits utilizing reflective and fluorescent imagery A method for inspecting an electrical circuit including optically inspecting at least a portion of an electrical circuit by detecting light reflected therefrom in a first image during a first time interval, optically inspecting light emitted from at least a portion ... | 04/08/2008 |
| 7355719 | Interferometer for measuring perpendicular translations An interferometer provides a large dynamic range for perpendicular displacement measurements. In operation, a measurement reflector on an object reflects a measurement beam to an overlying Porro prism, and a reference reflector on the object returns a reference beam... | 04/08/2008 |
| 7352459 | Scanning Spectrophotometer for high throughput fluorescence detection and fluorescence polarization A fluorescence spectrophotometer system may be implemented in scanning fluorescence polarization detection applications. A wavelength and area scanning fluorescence spectrophotometer system may include a light source, an excitation double monochromator, an excitatio... | 04/01/2008 |
| 7349085 | Detecting the orientation of carbon nanotubes Carbon nanotube orientation may be detected by exposing the carbon nanotube to a pair of laser beams oriented transversely to one another. By observing the effect on the intensity of transmitted light from a first laser beam when the polarization of the second laser... | 03/25/2008 |
| 7345769 | Load dependent analyzing optical components The present invention relates to an apparatus and to a method of load dependent analyzing an optical component (114), comprising the steps of: splitting an initial signal (115) into the reference signal (115b) into and into a measurement ... | 03/18/2008 |
| 7345768 | Method and device for measuring the phase and amplitude of ultrashort light pulses A method for measuring ultrashort light pulse which comprises a first step of linear optical filtering of the signal for which it is desired to measure the amplitude of the pulses by means of an acoustic interaction between the optical signal and a colinear or quasi... | 03/18/2008 |
| 7342665 | System and method for control of paint thickness The invention is directed to a system and method for implementing process control for paint thickness using sonic NDE techniques. The system may, for example, generate ultrasound waves in a test object during the manufacturing process. A detector such as an interfer... | 03/11/2008 |
| 7339680 | Temperature-stabilized sensor coil and current sensor The fiber-optic sensor head (2) for a current or magnetic field sensor comprises an optical fiber which contains a magnetooptically active sensor fiber (3) and at least one polarization-maintaining supply fiber (5), which are optically connected... | 03/04/2008 |
| 7339682 | Heterodyne reflectometer for film thickness monitoring and method for implementing The present invention is directed to a heterodyne reflectometer system and method for obtaining highly accurate phase shift information from heterodyned optical signals, from which extremely accurate film depths can be calculated. A linearly polarized light comprise... | 03/04/2008 |
| 7336371 | Apparatus and method for measuring the wavefront of an optical system A device and a method for wavefront measurement of an optical system (7), in particular by an interferometric measurement technique. A dynamic range correction element (12, 12a) is arranged in the beam path upstream of the detector arrangement (... | 02/26/2008 |
| 7333213 | Confocal microscopy An improved confocal microscope system is provided which images sections of tissue utilizing heterodyne detection. The system has a synthesized light source for producing a single beam of light of multiple, different wavelengths using multiple laser sources. The bea... | 02/19/2008 |
| 7330268 | Spectral imaging apparatus and methodology A method and apparatus for an improved spectral imaging system is provided. The system is capable of measuring the fluorescence, luminescence, or absorption at selected locations on a sample plate. The emissions detection subassembly can tune to any wavelength withi... | 02/12/2008 |
| 7330267 | Device and method for optical spectroscopy The invention relates to an apparatus for optical spectroscopy having means to produce an interference pattern and having a spatially resolving detector which can record the interference pattern produced. In accordance with the invention, the wavefronts of at least ... | 02/12/2008 |
| 7327471 | Apparatus and method for stabilizing lasers using dual etalons Method and apparatus are disclosed that enable lasers to be stabilized in frequency to a high precision while simultaneously enabling rapid re-acquisition of stabilization control loops in the event of frequency locking loss. The principle of operation is to incorpo... | 02/05/2008 |
| 7327470 | Spatial and spectral wavefront analysis and measurement A method and apparatus for wavefront analysis including obtaining a plurality of differently phase changed transformed wavefronts corresponding to a wavefront being analyzed which has an amplitude and a phase, obtaining a plurality of intensity maps of the plurality... | 02/05/2008 |
| 7321429 | Microscope using quantum-mechanically entangled photons A microscope includes a photon source which sequentially generates sets of quantum-mechanically entangled photons including at least two photons, a lens which focuses a set of photons, an actuator which varies a relative distance between a focal position of the lens... | 01/22/2008 |
| 7317539 | Polarizing beam splitter device, interferometer module, lithographic apparatus, and device manufacturing method The invention relates to a polarizing beam splitter device, an interferometer module system, a lithographic apparatus, and a device manufacturing method. The polarizing beam splitter device includes an optical element and a polarizing beam splitter layer. The optica... | 01/08/2008 |
| 7315381 | Monolithic quadrature detector A compact monolithic quadrature detector generates four signals from an input beam including orthogonally polarized object and reference beam components provided by an interferometer. The single input beam may be split into four output beams using a first beam split... | 01/01/2008 |
| 7315356 | Fire demonstration tool and method for using thereof The present invention is directed to a device for imaging a gem, and more specifically, a device capable of imaging the fire of a gem and thereby enabling the qualitative assessment of the fire of the gem. The gem imaging device of the present invention includes an ... | 01/01/2008 |
| 7312877 | Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy A method of measuring properties of a substrate, the method involving: illuminating a spot on the substrate with a standing wave measurement beam to generate a return measurement beam, the standing wave measurement beam characterized by a standing wave pattern; gene... | 12/25/2007 |
| 7307715 | Method for the formation of a structure size measured value The structure size of a structure (100) is measured by forming an auxiliary measured value (Dx′, Dy′). A calibration measured value (Px′, Py′) is determined on the basis of a calibration structure (110), which comprises at least two structure e... | 12/11/2007 |
| 7307734 | Interferometric sensor for characterizing materials An integrated optical sensor, using low coherence interferometry, is capable of determining analyte concentration in a material sample based on absorption, scattering and polarization. The sensor includes one or more light collectors, with each collector having a se... | 12/11/2007 |
| 7304745 | Phase measuring method and apparatus for multi-frequency interferometry The invention provides a novel method for absolute fringe order identification in multi-wavelength interferometry based on optimum selection of the wavelengths to be used. A theoretical model of the process is described which allows the process reliability to be qua... | 12/04/2007 |
