| Patent No. | Patent Title: |
| RE41743 | Optical fiber cable inlet device |
| 7463363 | Method and apparatus for ultrasonic laser testing |
| 7460246 | Method and system for sensing light using interferometric element... |
| 7440115 | System and methods for wavefront measurement |
| 7440108 | Imaging spectrometer including a plurality of polarizing beam spl... |
| 7433053 | Laser inspection using diffractive elements for enhancement and s... |
| 7428058 | Apparatus and method for in situ and ex situ measurements of opti... |
| 7426039 | Optically balanced instrument for high accuracy measurement of di... |
| 7423760 | Method and apparatus for monitoring an interferometer |
| 7405817 | Method and apparatus for classifying defects of an object |
| 7394551 | Vacuum ultraviolet referencing reflectometer |
| 7388674 | Laser tracking interferometer |
| 7385705 | Imaging spectroscopy based on multiple pan-chromatic images obtai... |
| 7372579 | Apparatus and method for monitoring trench profiles and for spect... |
| 7369251 | Full-field optical measurements of surface properties of panels, ... |
| 7365861 | Method and apparatus for determining telecentricity and microlith... |
| 7359058 | Miniature fourier transform spectrophotometer |
| 7355692 | System and method for inspecting electrical circuits utilizing re... |
| 7355719 | Interferometer for measuring perpendicular translations |
| 7352459 | Scanning Spectrophotometer for high throughput fluorescence detec... |
| 7349085 | Detecting the orientation of carbon nanotubes |
| 7345769 | Load dependent analyzing optical components |
| 7345768 | Method and device for measuring the phase and amplitude of ultras... |
| 7342665 | System and method for control of paint thickness |
| 7339680 | Temperature-stabilized sensor coil and current sensor |
| 7339682 | Heterodyne reflectometer for film thickness monitoring and method... |
| 7336371 | Apparatus and method for measuring the wavefront of an optical sy... |
| 7333213 | Confocal microscopy |
| 7330268 | Spectral imaging apparatus and methodology |
| 7330267 | Device and method for optical spectroscopy |
| 7327471 | Apparatus and method for stabilizing lasers using dual etalons |
| 7327470 | Spatial and spectral wavefront analysis and measurement |
| 7321429 | Microscope using quantum-mechanically entangled photons |
| 7317539 | Polarizing beam splitter device, interferometer module, lithograp... |
| 7315381 | Monolithic quadrature detector |
| 7315356 | Fire demonstration tool and method for using thereof |
| 7312877 | Method and apparatus for enhanced resolution of high spatial freq... |
| 7307715 | Method for the formation of a structure size measured value |
| 7307734 | Interferometric sensor for characterizing materials |
| 7304745 | Phase measuring method and apparatus for multi-frequency interfer... |
Did You Know... 
PatentStorm News
