| Patent No. | Patent Title: |
| 7978330 | Detecting a target using an optical augmentation sensor |
| 7463349 | Systems and methods for determining a characteristic of a specime... |
| 7464084 | Method for performing an inexact query transformation in a hetero... |
| 7462546 | Collector tailored structures for integration of binary junction ... |
| 7463351 | Process and assembly for non-destructive surface inspection |
| 7460251 | Dimension monitoring method and system |
| 7459339 | Flip-chip semiconductor device manufacturing method |
| 7460221 | Method and system for detecting defects |
| 7461101 | Method for reducing data loss and unavailability by integrating m... |
| 7461063 | Updating logistic regression models using coherent gradient |
| 7460220 | Manufacturing method of semiconductor substrate and method and ap... |
| 7460237 | Inspection method and apparatus, lithographic apparatus, lithogra... |
| 7460235 | Two-detector gas filter correlation radiometry (GFCR) system usin... |
| 7456942 | Dynamic refractometer |
| 7456946 | Laser system for pellet-shaped articles |
| 7456969 | Device and method for monitoring the oxygen concentration in an a... |
| 7456964 | Detector configurations for optical metrology |
| 7456949 | Methods and systems for laser calibration and eye tracker camera ... |
| 7452773 | Method of manufacturing a flash memory device |
| 7453583 | Assessment and optimization for metrology instrument including un... |
| 7452777 | Self-aligned trench MOSFET structure and method of manufacture |
| 7453146 | High power MCM package with improved planarity and heat dissipati... |
| 7452763 | Method for a junction field effect transistor with reduced gate c... |
| 7452764 | Gate-induced strain for MOS performance improvement |
| 7454421 | Database access control method, database access controller, agent... |
| 7451158 | System and method for creating, appending and merging a work mana... |
| 7450233 | Measuring device for the measurement of optical properties of coa... |
| 7446869 | Granular product inspection device |
| 7446390 | Semiconductor device |
| 7446364 | Semiconductor memory device including multi-layer gate structure |
| 7445996 | Low resistance peripheral contacts while maintaining DRAM array i... |
| 7445988 | Trench memory |
| 7445956 | Flexible MEMS thin film without manufactured substrate and proces... |
| 7445955 | Multichip module package and fabrication method |
| 7444359 | Method and system for checking availability of automounted file s... |
| 7444186 | Programmable controller system |
| 7443493 | Transfer characteristic calculation apparatus, transfer character... |
| 7442978 | Semiconductor memory device including multi-layer gate structure |
| 7442969 | Top layers of metal for high performance IC's |
| 7442617 | Method for manufacturing bipolar transistor |
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