U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Examiner: Wachsman, Hai D


Primary examiner statistics: 47 patents; average approval time: 85 days
Assistant examiner statistics: 2 patents; average approval time: 716 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
7774158 Systems and methods for landmark generation for visual simultaneo...
7463985 Electric power quality indicator device and method
7463988 Parameter setting method and circuit operation testing method and...
7460959 System and method for estimating oxygen concentration in a mixed ...
7454317 Apparatus productivity improving system and its method
7447599 Method and system for generating an uncertainty value
7440873 Apparatus and method of processing data to improve the performanc...
7440864 Controller system for pool and/or spa
7440862 Combining multiple independent sources of information for classif...
7433796 Methods, systems, and formats for data, such as data used in lase...
7430486 Datalog support in a modular test system
7430494 Dynamic data stream histograms for no loss of information
7430495 Method and apparatus for representing, managing, analyzing and pr...
7426446 Calibration training for spectrometer
7424401 Method and device for data processing using agents between evalua...
7424390 Method to evaluate whether a time delay is better than a time lim...
7421351 Monitoring and fault detection in dynamic systems
7421350 Meter electronics and method for detecting a residual material in...
7421371 Automated performance analysis and failure remediation
7415370 Method of compressing values of a monitored electrical power sign...
7415379 Colpitts transmitter PCB testing device
7415366 Electronic field device with a sensor unit for capacitive level m...
7412354 Method for measuring quantity of usage of CPU
7412339 Method and apparatus for identifying an operational phase of a mo...
7409309 Method of deciding the quality of the measurement value by the ed...
7406401 Sensor manager device, computer program for controlling sensor ma...
7403867 Spectroscopy instrument using broadband modulation and statistica...
7403871 Extraction of imperfection features through spectral analysis
7401008 Method, computer program, and system for intrinsic timescale deco...
7400992 Fitting multidimensional measurement data to tolerance zones havi...
7400975 Probe for plant selection and health maintenance system
7395183 Weight measuring device
7389194 Driver calibration methods and circuits
7386414 Generation of hardware thermal profiles for a set of processors
7383141 Faraday system integrity determination
7369953 Femtosecond spectroscopy using minimum phase functions
7366622 Arc fault identification using model reference estimation
7363195 Methods of configuring a sensor network
7359837 Peak data retention of signal data in an implantable medical devi...
7359819 Evaluation of device driver output

Patents as Assistant Examiner

Patent No. Patent Title:
5666295 Apparatus and method for dynamic weighing of loads in hydraulical...
5572445 Industrial mobile process monitor system
 
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