| Patent No. | Patent Title: |
| 8045166 | Method of particle detection, apparatus therefor, method of formi... |
| 8045150 | Semiconductor wafer inspection method |
| 7969575 | Method and apparatus for measuring light absorption of liquid sam... |
| 7924424 | Optical product detection sensor |
| 7869029 | Multiple wavelength light collimator and monitor |
| 7869025 | Optical inspection method and optical inspection system |
| 7821635 | In-situ detection and analysis of methane in coal bed methane for... |
| 7812955 | Sample analysis apparatus and analysis method |
| 7808636 | Systems, methods, and devices for handling terahertz radiation |
| RE41682 | Apparatus and method for direct measurement of absorption and sca... |
| 7777896 | Signal processing apparatus and image forming apparatus |
| 7768657 | Optical fly height measurement |
| 7728975 | Method for describing, evaluating and improving optical polarizat... |
| 7714995 | Material independent profiler |
| 7684044 | Sensor device |
| 7599056 | Method, structure, and apparatus for Raman spectroscopy |
| 7595878 | Spectroscopic methods for component particle analysis |
| 7561270 | Lithographic apparatus, device manufacturing method and device ma... |
| 7551294 | System and method for brewster angle straddle interferometry |
| 7518722 | Multi-channel, multi-spectrum imaging spectrometer |
| 7502099 | Measuring method and apparatus for measuring an optical property ... |
| 7477384 | Device and method for investigating analytes in liquid suspension... |
| 7463344 | Arrangement for the optical detection of light radiation which is... |
| 7463354 | Device for the spectral selection and detection of the spectral r... |
| 7460232 | On-line optical analysis of a substance through a conduit section... |
| 7460236 | Analytical method and apparatus |
| 7456972 | Surface plasmon induction in multiwalled carbon nanotube arrays |
| 7456963 | Method and equipment for detecting pattern defect |
| 7456961 | Apparatus and method for detecting aerosol |
| 7456978 | Shape measuring apparatus |
| 7456959 | Particle classifying apparatus and method thereof |
| 7456977 | Wireless substrate-like sensor |
| 7453571 | Dimensional calibration standards |
| 7450226 | Gray balance calibration of an imaging system |
| 7449845 | Backlight assembly and display apparatus having the same |
| 7450247 | Automated product profiling apparatus and product slicing system ... |
| 7450236 | Measuring apparatus and sensor unit for same |
| 7450232 | Generic interface for an optical metrology system |
| 7450227 | Surface enhanced Raman spectroscopy (SERS) substrates exhibiting ... |
| 7446873 | Reflective alignment grating |