U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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Werner, Frank E.


Primary examiner statistics: 2320 patents; average approval time: 752 days
Assistant examiner statistics: 163 patents; average approval time: 1019 days

Patents as Assistant Examiner


1          
NumberTitleIssue Date
6526168Visual neural classifier
A neural classifier that allows visualization of the query, the training data and the decision regions in a single two-dimensional display, providing benefits for both the designer and the user. The visual neural classifier is formed from a set of experts...
02/25/2003
6434264Vision comparison inspection system
A vision comparison inspection system is disclosed for use in a printed circuit assembly production line having a plurality of component processing locations and a conveyor system for transporting circuit assemblies between processing locations in an upst...
08/13/2002
6430308Handwriting verification device
A handwriting verification device includes: a normalizing section for normalizing an inputted handwriting which has been subjected to sampling at regular intervals; a registered handwriting dictionary in which registered handwriting is accommodated; a cor...
08/06/2002
6424728Method and apparatus for verification of signatures
An automatic signature verification system is set forth that utilizes a main routine for comparing signatures using forensic hand writing methodology. A secondary program is used to modify the algorithms used by the main program for making adjustments the...
07/23/2002
6421458Automated inspection of objects undergoing general affine transformation
During statistical training and automated inspection of objects by a machine vision system, a General Affine Transform is advantageously employed to improve system performance. During statistical training, the affine poses of a plurality of training image...
07/16/2002
6400838Pattern inspection equipment, pattern inspection method, and storage medium storing pattern inspection program
Pattern inspection equipment has at least a measured data generation unit for generating measured data from patterns that have been delineated on a sample according to design data, a reference data generation unit for generating reference data used to ins...
06/04/2002
6400840Non-lot based method for assembling integrated circuit devices
An inventive method tracks IC devices through the assembly steps in a manufacturing process. Prior to die attach, a laser scribe marks the lead frame of each of the devices with a coded hole matrix that gives each device a unique ID code. During die attac...
06/04/2002
6396943Defect inspection method and defect inspection apparatus
A defect inspection method for detecting defects of a pattern formed on a sample. The method has a step of inputting an optical image of the sample as a sensor data, a step of inputting a reference data corresponding to the sensor data, a step of inputtin...
05/28/2002
6393141Apparatus for surface image sensing and surface inspection of three-dimensional structures
An apparatus for providing a two-dimensional image of a three-dimensional object illuminates the surface of the object using an illumination source. Portions of the surface are imaged through an aperture in a plate onto a portion of a matrix sensor. The o...
05/21/2002
6385335Apparatus and method for estimating background tilt and offset
A computer implemented software device for estimating background tilt and offset is disclosed to preferably be adaptable to an optical measurement instrument wherein the estimated parameters are resolved to generate a reference plane to be subtracted from...
05/07/2002
6381347High contrast, low distortion optical acquistion system for image capturing
An apparatus and method for acquiring an image of a patterned object such as a fingerprint including a light refracting device, a focusing lens, and a light source. The light refracting device can, for example, be a prism and includes an imaging surface, ...
04/30/2002
6377698Method of locating highly variable brightness or color regions in an image
A method of locating highly variable brightness or color regions in an image having at least one specifically ordered region corresponding, for example, to the image of an optical code defined by different-colored elements with a predetermined orientation...
04/23/2002
6370263Method and device for registering and collating palm imprints
There is disclosed a method of registering palm imprints of individuals to be identified to authenticate the individuals. Each palm imprint is divided into parts having regions with predetermined positions and sizes. Feature points are extracted from the ...
04/09/2002
6366687Data converter apparatus and method particularly useful for a database-to-object inspection system
Data converter apparatus for converting in real time data stored in an input compact format into an output expanded real time format. The data including a plurality of groups and repetition of the groups. The groups including, each, many basic geometric f...
04/02/2002
6363169Apparatus and method of three-dimensional modeling
A reference sheet is employed on which reference points are arranged irregularly and asymmetrically. An object of interest is placed on the reference sheet. The object of interest is shot together with the reference points by a camera. A shooting position...
03/26/2002
6360005Apparatus and method for microscopic inspection of articles
A defect detection system for inspecting objects such as reticles, photomasks, semiconductor wafers, flat panel displays and other patterned objects has two or more stages, whereby the object is examined separately for fine defects, by inspecting a binary...
03/19/2002
6347150Method and system for inspecting a pattern
The present invention relates to detection of defects with simple specification of the coordinates, in the inspection of an object having a plurality of patterns in which a portion having the two-dimensional repetition and portions having the repetition o...
02/12/2002
6345111Multi-modal interface apparatus and method
In the multi-modal interface apparatus of the present invention, a gaze object detection section always detects a user's gaze object. The user inputs at least one medium of sound information, character information, image information and operation informat...
02/05/2002
6343161Image processing device
Image data of a test pattern is transmitted to an image processor and image processing is effected by the image processor based on the test pattern. The image outputted (the results of the image processing) from this test pattern image processing and the ...
01/29/2002
6341173Device and method for the determination of diameters of crystals
A device and process for the determination of the diameters of a crystal that is pulled from a liquified material. In this connection several video cameras are provided, each of which reproduces its own section along the vertical axis of the crystal or in...
01/22/2002
6333988Personal identification
A personal identification apparatus for providing information characteristic of an eye includes a housing with an entrance window through which a user looks at a target object. An image capture device within the housing operates to provide an image signed...
12/25/2001
6332032Method for generating test files from scanned test vector pattern drawings
A graphical bitmap image of a scanned test pattern drawing is transformed into a test file in a file format that is readily usable to provide stimuli for computer-aided design (CAD) tools or integrated circuit (IC) testing equipment. A bitmap image of eac...
12/18/2001
6330347Method and device for identifying fingerprints using an analog flash memory
A method for identifying fingerprints includes the steps of acquiring a primary image and a secondary image; determining notable points in the primary image; comparing with one another the primary image and the secondary image in order to identify the cor...
12/11/2001
6330355Frame layout to monitor overlay performance of chip composed of multi-exposure images
A frame layout and method for determining the overlay accuracy of a first chip image relative to a second chip image when the first and second chip images are used to form a single chip. One embodiment employs a vernier scale in two orthoginal directions ...
12/11/2001
6324296Distributed-processing motion tracking system for tracking individually modulated light points
Disclosed is a distributed-processing motion capture system (and inherent method) comprising: plural light point devices, e.g., infrared LEDs, in a motion capture environment, each providing a unique sequence of light pulses representing a unique identity...
11/27/2001
6324297Skin pattern feature extracting apparatus
An original image is held in the image holder 11, and displayed on the image display 12 to be viewed by the operator. The operator inputs the angle of rotation and ratio of compression of an focal point of the original image for observing ridges more clea...
11/27/2001
6324298Automated wafer defect inspection system and a process of performing such inspection
An automated defect inspection system has been invented and is used on patterned wafers, whole wafers, broken wafers, partial wafers, sawn wafers such as on film frames, JEDEC trays, Auer boats, die in gel or waffle packs, MCMs, etc. and is specifically i...
11/27/2001
6320979Depth of field enhancement
A lens system (100) and image plane (104) are used to capture a number of sample images (400) of a three dimensional scene, each sample image (400) corresponding to a different object distance (106). The in-focus portions of each of the sample images (400...
11/20/2001
6307959Method and apparatus for estimating scene structure and ego-motion from multiple images of a scene using correlation
A system that estimates both the ego-motion of a camera through a scene and the structure of the scene by analyzing a batch of images of the scene obtained by the camera employs a correlation-based, iterative, multi-resolution algorithm. The system define...
10/23/2001
6304666Apparatus for sensing patterns of electrical field variations across a surface
An array of nonvolatile field effect transistors used to sense electric potential variations. The transistors owe their nonvolatility to the movement of protons within the oxide layer that occurs only in response to an externally applied electric potentia...
10/16/2001
6301385Method and apparatus for segmenting images prior to coding
To segment moving foreground from background, where the moving foreground is of most interest to the viewer, this method uses three detection algorithms as the input to a neural network. The multiple cues used are focus, intensity, and motion. The neural ...
10/09/2001
6298149Semiconductor device image inspection with contrast enhancement
Machine vision methods for inspection of semiconductor die lead frames include the steps of generating a first image of the lead frame, generating a second image of the lead frame and any defect thereon, and subtracting the second image from the first ima...
10/02/2001
6285782Mounting apparatus, recognition device and recognition method for electronic component
An electronic component mounting apparatus, an electronic component recognition device and an electronic component recognition method are provided which enable accurate recognition for correcting deviations in alignment of an electronic component in relat...
09/04/2001
6278797Apparatus for inspecting land-attached circuit board
An inspection beam such as laser beam is scanned two-dimensionally on an inspection surface of a circuit board with a plurality of lands while allowing its reflected beam from the inspection surface to be received by a beam receiving section. The beam rec...
08/21/2001
6272236Inspection technique of photomask
An improved technique for inspecting photomasks employs simulated images of the resist pattern. A simulated image of an original pattern is compared to a simulated image generated from a pattern captured from a photomask manufactured from the original pat...
08/07/2001
6252981System and method for selection of a reference die
A system for selecting reference die images, such as for use with a visual die inspection system, is provided. The system includes a die image comparator, which compares a first die image to a second die image in order to create a difference image that co...
06/26/2001
6249598Solder testing apparatus
A solder testing apparatus comprising image processing means for performing image processing on an image of an appearance of a soldered portion to identify shape characterizing amounts for the soldered portion; and defect determining means for performing ...
06/19/2001
6249599Method and apparatus for detecting tool trouble in machine tool
In a machine tool for performing cutting work of a work employing a tool provided with at least one throw away tip, abnormality of the tip C can be certainly detected by picking up tips C1, C2, . . . Cn of the tool by means of image pick-up means 23, prov...
06/19/2001
6246789Component mounting apparatus and method
A component mounting apparatus includes a component holding and conveying device for holding and conveying a component and mounting the component onto a circuit board, a circuit board holding device for holding the circuit board, an image recognition opti...
06/12/2001
6243487Pattern exposure method using electron beam
Disclosed is a pattern exposure method for conducting an overlay exposure to a base pattern previously formed by using electron beam, which has the steps of: 1) dividing a group of patterns formed on the base pattern into arbitrary regions; 2) calculating...
06/05/2001
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