U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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...that in 1800 ether was first used by partyers as a fun diversion? Sniffing the gas led to hilarious and raucous laughter as people watched each other become more and more intoxicated and silly. Several doctors independently realized the value ether would have to anesthetize surgery patients. Of those who claimed rights to the "discovery," none had a happy ending. One had a seizure and died defending his rights. Another spent his life in an asylum because he had been denied acclaim. A third became addicted to chloroform and, in a New York City jail, he soaked a cloth in the drug, severed an artery and bled to death.

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Examiner: Werner, Frank E.


Primary examiner statistics: 2320 patents; average approval time: 752 days
Assistant examiner statistics: 163 patents; average approval time: 1019 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
7167576 Method and apparatus for measuring dwell time of objects in an en...
7142703 Methods and software for self-gating a set of images
7139406 Remote baggage screening system, software and method
7127088 Method of authenticating proper access to secured site and device...
7120285 Method for evaluation of reticle image using aerial image simulat...
7120273 Apparatus and method for image group integrity protection
7120287 Non-lot based method for assembling integrated circuit devices
7116844 Method for generating vector data for a hand-drawn curve
7095909 Light pen system and method
7095885 Method for measuring registration of overlapping material layers ...
7085407 Detection of ribcage boundary from digital chest image
7079668 Vehicle front-view monitoring system
7079673 Systems for analyzing microtissue arrays
7068814 Visual tracking method by color information
7058210 Method and system for lung disease detection
7058206 Method for increasing the power of a traffic sign recognition sys...
7058200 Method for the prior monitoring of the detectability of a waterma...
7058207 Picture synthesizing apparatus
7058202 Authentication with built-in encryption by using moire intensity ...
7050636 Method and system for improving an image characteristic based on ...
7043063 Non-rigid motion image analysis
7039236 Image processor and pattern recognition apparatus using the image...
7035426 Image processing apparatus, image processing method and a compute...
7035430 Intruding object detection method and intruding object monitor ap...
7031503 Method and system for automatically producing a temporally proces...
7027617 Method and system for preventing fraud in the biometric detection...
7027641 Three-dimensional shape measuring system
7024020 Apparatus and method for generating object-labeled image in video...
7024025 Nonuniform Rotational Distortion (NURD) reduction
7020324 Precision measurement of tube wall thickness
7016519 Method and device for detecting three-dimensional information
7013036 Image sensing apparatus and method of controlling image sensing
7010151 Endplate detection in digital radiography by dynamic programming ...
7006677 Semi-automatic segmentation algorithm for pet oncology images
6999610 Device for automatically sorting periodic data records
6996288 Method of calculating shading correction coefficients of imaging ...
6996250 Digital watermark embedding processor, digital watermark detectin...
6993175 Methods for measuring microvascular density in tumors
6993174 Real time interactive segmentation of pulmonary nodules with cont...
6978039 Method and system for segmentation of medical images

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
6526168 Visual neural classifier
6434264 Vision comparison inspection system
6430308 Handwriting verification device
6424728 Method and apparatus for verification of signatures
6421458 Automated inspection of objects undergoing general affine transfo...
6400838 Pattern inspection equipment, pattern inspection method, and stor...
6400840 Non-lot based method for assembling integrated circuit devices
6396943 Defect inspection method and defect inspection apparatus
6393141 Apparatus for surface image sensing and surface inspection of ...
6385335 Apparatus and method for estimating background tilt and offset
6381347 High contrast, low distortion optical acquistion system for image...
6377698 Method of locating highly variable brightness or color regions in...
6370263 Method and device for registering and collating palm imprints
6366687 Data converter apparatus and method particularly useful for a ...
6363169 Apparatus and method of three-dimensional modeling
6360005 Apparatus and method for microscopic inspection of articles
6347150 Method and system for inspecting a pattern
6345111 Multi-modal interface apparatus and method
6343161 Image processing device
6341173 Device and method for the determination of diameters of crystals
6333988 Personal identification
6332032 Method for generating test files from scanned test vector pattern...
6330347 Method and device for identifying fingerprints using an analog fl...
6330355 Frame layout to monitor overlay performance of chip composed of ...
6324296 Distributed-processing motion tracking system for tracking indivi...
6324297 Skin pattern feature extracting apparatus
6324298 Automated wafer defect inspection system and a process of perform...
6320979 Depth of field enhancement
6307959 Method and apparatus for estimating scene structure and ego-motio...
6304666 Apparatus for sensing patterns of electrical field variations acr...
6301385 Method and apparatus for segmenting images prior to coding
6298149 Semiconductor device image inspection with contrast enhancement
6285782 Mounting apparatus, recognition device and recognition method for...
6278797 Apparatus for inspecting land-attached circuit board
6272236 Inspection technique of photomask
6252981 System and method for selection of a reference die
6249598 Solder testing apparatus
6249599 Method and apparatus for detecting tool trouble in machine tool
6246789 Component mounting apparatus and method
6243487 Pattern exposure method using electron beam
 
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