U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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President Rutherford B. Hayes ; Said in 1876, after Alexander Graham Bell demonstrated the telephone to him at the White House

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Examiner: LeRoux, E P


Primary examiner statistics: 3 patents; average approval time: 1898 days
Assistant examiner statistics: 81 patents; average approval time: 840 days

Patents as Primary Examiner

Patent No. Patent Title:
7158964 Queue management
7155424 Sales management system and method thereof
7120650 Implementing data management application programming interface ac...

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
7043478 Asynchronous database updates
6607277 Projector display comprising light source units
6497486 Fail operational optical design for tiled projection cockpit disp...
6452375 Apparatus for measurement of critical current in superconductive ...
6420889 Multi probe unit and measuring apparatus comprising thereof
6404216 Test contact
6404214 Substrate for inspecting electronic device, method of manufacturi...
6394607 Polarized light separation device, method of fabricating the same...
6384589 Reference frequency spur cancellation in synthesized measurement ...
6375328 Optical modulation element and projector
6369583 Method for determining the distance of two reference points movab...
6356086 Method and apparatus for the in-circuit testing of a capacitor
6356070 Sensor arrangement producing one output signal depending on senso...
6351131 Species-selective pressure gauge with extended operation
6329805 Method for network analyzation and apparatus
6328447 Projection device
6325514 Projection type display device
6326799 Wireless test fixture for testing printed circuit boards
6323668 IC testing device
6323662 Device for the precise measurement of magnitudes and method of ve...
6316933 Test bus circuit and associated method
6316946 Microwave leakage field sensor for measuring moisture and/or dens...
6316931 Magnetic sensor apparatus and current sensor apparatus
6316928 Spectrum analyzer
6313657 IC testing apparatus and testing method using same
6310722 Lenticular lens sheet and projection screen using the same
6305805 System, method and software for correcting keystoning of a projec...
6304093 transportation and active temperature control of integrated circu...
6300754 Circuit for an NOx measurement sensor
6300769 Fast comparator suitable for BIST and BISR applications
6300753 Circuit for a NOx measurement sensor
6297645 Device for sensing partial discharges in test objects, preferably...
6297640 Transfer switch position sensing using coil control contacts
6293677 Device for projecting flat articles on a working plane of a machi...
6291999 Plasma monitoring apparatus
6291978 System and method for detecting shorts, opens and connected pins ...
6288558 Method for probing semiconductor devices for active measuring of ...
6285839 Image forming apparatus having function for automatically adjusti...
6285180 Probe adapter and holder
6283600 Image projection fixtures
 
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