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| 6404216 | Test contact |
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| 6384589 | Reference frequency spur cancellation in synthesized measurement ... |
| 6375328 | Optical modulation element and projector |
| 6369583 | Method for determining the distance of two reference points movab... |
| 6356086 | Method and apparatus for the in-circuit testing of a capacitor |
| 6356070 | Sensor arrangement producing one output signal depending on senso... |
| 6351131 | Species-selective pressure gauge with extended operation |
| 6329805 | Method for network analyzation and apparatus |
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| 6325514 | Projection type display device |
| 6326799 | Wireless test fixture for testing printed circuit boards |
| 6323668 | IC testing device |
| 6323662 | Device for the precise measurement of magnitudes and method of ve... |
| 6316933 | Test bus circuit and associated method |
| 6316946 | Microwave leakage field sensor for measuring moisture and/or dens... |
| 6316931 | Magnetic sensor apparatus and current sensor apparatus |
| 6316928 | Spectrum analyzer |
| 6313657 | IC testing apparatus and testing method using same |
| 6310722 | Lenticular lens sheet and projection screen using the same |
| 6305805 | System, method and software for correcting keystoning of a projec... |
| 6304093 | transportation and active temperature control of integrated circu... |
| 6300754 | Circuit for an NOx measurement sensor |
| 6300769 | Fast comparator suitable for BIST and BISR applications |
| 6300753 | Circuit for a NOx measurement sensor |
| 6297645 | Device for sensing partial discharges in test objects, preferably... |
| 6297640 | Transfer switch position sensing using coil control contacts |
| 6293677 | Device for projecting flat articles on a working plane of a machi... |
| 6291999 | Plasma monitoring apparatus |
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| 6288558 | Method for probing semiconductor devices for active measuring of ... |
| 6285839 | Image forming apparatus having function for automatically adjusti... |
| 6285180 | Probe adapter and holder |
| 6283600 | Image projection fixtures |