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| Number | Title | Issue Date |
| 7902498 | Methods and apparatus for enhanced ion based sample detection using selective pre-separation and amplification The invention relates generally to ion mobility based systems, methods and devices for analyzing samples and, more particularly, to sample pre-separation and amplification. ... | 03/08/2011 |
| 7847269 | Apparatus for and method of treating a fluid Apparatus and a method for treating a fluid. The apparatus includes a fluid passageway, at least one source of irradiation, and curved reflecting troughs for reflecting irradiation onto the fluid passageway. A space is defined between the closed ends of the troughs.... | 12/07/2010 |
| 7838830 | Charged particle beam apparatus and method for operating a charged particle beam apparatus A charged particle beam apparatus is provided, which comprises a charged particle beam column for generating a primary charged particle beam; a focusing assembly, such as a charged particle lens, e.g., an electrostatic lens, for focusing the primary charged particle... | 11/23/2010 |
| 7838820 | Controlled kinetic energy ion source for miniature ion trap and related spectroscopy system and method An ion trap mass spectrometry system adapted for portability and related method includes an ion source for generating ions from a sample to be analyzed, and a resistive drift tube coupled to an output of the ion source for receiving the ions injected therein. The re... | 11/23/2010 |
| 7838846 | Rocking toothbrush sanitizer A toothbrush or the like may be inserted, bristles downward, into an aperture in a cap removably attached to a body of the apparatus. A peg may be inserted into any one of the apertures in order to allow an electric toothbrush head or other non-standard type of toot... | 11/23/2010 |
| 7838843 | Carbon nano tube processing method, processing apparatus, and carbon nano tube dispersion liquid, carbon nano tube powder An apparatus 1A for processing carbon nanotubes (CNTs) includes: a processing chamber 3 for housing to-be-processed liquid 2 with CNT raw material 5 to be fragmented being suspended in a solvent 4; and a pulse irradiation light sou... | 11/23/2010 |
| 7834316 | Method for adjusting imaging magnification and charged particle beam apparatus There is provided a method for setting a suitable imaging magnification for each of a plurality of measurement places in a charged particle beam apparatus which images a semiconductor pattern. For a given measuring point coordinate, a line segment or a vertex... | 11/16/2010 |
| 7834315 | Method for STEM sample inspection in a charged particle beam instrument A method for sample examination in a dual-beam FIB calculates a first angle as a function of second, third and fourth angles defined by the geometry of the FIB and the tilt of the specimen stage. A fifth angle is calculated as a function of the stated angles, where ... | 11/16/2010 |
| 7825374 | Tandem time-of-flight mass spectrometer A tandem mass spectrometer includes a linear time-of-flight mass analyzer and curved field reflectron mass analyzer. The curved-field reflectron mass analyzer is disposed at an end of the linear time-of-flight mass analyzer such that ions having a plurality of ion m... | 11/02/2010 |
| 7820991 | Radiation source and device Radiation source for electromagnetic radiation the major effective component of which is in the near-infrared region, in particular in the wavelength region between 0.8 μm and 1.5 μm, to form an elongated irradiation zone, with an elongated halogen lamp comprising... | 10/26/2010 |
| 7816655 | Reflective electron patterning device and method of using same One embodiment disclosed relates to a reflective electron patterning device. The device includes a pattern on a surface. There is an electron reflective portion of the pattern and an electron non-reflective portion of the pattern. Another embodiment disclosed relate... | 10/19/2010 |
| 7812306 | Instruments for measuring nanoparticle exposure An instrument for non-invasively measuring nanoparticle exposure includes a corona discharge element generating ions to effect unipolar diffusion charging of an aerosol, followed by an ion trap for removing excess ions and a portion of the charged particles with ele... | 10/12/2010 |
| 7804076 | Insulator for high current ion implanters An insulator usable in high current ion implantation systems includes increased surface due to the configuration of an inner cylinder and an outer cylinder coupled to the inner cylinder at one end. A cylindrical cavity extends between the two cylinders increasing th... | 09/28/2010 |
| 7800079 | Assembly for detection of radiation flux and contamination of an optical component, lithographic apparatus including such an assembly and device manufacturing method An assembly for detection of at least one of radiation flux and contamination on an optical component includes a detector configured to receive at least one of the radiation flux and contamination, and when the assembly is in use, to generate a detector signal corre... | 09/21/2010 |
| 7800082 | Electromagnet with active field containment An electromagnet and related ion implanter system including active field containment are disclosed. The electromagnet provides a dipole magnetic field within a tall, large gap with minimum distortion and degradation of strength. In one embodiment, an electromagnet f... | 09/21/2010 |
| 7777197 | Vacuum reaction chamber with x-lamp heater Methods and apparatus for electron beam treatment of a substrate are provided. An electron beam apparatus that includes a vacuum chamber, at least one thermocouple assembly in communication with the vacuum chamber, a heating device in communication with the vacuum c... | 08/17/2010 |
| 7772570 | Assembly for blocking a beam of radiation and method of blocking a beam of radiation An assembly is provided for blocking a beam of radiation. The assembly has a pipe arranged to transmit at least part of the beam of radiation. The pipe has an inner surface provided with an ablation material and encloses a volume. The assembly further has an ablatio... | 08/10/2010 |
| 7772543 | System and method for processing nanowires with holographic optical tweezers A system and method for manipulating and processing nanowires in solution with arrays of holographic optical traps. The system and method of the present invention is capable of creating hundreds of individually controlled optical traps with the ability to manipulate... | 08/10/2010 |
| 7772544 | Neutral beam source and method for plasma heating Method and system for producing a neutral beam source is described. The neutral beam source comprises a plasma generation system for forming a first plasma in a first plasma region, a plasma heating system for heating electrons from the first plasma region in a seco... | 08/10/2010 |
| 7772576 | Shielding assembly for semiconductor manufacturing apparatus and method of using the same A shielding assembly for use in a semiconductor manufacturing apparatus, such as an ion implantation apparatus, includes one or more removable shielding members configured to cover inner surfaces of a mass analyzing chamber. The shielding assembly reduces process by... | 08/10/2010 |
| 7767961 | Method for determining material interfacial and metrology information of a sample using atomic force microscopy A method for determining interfacial information and critical dimensions of a sample using atomic force microscopy. Tip-specimen deconvolution is performed on the scan lines before the critical dimension information processing. Local maxima and minima or local slope... | 08/03/2010 |
| 7750320 | System and method for two-dimensional beam scan across a workpiece of an ion implanter A workpiece or semiconductor wafer is tilted as a ribbon beam is swept up and/or down the workpiece. In so doing, the implant angle or the angle of the ion beam relative to the workpiece remains substantially constant across the wafer. This allows devices to be form... | 07/06/2010 |
| 7750295 | Extractor for an microcolumn, an alignment method for an extractor aperture to an electron emitter, and a measuring method and an alignment method using thereof The present invention provides a new extractor for a micro-column and an alignment method of the aperture of the extractor and an electron emitter for a micro-column. Further, the present invention provides a measuring system, a method for measuring, and an alignmen... | 07/06/2010 |
| 7737425 | Contamination barrier with expandable lamellas A contamination barrier configured to permit radiation from a radiation source to pass through and to capture debris from the radiation source. The contamination barrier includes a support structure, a plurality of plate members arranged on the support structure and... | 06/15/2010 |
| 7737418 | Debris mitigation system and lithographic apparatus A debris mitigation system for trapping debris coming from a tin debris-generating radiation source is provided. The debris mitigating system includes a debris barrier comprising a plurality of foils, and a cleaning system constructed and arranged to clean the foils... | 06/15/2010 |
| 7728314 | Infra-red source and gas sensor An infrared source and a gas sensor, a first layer and a second layer effecting bandpass filter characteristics for an operating frequency range. ... | 06/01/2010 |
| 7723678 | Method and apparatus for surface desorption ionization by charged particles An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that ch... | 05/25/2010 |
| 7718982 | Programmable particle scatterer for radiation therapy beam formation Interposing a programmable path length of one or more materials into a particle beam modulates scattering angle and beam range in a predetermined manner to create a predetermined spread out Bragg peak at a predetermined range. Materials can be “low Z” and “hig... | 05/18/2010 |
| 7715676 | Optical grating coupler An optical grating is disposed on a waveguide to redirect light from the interior of the waveguide through the opposite side of the waveguide from the grating. In one embodiment the waveguide, the grating, and an optical sensor are combined in a single monolithic st... | 05/11/2010 |
| 7714307 | Method of designing a projection system, lithographic apparatus and device manufacturing method Optimization of a projection system is performed to obtain a starting configuration that is at a local minimum of the merit function or simply a previously known minimum system is used as the starting configuration. A zero-thickness meniscus lens is inserted at a su... | 05/11/2010 |
| 7714284 | Methods and apparatus for enhanced sample identification based on combined analytical techniques The invention relates generally to ion mobility based systems, methods and devices for analyzing samples and, more particularly, to sample detection using multiple detection and analytical techniques in combination. ... | 05/11/2010 |
| 7714275 | Mass spectrometry with selective ion filtration by digital thresholding The methods described herein generally relate to characterization of large analytes, such as biomolecules, by molecular mass analysis. Specifically, the methods are directed to molecular mass analysis of singly- or multiply-charged ions by selective ion filtering ca... | 05/11/2010 |
| 7705300 | Charged particle beam adjusting method and charged particle beam apparatus In an apparatus for obtaining an image by irradiating a charged particle beam on a specimen, a condition of the beam conditioned differently from vertical incidence as in the case of the beam being tilted is required to be adjusted. To this end, the apparatus has a ... | 04/27/2010 |
| 7705323 | Microscope stage with flexural axis A microscope stage with a flexural axis may exhibit predictable flexure characteristics and limited cross-coupling translations. Z motion of a Z plate proximate to a Z actuator may be substantially linear, while a distal side of the Z plate may be allowed to rotate ... | 04/27/2010 |
| 7692145 | Method to analyze physical and chemical properties on the surface layer of a solid The present invention relates generally to a method for analyzing the surface and the near-surface layers of a solid and, more specifically, to a method that utilizes activating actions to analyze the physical and the chemical properties of the layers. The instant a... | 04/06/2010 |
| 7683319 | Charge control apparatus and measurement apparatus equipped with the charge control apparatus The invention solves charge nonuniformity of a specimen surface resulting from emission variation of a carbon nanotube electron source and individual difference of emission characteristics. During charge control processing, charge of the specimen surface is measured... | 03/23/2010 |
| 7679051 | Ion composition analyzer with increased dynamic range A system and method for separating ions in an ion mixture, such as a plasma in space. The ion mixture enters an electrostatic analyzer, whose ion path has at least two sections. A first section applies a DC voltage to the ions, and a next section applies an RF frequ... | 03/16/2010 |
| 7675043 | Mesh and method of observing rubber slice technical field Left and right sides of the mesh sandwiching the placing region therebetween are set as left and right to-be-fixed portions to be fixed to sample holder separation portions respectively to be moved in a stretch direction. A slit for dividing use is formed from a por... | 03/09/2010 |
| 7671330 | High resolution mass spectrometry method and system for analysis of whole proteins and other large molecules A matrix assisted laser desorption/ionization (MALDI) method and related system for analyzing high molecular weight analytes includes the steps of providing at least one matrix-containing particle inside an ion trap, wherein at least one high molecular weight analyt... | 03/02/2010 |
| 7667194 | Method of producing microarray A method of producing a microarray including: (A) ejecting a liquid sample from an outlet onto an inspection carrier to form inspection spots, inspecting the resultant inspection spots for their quality to determine whether the inspected spots are defective or succe... | 02/23/2010 |
