U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Icon_funbox Quotables

"I watched his countenance closely, to see if he was not deranged ... and I was assured by other senators after he left the room that they had no confidence in it."

U.S. Senator Smith of Indiana ; After seeing Samuel Morse demonstrate the telegraph.

Newsletter  PatentStorm News

Make the Most of Our Site

See this month's Top Inventors and Most Cited Patents.

Stay on top of the latest innovations by subscribing to an RSS feed.

Registered users: Manage your profile.

 

Examiner: Vanore, David A.


Primary examiner statistics: 408 patents; average approval time: 412 days
Assistant examiner statistics: 260 patents; average approval time: 1033 days

Patents as Primary Examiner (view all)

Patent No. Patent Title:
7902498 Methods and apparatus for enhanced ion based sample detection usi...
7847269 Apparatus for and method of treating a fluid
7838830 Charged particle beam apparatus and method for operating a charge...
7838820 Controlled kinetic energy ion source for miniature ion trap and r...
7838846 Rocking toothbrush sanitizer
7838843 Carbon nano tube processing method, processing apparatus, and car...
7834316 Method for adjusting imaging magnification and charged particle b...
7834315 Method for STEM sample inspection in a charged particle beam inst...
7825374 Tandem time-of-flight mass spectrometer
7820991 Radiation source and device
7816655 Reflective electron patterning device and method of using same
7812306 Instruments for measuring nanoparticle exposure
7804076 Insulator for high current ion implanters
7800079 Assembly for detection of radiation flux and contamination of an ...
7800082 Electromagnet with active field containment
7777197 Vacuum reaction chamber with x-lamp heater
7772570 Assembly for blocking a beam of radiation and method of blocking ...
7772543 System and method for processing nanowires with holographic optic...
7772544 Neutral beam source and method for plasma heating
7772576 Shielding assembly for semiconductor manufacturing apparatus and ...
7767961 Method for determining material interfacial and metrology informa...
7750320 System and method for two-dimensional beam scan across a workpiec...
7750295 Extractor for an microcolumn, an alignment method for an extracto...
7737425 Contamination barrier with expandable lamellas
7737418 Debris mitigation system and lithographic apparatus
7728314 Infra-red source and gas sensor
7723678 Method and apparatus for surface desorption ionization by charged...
7718982 Programmable particle scatterer for radiation therapy beam format...
7715676 Optical grating coupler
7714307 Method of designing a projection system, lithographic apparatus a...
7714284 Methods and apparatus for enhanced sample identification based on...
7714275 Mass spectrometry with selective ion filtration by digital thresh...
7705300 Charged particle beam adjusting method and charged particle beam ...
7705323 Microscope stage with flexural axis
7692145 Method to analyze physical and chemical properties on the surface...
7683319 Charge control apparatus and measurement apparatus equipped with ...
7679051 Ion composition analyzer with increased dynamic range
7675043 Mesh and method of observing rubber slice technical field
7671330 High resolution mass spectrometry method and system for analysis ...
7667194 Method of producing microarray

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
7227130 Method for providing barrier fields at the entrance and exit end ...
7126139 Device and method of positionally accurate implantation of indivi...
7115859 Time- of flight mass spectrometers for improving resolution and m...
7112784 Method of mass spectrometry and a mass spectrometer
7091505 Collector with fastening devices for fastening mirror shells
7078711 Matching dose and energy of multiple ion implanters
7078690 Monitoring of contact hole production
7071463 Calibration method
7067831 Pulsed solar simulator with improved homogeneity
7064319 Mass spectrometer
7062111 Optical communication module with one or more photonic integrated...
7060973 Multi-anode detector with increased dynamic range for time-of-fli...
7060972 Triple quadrupole mass spectrometer with capability to perform mu...
7049613 Particle beam irradiation system and method of adjusting irradiat...
7049581 Analysis of data from a mass spectrometer
7045783 Device and method for object illumination and imaging using light...
7041976 Automated focusing of electron image
7038201 Method and apparatus for determining electrical contact wear
7038224 Contact opening metrology
7038217 Method and apparatus for generation of molecular beam
7038219 Sterilization of packages and their contents using light
7034287 Mass spectrometer and method of use
7033742 Method of photothermographic imaging for transmission electron mi...
7034314 Projection apparatus for projecting a pattern formed on a mask on...
7031573 Fiber optic devices having volume Bragg grating elements
7030394 Charged particle beam apparatus and automatic astigmatism adjustm...
7030373 MALDI plate construction with grid
7026629 Lithographic apparatus and device manufacturing method
7022988 Method and apparatus for measuring physical properties of micro r...
7022981 Mass analysis apparatus and method for mass analysis
7023953 Illumination system and exposure apparatus and method
7019291 NOx monitor using differential mobility spectrometry
7019289 Ion trap mass spectrometry
7019290 System and method for modifying the fringing fields of a radio fr...
7015469 Electron holography method
7015464 Apparatus for detecting chemical substances and method therefor
7012253 Transmission electron microscope and three-dimensional observing ...
7009193 Utilization of an ion gauge in the process chamber of a semicondu...
7005658 Charged particle beam exposure apparatus and method
6998610 Methods and apparatus for switching ion trap to operate between t...
 
Sign InRegister
Username  
Password   
forgot password?