U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

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In 1608, Dutch eyeglass maker Hans Lipperhey filed the first patent for a working telescope. The patent was denied.

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Examiner: Khuu, Cindy D.


Primary examiner statistics: 0 patents; average approval time: N/A
Assistant examiner statistics: 177 patents; average approval time: 178 days

Patents as Primary Examiner

Patent No. Patent Title:
No patents.

Patents as Assistant Examiner (view all)

Patent No. Patent Title:
7463996 Method and apparatus for scanning
7460979 Method and system for enhanced resolution, automatically-calibrat...
7457714 Autocalibrated multiphase fluid characterization using extrema of...
7457718 Apparatus and method for dynamic configuration of temperature pro...
7454302 Method of inspecting integrated circuits during fabrication
7454314 Medication management system
7454310 Method for calculating business process durations
7444250 Measuring or test device comprising interchangeable functional un...
7440867 System and method for measuring workpieces
7437273 Method for monitoring and analysing the printing process of a pre...
7437248 Water quality sampling system
7437272 Systems and methods for self-synchronized digital sampling
7433791 Method of performing multiple stage model calibration for optical...
7426451 Handheld surface coordinate measuring device
7426443 Device for determining and/or monitoring the volume flow rate and...
7426452 Dual protocol handheld field maintenance tool with radio-frequenc...
7424379 Activity information meter
7424387 Method for use with an optical aligner system for positioning a f...
7418362 Method and device for determining wheel force
7415373 Method of measuring frequency translation device
7409300 Ultrasonic flow-velocity distribution meter/flowmeter, method of ...
7403864 Method and system for centrally-controlled semiconductor wafer co...
7398183 Medication management system
7395174 Generation of software thermal profiles executed on a set of proc...
7395165 Circuit arrangement with non-volatile memory module and method of...
7395178 Measuring system and method for the functional monitoring thereof
7395164 Exponential smoothing of aperiodically measured values with stale...
7389193 Apparatus and method for calibrating transmission paths in a mult...
7389195 Uniform power density across processor cores at burn-in
7389199 Method of determining a dimension of a sample of a construction m...
7386419 Method, apparatus, system and computer program product for select...
7383138 Semiconductor device
7383154 Method for assessing models of vehicle driving style or vehicle u...
7379841 Inclination calculation apparatus and inclination calculation pro...
7379845 Structure health monitoring system and method
7379826 Semiconductor wafer inspection system
7379837 Method and system for testing integrated circuits
7376527 Azimuth measuring device
7376521 Flow computer with networked I/O modules
7369952 Quantification of disease progression by means of interpolation b...
 
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