| Patent No. | Patent Title: |
| 7463042 | Connector probing system |
| 7453261 | Method of and system for monitoring the functionality of a wafer ... |
| 7443183 | Motherboard test machine |
| 7439730 | Apparatus and method for detecting photon emissions from transist... |
| 7427869 | Resilient contact probe apparatus |
| 7423446 | Characterization array and method for determining threshold volta... |
| 7423442 | System and method for early qualification of semiconductor device... |
| 7414424 | Directional power detection by quadrature sampling |
| 7414422 | System in-package test inspection apparatus and test inspection m... |
| 7408367 | Micro Kelvin probes and micro Kelvin probe methodology with conce... |
| 7403030 | Using parametric measurement units as a source of power for a dev... |
| 7397263 | Sensor differentiated fault isolation |
| 7397255 | Micro Kelvin probes and micro Kelvin probe methodology |
| 7397253 | Transmission line pulse (TLP) system calibration technique |
| 7394273 | On-chip electromigration monitoring system |
| 7382148 | System and method for testing an LED and a connector thereof |
| 7368931 | On-chip self test circuit and self test method for signal distort... |
| 7365554 | Integrated circuit for determining a voltage |
| 7358755 | Ring oscillator system |
| 7352197 | Octal/quad site docking compatibility for package test handler |
| 7348790 | AC testing of leakage current in integrated circuits using RC tim... |
| 7339385 | Semiconductor test apparatus and interface plate |
| 7339389 | Semiconductor device incorporating characteristic evaluating circ... |
| 7339367 | Interface for detection and control of multiple test probes |
| 7339394 | Current sensing in a two-phase motor |
| 7323890 | Multi-point probe |
| 7323862 | Apparatus and method for detecting photon emissions from transist... |
| 7312617 | Space transformers employing wire bonds for interconnections with... |
| 7310001 | Current sensing method and current sensing device, power conversi... |
| 7307437 | Arrangement with conductive pad embedment |
| 7307444 | Testing method and testing apparatus for liquid crystal panel |
| 7304490 | In-situ wafer and probe desorption using closed loop heating |
| 7301357 | Inspection method and inspection equipment |
| 7294999 | Apparatus for automatically displaying the grade of liquid crysta... |
| 7285966 | Probe and method of making same |
| 7282930 | Device for testing thin elements |
| 7282941 | Method of measuring semiconductor wafers with an oxide enhanced p... |
| 7282904 | Device for measuring the intensity of a strong current passing th... |
| 7279888 | Handling unit for electronic devices |
| 7276925 | Operating an integrated circuit at a minimum supply voltage |
Quotables 
PatentStorm News
