Class 977/881 - Microscopy or spectroscopy (e.g., SEM, TEM, etc.)

Subclass of Class 977 - Nanotechnology
Definition: Subject matter wherein a microscopy instrument such as an
No. of patents: 22
Last issue date: 10/07/2008

Number	Title	Issue Date
7430898	Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique A system that includes an optical subsystem and an atomic force microscope probe is provided. The optical subsystem is configured to generate positional information about a location on a surface of the specimen. The system is configured to position the probe proxima...	10/07/2008
7315374	Real-time monitoring optically trapped carbon nanotubes An embodiment of the present invention is a technique to monitor carbon nanotubes (CNTs). A carbon nanotube (CNT) is manipulated in a fluid by a laser beam. An illuminating light from a light source is aligned along axis of the CNT to produce an optical response fro...	01/01/2008
7268269	Multi-functional protective textiles and methods for decontamination A reactive and adsorptive (i.e., multi-functional protective) textile and methods for constructing and using same which possess at least chemically reactive and biocidal properties. Nanoparticles from different classes such as metal oxides, metal hydroxides, metal h...	09/11/2007
7181266	Materials and methods for near-infrared and infrared lymph node mapping A lymphatic system can be imaged with emissive semiconductor nanocrystals, for example, in the near infrared. ...	02/20/2007
6700127	Point source for producing electrons beams An apparatus for producing an electron beam, containing a vacuum chamber, a source of electron beams within the vacuum chamber, and a device for focusing the electrons beams. An electron transparent window is formed at the end of the vacuum chamber; and t...	03/02/2004
6683316	Apparatus for correlating an optical image and a SEM image and method of use thereof An instrument system is controlled to acquire an optical image of an object, with the optical image defining a first coordinate system. The object is positioned in a second coordinate system and a point in the optical image is selected. The object is repo...	01/27/2004
6683451	Magnetic resonance force microscope for the study of biological systems A high resolution magnetic resonance force microscope is adapted to study biological systems, such as isolated cells, sub-cellular organelles and other sub-cellular structures, or cellular receptors and proteins, at resolutions ranging from 1 micron to 1 ...	01/27/2004
6677697	Force scanning probe microscope A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also inclu...	01/13/2004
6677567	Scanning probe microscope with improved scan accuracy, scan speed, and optical vision A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (als...	01/13/2004
6672144	Dynamic activation for an atomic force microscope and method of use thereof A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a ...	01/06/2004
6666075	System and method of multi-dimensional force sensing for scanning probe microscopy A scanning probe microscopy tool is provided with a force sensor that simultaneously measures more than one component of a surface force. The tool is comprised of an oscillator, a tip, a mechanical actuator, a sensing system, and a feedback control system...	12/23/2003
6662623	Apparatus and method for glide height calibration of disk surfaces by use of dual-zone laser texture A disk for calibrating glide heads utilizes a dual-zone configuration of multiple laser melt bumps having selected heights. Averaging the PZT response over many bumps significantly narrows the response distribution, resulting in greater certainty and corr...	12/16/2003
6661004	Image deconvolution techniques for probe scanning apparatus An apparatus and method are provided for processing the images obtained from an atomic force microscopy when profiling high aspect ratio features. A deconvolution technique for deconvolving the sample image includes the use of multiple images but does not...	12/09/2003
6654118	Method and apparatus for obtaining molecular data from a pharmaceutical specimen This invention relates to a method and apparatus for the analysis of pharmaceutical specimens by nondestructively obtaining the molecular data for a chemical component on the surface or within the matrix of a pharmaceutical specimen....	11/25/2003
6646113	Nucleic acid molecule encoding human survival of motor neuron-interacting protein 1 (SIP1) deletion mutants The invention relates to an isolated nucleic acid encoding a eukaryotic Survival of Motor Neuron-Interacting Protein 1 (SIP1), compositions comprising SIP1 and SIP1 and the spinal muscular atrophy (SMA) disease gene product Survival of Motor Neuron protei...	11/11/2003
6645824	Combined optical profilometry and projection microscopy of integrated circuit structures A metrology method and system of structures on a wafer includes obtaining a projection image of at least a first portion of the structures on the wafer using a first metrology apparatus. A profile of at least a second portion of the structure on the wafer...	11/11/2003
6633174	Stepper type test structures and methods for inspection of semiconductor integrated circuits Disclosed is a method of inspecting a sample. The method includes moving to a first field associated with a first group of test structures. The first group of test structures are partially within the first field. The method further includes scanning the f...	10/14/2003
6627886	Secondary electron spectroscopy method and system A system and a method for fast characterization of sample's material composition, which is especially beneficial for semiconductor fabrication. The material composition is characterized by analyzing secondary electrons emission from the sample. According ...	09/30/2003
6622547	System and method for facilitating selection of optimized optical proximity correction A system and method for evaluating optical proximity corrected (OPC) designs is provided. The system includes an AFM measurement system for performing measurements relating to a segment of a feature pattern corresponding to a predetermined OPC mask featur...	09/23/2003
6621114	MOS transistors with high-k dielectric gate insulator for reducing remote scattering The present invention relates to a MOS transistor structure and method of manufacture which provides a high-k dielectric gate insulator for reduced gate current leakage while concurrently reducing remote scattering, thereby improving transistor carrier mo...	09/16/2003
6611087	Method and apparatus for simultaneously depositing and observing materials on a target A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between ...	08/26/2003
6244103	Interpolated height determination in an atomic force microscope A method and apparatus associated with an atomic force microscope (AFM) to more accurately measure the height of a microscopic feature in a substrate, particularly one having a sloping face. The probe tip is sequentially positioned at a number of vertical...	06/12/2001

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Class 977/881 - Microscopy or spectroscopy (e.g., SEM, TEM, etc.)