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Class 977/879 - Material


Subclass of Class 977 - Nanotechnology
Definition: Subject matter wherein the material forming the tip is specified.
No. of patents: 2
Last issue date: 01/15/2008


NumberTitleIssue Date
7319224Semiconductor probe with resistive tip and method of fabricating the same
Provided are a semiconductor probe with a resistive tip, and a method of fabricating the semiconductor probe. The method includes forming a stripe-shaped mask layer on a substrate doped with a first impurity, and forming first and second electrode regions by heavily...
01/15/2008
6246054Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls
A probe chip suitable for observing the vertical walls of steps in a specimen includes a cantilever-like elastic member section extending from a support section, and a probe section at the free end of the elastic member section. The probe section is in th...
06/12/2001
 
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