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Patent No. 6099319

Neuroimaging as a Marketing Tool

Neuroimaging as a means for validating whether a stimulus such as advertisement, communication, or product evokes a certain mental response such as emotion, preference, or memory, or to predict the consequences of the stimulus on later behavior such as consumption or purchasing.

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Class 977/875 - With tip detail


Subclass of Class 977 - Nanotechnology
Definition: Subject matter including structural characteristics of the
No. of patents: 10
Last issue date: 09/13/2011


NumberTitleIssue Date
8020216Tapered probe structures and fabrication
Probe structures and fabrication techniques are described. The described probe structures can be used as probes for various applications such as conductance measurement probes, field emitter probes, nanofabrication probes, and magnetic bit writing or reading probes....
09/13/2011
7814566Tip array structure and fabricating method of tip structure
A fabricating method of a structure having nano-hole is provided. The fabricating method includes: providing a substrate, forming a photoresist layer on the substrate, forming an opening, and performing a heat treatment process on the photoresist layer to shrink the...
10/12/2010
7427754Telegraph signal microscopy device and method
A microscope device includes a probe having a dielectric material with a first side and a second side. First and second electrodes are disposed on the first side of the dielectric material. A nanotube connects the first and second electrodes. A gate electrode is dis...
09/23/2008
7344756Method for scanning probe contact printing
A method for fabricating scanning probe microscopy (SPM) probes is disclosed. The probes are fabricated by forming a structural layer on a substrate, wherein the substrate forms a cavity. A sacrificial layer is located between the substrate and the structural layer....
03/18/2008
7319224Semiconductor probe with resistive tip and method of fabricating the same
Provided are a semiconductor probe with a resistive tip, and a method of fabricating the semiconductor probe. The method includes forming a stripe-shaped mask layer on a substrate doped with a first impurity, and forming first and second electrode regions by heavily...
01/15/2008
6666075System and method of multi-dimensional force sensing for scanning probe microscopy
A scanning probe microscopy tool is provided with a force sensor that simultaneously measures more than one component of a surface force. The tool is comprised of an oscillator, a tip, a mechanical actuator, a sensing system, and a feedback control system...
12/23/2003
6665258Method and apparatus for recording, storing and reproducing information
A method and apparatus for recording and storing information on and reproducing information from a storage medium is described, wherein the active storage medium forms part of the write/read signal path....
12/16/2003
6661004Image deconvolution techniques for probe scanning apparatus
An apparatus and method are provided for processing the images obtained from an atomic force microscopy when profiling high aspect ratio features. A deconvolution technique for deconvolving the sample image includes the use of multiple images but does not...
12/09/2003
6244103Interpolated height determination in an atomic force microscope
A method and apparatus associated with an atomic force microscope (AFM) to more accurately measure the height of a microscopic feature in a substrate, particularly one having a sloping face. The probe tip is sequentially positioned at a number of vertical...
06/12/2001
5116782Method and apparatus for processing a fine pattern
A method and apparatus for processing a fine pattern of a sample of one of an electronic device, molecular device and bioelement device, wherein a needle having a sharpened tip is disposed in opposed relation to the sample with a gap therebetween. A volta...
05/26/1992
 
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