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The ice cream cone was invented at the St. Louis Worlds Fair by Ernest Hamwi in 1904. His waffle booth was next to an ice cream vendor who ran short of dishes. Hamwi rolled a waffle to hold ice cream and the cone was born.
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| Number | Title | Issue Date |
| 7076871 | Method of manufacturing a carbon nanotube device A method of manufacturing a carbon nanotube device including an inner electrode, having connecting step, connecting a carbon nanotube to the inner electrode, wherein the connecting step comprises: attaching a conductor to an end or periphery thereof of a needle-shap... | 07/18/2006 |
| 6690008 | Probe and method of manufacturing mounted AFM probes An atomic force microscopy (AFM) probe and a method of manufacturing mounted probes for AFM applications. The method implements an optimized soldering procedure for mounting a probe to a holder chip. In one embodiment, a metallisation system of Ti:W+Ni+Au... | 02/10/2004 |
| 6677567 | Scanning probe microscope with improved scan accuracy, scan speed, and optical vision A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (als... | 01/13/2004 |
| 6668628 | Scanning probe system with spring probe Scanning probe systems, which include scanning probe microscopes (SPMs), atomic force microscope (AFMs), or profilometers, are disclosed that use cantilevered spring (e.g., stressy metal) probes formed on transparent substrates. When released, a free end ... | 12/30/2003 |
| 6668627 | Sensor apparatus with magnetically deflected cantilever A magnetically excited, resonant cantilever sensor apparatus has a cantilever as the transducer element. A static magnetic field is directed in the plane of the cantilever(s) cooperating with a current loop in/on the latter. Orienting the magnetic field a... | 12/30/2003 |
| 6664540 | Microprobe and sample surface measuring apparatus A microprobe has a cantilever having a first lever portion having a free end portion, a second lever portion having a front end portion from which the first lever portion projects, and a support portion for supporting the second lever portion. A piezoresi... | 12/16/2003 |
| 6636050 | Four-terminal measuring device that uses nanotube terminals A four-terminal measuring device, which uses nanotube terminals and measures low resistance values and low impedance values of extremely small objects under test with good precision, including two current terminals which cause a constant current to flow f... | 10/21/2003 |
| 6625109 | Near-field optical head and head support assembly having near-field optical head A near-field optical head comprises a slider body and a cantilever arm extending from the slider body and having a contact pad at an end portion thereof for contacting a surface of a recording medium. The slider body has an air bearing surface which inter... | 09/23/2003 |
| 6246652 | Device using sensor for small rotation angle A recording and reproducing or observing apparatus based on a laser beam deflection detection method in which an object has a very small area for reflecting light. A laser beam emitted by a semiconductor laser diode passes through a collimator lens and a ... | 06/12/2001 |
| 6246054 | Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls A probe chip suitable for observing the vertical walls of steps in a specimen includes a cantilever-like elastic member section extending from a support section, and a probe section at the free end of the elastic member section. The probe section is in th... | 06/12/2001 |
| 6240771 | Device for noncontact intermittent contact scanning of a surface and a process therefore A device for noncontact scanning of a surface (17), with a sensor (10) having an elongated spring element (11) and a sensing tip (15). The spring element is oriented essentially parallel to the surface to be scanned. The tip is located on a side (19) of t... | 06/05/2001 |
| 6237399 | Cantilever having sensor system for independent measurement of force and torque A cantilever structure is provided having a cantilever arm with a piezo-active detector embedded on the surface at the fixed end of the cantilever as well as at a sensing point close to the free end along with an integrated amplification circuitry. Deflec... | 05/29/2001 |
