Bizarre Patents
Combination Beverage Container and Spittoon
A combination beverage container and spittoon includes a bottom portion including outer wall and a first inner wall defining a spittoon space.
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| Number | Title | Issue Date |
| 7886366 | Cantilever device and cantilever controlling method The amplitude control of a cantilever based on the van der Pol model is performed through feedback using measurement data on a deflection of the cantilever. A self-oscillating circuit integrates a deflection angle signal of a cantilever detected by a deflection angl... | 02/08/2011 |
| 7861315 | Method for microfabricating a probe with integrated handle, cantilever, tip and circuit A simple method for integrating a circuit onto a probe with a handle, a cantilever and a tip is provided. By fabricating a probe whose surface has recessed patterns of the desirable profile, a circuit can be formed on one part of the handle out over the cantilever a... | 12/28/2010 |
| 7442922 | Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology The invention relates to a combined method in which a high-resolution image of a sample surface is recorded by means of scanning force microscopy and the locally high-resolution, chemical nature (which is correlated with this) of the sample surface is measured by me... | 10/28/2008 |
| 7430898 | Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique A system that includes an optical subsystem and an atomic force microscope probe is provided. The optical subsystem is configured to generate positional information about a location on a surface of the specimen. The system is configured to position the probe proxima... | 10/07/2008 |
| 7420106 | Scanning probe characterization of surfaces Characterizing dielectric surfaces by detecting electron tunneling. An apparatus includes an atomic force probe. A mechanical actuator is connected to the atomic force probe. A mechanical modulator is connected to the mechanical actuator. The mechanical modulator mo... | 09/02/2008 |
| 7402736 | Method of fabricating a probe having a field effect transistor channel structure A probe of a scanning probe microscope having a sharp tip and an increased electric characteristic by fabricating a planar type of field effect transistor and manufacturing a conductive carbon nanotube on the planar type field effect transistor. To achieve this, the... | 07/22/2008 |
| 7278299 | Method of processing vertical cross-section using atomic force microscope An indentation is formed by thrusting a probe of a scanning probe microscope for processing, which has a vertical surface or a vertical ridge and is harder than sample material, into sample for measuring the indentation. A high-fidelity AFM observation is performed ... | 10/09/2007 |
| 7207119 | Controller The present invention relates to a controller comprising: at least two input terminals, each of which is configured to receive one of at least two input signals comprising information on a positioning of a scanner relative to a reference medium, and an output termin... | 04/24/2007 |
| 7095822 | Near-field X-ray fluorescence microprobe This invention pertains to an x-ray microprobe that can be placed very close the sample surface. A practical implementation is an x-ray target material integrated to an atomic force microscope (AFM) tip and an electron beam is focused to the target materials to gene... | 08/22/2006 |
| 7073937 | Heat emitting probe and heat emitting probe apparatus A heat emitting probe including a conductive nanotube probe needle with its base end fastened to a holder and its tip end protruded, a heat emitting body formed on the probe needle, a conductive nanotube lead wire fastened to the heat emitting body, and an electric ... | 07/11/2006 |
| 6684686 | Non-contact type atomic microscope and observation method using it A non-contact-type atomic microscope including a plurality of probes differing in resonance frequency, an actuator for vibrating the plurality of probes simultaneously, and a drive signal generating circuit for generating a drive signal for the actuator. ... | 02/03/2004 |
| 6677697 | Force scanning probe microscope A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also inclu... | 01/13/2004 |
| 6672144 | Dynamic activation for an atomic force microscope and method of use thereof A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a ... | 01/06/2004 |
| 6665258 | Method and apparatus for recording, storing and reproducing information A method and apparatus for recording and storing information on and reproducing information from a storage medium is described, wherein the active storage medium forms part of the write/read signal path.... | 12/16/2003 |
| 6661004 | Image deconvolution techniques for probe scanning apparatus An apparatus and method are provided for processing the images obtained from an atomic force microscopy when profiling high aspect ratio features. A deconvolution technique for deconvolving the sample image includes the use of multiple images but does not... | 12/09/2003 |
| 6653630 | Tailoring domain engineered structures in ferroelectric materials Scanning probe apparatus, including a tip-electrode which is coupled to be held at a substantially ground potential, a counter-electrode which is positioned in proximity to the tip-electrode, a voltage source, coupled to maintain the counter-electrode at ... | 11/25/2003 |
| 6652413 | Traction drive rotary assembly A traction drive rotary assembly including a plurality of rolling elements having traction contact surfaces associating with each other to transmit power between the rolling elements. At least one of the traction contact surfaces has a surface microstruct... | 11/25/2003 |
| 6649902 | Summing the output of an array of optical detector segments in an atomic force microscope A high sensitivity beam deflection sensing optical device, such as an atomic force microscope, including one or more of the following: specified means in the path of the incident beam for adjusting the size and/or power of the incident beam spot, means fo... | 11/18/2003 |
| 6622547 | System and method for facilitating selection of optimized optical proximity correction A system and method for evaluating optical proximity corrected (OPC) designs is provided. The system includes an AFM measurement system for performing measurements relating to a segment of a feature pattern corresponding to a predetermined OPC mask featur... | 09/23/2003 |
| 6244103 | Interpolated height determination in an atomic force microscope A method and apparatus associated with an atomic force microscope (AFM) to more accurately measure the height of a microscopic feature in a substrate, particularly one having a sloping face. The probe tip is sequentially positioned at a number of vertical... | 06/12/2001 |
| 4851671 | Oscillating quartz atomic force microscope This atomic force microscope includes a pointed tip (1) mounted on top of an oscillating crystal (2) which is translatable in xyz-directions by a conventional xyz-drive (4). A potential applied to a pair of electrodes (5, 6) coated on opposite faces of th... | 07/25/1989 |
| 4806755 | Micromechanical atomic force sensor head The micromechanical sensor head is designed to measure forces down to 10-13 N. It comprises a common base from which a cantilever beam and a beam member extend in parallel. The cantilever beam carries a sharply pointed tip of a hard material, d... | 02/21/1989 |
| 4800274 | High resolution atomic force microscope A high resolution atomic force microscope allows atomic level topographs of conducting and insulating surfaces. The microscope includes a pair of crossed wires mounted on a single piezoelectric tube which not only controls the x-, and y-, positions of the... | 01/24/1989 |
| 4724318 | Atomic force microscope and method for imaging surfaces with atomic resolution A sharp point (5) is brought so close to the surface of a sample (4) to be investigated that the forces occurring between the atoms at the apex of the point (5) and those at the surface cause a spring-like cantilever (7) to deflect. The cantilever (7) for... | 02/09/1988 |
