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| Number | Title | Issue Date |
| 7420106 | Scanning probe characterization of surfaces Characterizing dielectric surfaces by detecting electron tunneling. An apparatus includes an atomic force probe. A mechanical actuator is connected to the atomic force probe. A mechanical modulator is connected to the mechanical actuator. The mechanical modulator mo... | 09/02/2008 |
| 7414250 | Cryogenic variable temperature vacuum scanning tunneling microscope A cryogenic variable temperature scanning tunneling microscope of novel design and component configuration, for use in conjunction with a variety of low temperature methodologies. ... | 08/19/2008 |
| 7402736 | Method of fabricating a probe having a field effect transistor channel structure A probe of a scanning probe microscope having a sharp tip and an increased electric characteristic by fabricating a planar type of field effect transistor and manufacturing a conductive carbon nanotube on the planar type field effect transistor. To achieve this, the... | 07/22/2008 |
| 6665258 | Method and apparatus for recording, storing and reproducing information A method and apparatus for recording and storing information on and reproducing information from a storage medium is described, wherein the active storage medium forms part of the write/read signal path.... | 12/16/2003 |
| 6243248 | Molecular arrangement and switching device Proposed is a molecular arrangement comprising a movable molecule which is surrounded by a molecular cage-like arrangement fixed on a surface. The movable molecule is in a mobilized state in which it is decoupled from the cage-like arrangement. This means... | 06/05/2001 |
| 4861990 | Tunneling susceptometry Methods and apparatus for determining susceptibility of a material to a field, such as magnetic susceptibility, provide an elastic support for a sample of that material, and an electric tunneling current through a gap between an electrode and that elastic... | 08/29/1989 |
| 4837435 | Tunneling scanning microscope having light source The tunneling scanning microscope which is provided with a light source to irradiate a sample with light, particularly with light having one wavelength. The apparatus is used for the investigation of the surface structure of materials which have very low ... | 06/06/1989 |
| 4814622 | High speed scanning tunneling microscope A scanning tunneling microscope with a stage capable of coarse motion in the horizontal (or X Y) plane and also capable of fine or scanning motion in the X, Y and Z directions. The stage comprises a square array of nine blocks connected by twelve PZTs, wi... | 03/21/1989 |
| 4798989 | Scanning tunneling microscope installed in electron microscope A scanning tunneling microscope installed in a sample chamber of a scanning electron microscope includes a probe which is finely movable along the surface of a sample driven by a probe moving mechanism and within an area which is irradiated by an electron... | 01/17/1989 |
| 4668865 | Scanning tunneling microscope An improved scanning tunneling microscope comprising a semiconductor chip into which slots are etched to form a central portion linked by a first pair of stripes to an intermediate portion, which in turn is linked by a second pair of stripes to the main b... | 05/26/1987 |
| 4343993 | Scanning tunneling microscope The vacuum tunnel effect is utilized to form a scanning tunneling microscope. In an ultra-high vacuum at cryogenic temperature, a fine tip is raster scanned across the surface of a conducting sample at a distance of a few Angstroms. The vertical separatio... | 08/10/1982 |
