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Pillow with retractable umbrella
A pillow assembly having a supporting assembly and a retractable umbrella assembly that is easily transportable and allows a user to support his/her head while covering their face from sunlight.
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| Number | Title | Issue Date |
| 7420106 | Scanning probe characterization of surfaces Characterizing dielectric surfaces by detecting electron tunneling. An apparatus includes an atomic force probe. A mechanical actuator is connected to the atomic force probe. A mechanical modulator is connected to the mechanical actuator. The mechanical modulator mo... | 09/02/2008 |
| 7384795 | Methods for verifying fluid movement Methods for using semiconductor nanocrystals for determining fluid movement, fluid dilution and fluid removal are described. Methods for using semiconductor nanocrystals for monitoring and quantifying the amounts of solid materials dissolved in a liquid are also des... | 06/10/2008 |
| 7361893 | In situ scanning tunneling microscope tip treatment device for spin polarization imaging A tip treatment device for use in an ultrahigh vacuum in situ scanning tunneling microscope (STM). The device provides spin polarization functionality to new or existing variable temperature STM systems. The tip treatment device readily converts a conventional STM t... | 04/22/2008 |
| 6622547 | System and method for facilitating selection of optimized optical proximity correction A system and method for evaluating optical proximity corrected (OPC) designs is provided. The system includes an AFM measurement system for performing measurements relating to a segment of a feature pattern corresponding to a predetermined OPC mask featur... | 09/23/2003 |
| 6612161 | Atomic force microscopy measurements of contact resistance and current-dependent stiction A modified atomic force microscope (AFM) is used to perform contact resistance and/or current-dependent stiction measurements for conductive thin films at controlled values of applied force. The measurements are preferably performed under conditions appro... | 09/02/2003 |
| 6245204 | Vibrating tip conducting probe microscope A scanning probe microscope is provided for measuring at least one characteristic of a surface, the microscope including a force sensing probe which is responsive to the at least one characteristic of the surface, an oscillator which moves the position of... | 06/12/2001 |
| 6242737 | Microscopic system equipt with an electron microscope and a scanning probe microscope The present invention is to provide a microscopic system by which a simultaneous observation at an ultra high vacuum condition by an electron microscope and by a scanning probe microscope is possible in an ultra high vacuum electron microscope chamber 9 e... | 06/05/2001 |
| 4870352 | Contactless current probe based on electron tunneling A method and apparatus for non-destructive monitoring of the performance parameters of a photodiode prior to integration into a focal plane array are characterized by the use of electron tunneling techniques. The photodiode under test is illuminated with ... | 09/26/1989 |
| 4868396 | Cell and substrate for electrochemical STM studies A cell and substrate for use with a scanning tunneling microscope to image molecules adsorbed on a noble metal surface disposed under solvent in conducting electrochemical studies and methods for preparing atomically flat metal surfaces as the substrates ... | 09/19/1989 |
| 4861990 | Tunneling susceptometry Methods and apparatus for determining susceptibility of a material to a field, such as magnetic susceptibility, provide an elastic support for a sample of that material, and an electric tunneling current through a gap between an electrode and that elastic... | 08/29/1989 |
| 4823004 | Tunnel and field effect carrier ballistics Methods and apparatus for interacting carriers with a structure of matter employ an electrode for emitting said carriers at a distance from a surface of that structure, and cause such carriers to travel along ballistic trajectories inside that structure b... | 04/18/1989 |
| 4804909 | Atto-amperemeter An atto amperemeter includes a shop tip (1) correctable to a voltage source (18) providing a known potential (U') via a sample conductor measured, the tip (1) faces a particle detector such as an electron multiplier (4). The count of the free electrons be... | 02/14/1989 |
| 4747698 | Scanning thermal profiler Apparatus is provided for investigating surface structures irrespective of the materials involved. A fine scanning tip is heated to a steady state temperature at a location remote from the structure to be investigated. Thereupon, the scanning tip is moved... | 05/31/1988 |
| 4724318 | Atomic force microscope and method for imaging surfaces with atomic resolution A sharp point (5) is brought so close to the surface of a sample (4) to be investigated that the forces occurring between the atoms at the apex of the point (5) and those at the surface cause a spring-like cantilever (7) to deflect. The cantilever (7) for... | 02/09/1988 |
| 4665313 | Apparatus and method for displaying hole-electron pair distributions induced by electron bombardment An improved electron bombardment induced conductivity apparatus and method is described for charge collection imaging of semiconductor materials and devices with unprecedented resolution. This is accomplished by bombarding a very small area of the surface... | 05/12/1987 |
| 4618767 | Low-energy scanning transmission electron microscope Low-energy scanning transmission electron microscopy is achieved by using a sharply pointed electrode as a source of electrons having energies less than 10 eV and scanning the electron emitting pointed source across the surface of a self-supported thin fi... | 10/21/1986 |
| 4481616 | Scanning capacitance microscope Variations in topography and material properties of the surface layer of a body are observed in microscopic imaging using a scanning capacitance probe. The acronym SCaM identifying the process and apparatus is derived from the phrase scanning capacitance ... | 11/06/1984 |
| 4343993 | Scanning tunneling microscope The vacuum tunnel effect is utilized to form a scanning tunneling microscope. In an ultra-high vacuum at cryogenic temperature, a fine tip is raster scanned across the surface of a conducting sample at a distance of a few Angstroms. The vertical separatio... | 08/10/1982 |
