Celebrity Inventors
Actor Marlon Brando has four patents, all named "Drumhead tensioning device and method."
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| Number | Title | Issue Date |
| 7877816 | Scanning probe in pulsed-force mode, digital and in real time Microscope, in particular a scanning probe microscope, comprising a programmable logic device. ... | 01/25/2011 |
| 7865966 | Method and apparatus of automatic scanning probe imaging A method of operating a scanning probe microscope (SPM) includes scanning a sample as a probe of the SPM interacts with a sample, and collecting sample surface data in response to the scanning step. The method identifies a feature of the sample from the sample surfa... | 01/04/2011 |
| 7435955 | Scanning probe microscope control system A system for controlling the operation of a scanning probe microscope that greatly simplifies the microscope's operation is disclosed. The software design incorporates several advanced features such as a sample designator file, video tutorials, automation algorithms... | 10/14/2008 |
| 7429732 | Scanning probe microscopy method and apparatus utilizing sample pitch The preferred embodiments are directed to a method and apparatus of operating a scanning probe microscope (SPM) to perform sample measurements using a survey scan that is less than five lines, and more preferably two lines, to accurately locate a field of features o... | 09/30/2008 |
| 7402736 | Method of fabricating a probe having a field effect transistor channel structure A probe of a scanning probe microscope having a sharp tip and an increased electric characteristic by fabricating a planar type of field effect transistor and manufacturing a conductive carbon nanotube on the planar type field effect transistor. To achieve this, the... | 07/22/2008 |
| 7207119 | Controller The present invention relates to a controller comprising: at least two input terminals, each of which is configured to receive one of at least two input signals comprising information on a positioning of a scanner relative to a reference medium, and an output termin... | 04/24/2007 |
| 7161286 | Carbon nanotube array and method for making same A carbon nanotube-based device (40) includes a substrate (10), a number of catalytic nano-sized particles (131) formed on the substrate, and an aligned carbon nanotube array (15) extending from the alloy catalytic nano-sized particles. Th... | 01/09/2007 |
| 6701268 | Method for calibrating scanning probe and computer-readable medium therefor After preparatory measurement of a calibration reference with a scanning probe is performed, apart program for measuring the calibration reference is generated and executed so as to perform calibration measurement. After a calibration value of a coordinat... | 03/02/2004 |
| 6701267 | Method for calibrating probe and computer-readable medium A calibration reference work sphere is measured to obtain measured values by using a probe vector given before updating is made by exchanging the probe for a new one or by changing the posture of the probe. Then, the measured values are error-corrected by... | 03/02/2004 |
| 6695885 | Method and apparatus for coupling an implantable stimulator/sensor to a prosthetic device A system of implantable sensor/stimulation devices that is configured to communicate with a prosthetic device, e.g., an artificial limb, via a wireless communication link, preferably bidirectionally. By communicating between the implantable devices couple... | 02/24/2004 |
| 6677697 | Force scanning probe microscope A force scanning probe microscope (FSPM) and associated method of making force measurements on a sample includes a piezoelectric scanner having a surface that supports the sample so as to move the sample in three orthogonal directions. The FSPM also inclu... | 01/13/2004 |
| 6672144 | Dynamic activation for an atomic force microscope and method of use thereof A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a ... | 01/06/2004 |
| 6661004 | Image deconvolution techniques for probe scanning apparatus An apparatus and method are provided for processing the images obtained from an atomic force microscopy when profiling high aspect ratio features. A deconvolution technique for deconvolving the sample image includes the use of multiple images but does not... | 12/09/2003 |
| 6633174 | Stepper type test structures and methods for inspection of semiconductor integrated circuits Disclosed is a method of inspecting a sample. The method includes moving to a first field associated with a first group of test structures. The first group of test structures are partially within the first field. The method further includes scanning the f... | 10/14/2003 |
| 6624627 | Method for indexing magnetic disks by using a scanning probe A method for indexing magnetic disks by using a scanning probe is disclosed. A magnetic disk includes several essentially concentric magnetic tracks. The magnetic disk is attached to a rotating spindle. A number of data tracks is then written in a specifi... | 09/23/2003 |
| 6242736 | Scanning probe microscope A scanning probe microscope for scanning a probe needle in proximity to a surface of a sample in XY-axis directions while moving at least one of the probe and the sample in a Z-axis direction has a plurality of band-pass filters for passing a plurality of... | 06/05/2001 |
