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| Number | Title | Issue Date |
| 7917966 | Aligned nanostructures on a tip Techniques for fabricating carbon nanotubes aligned on a tip are provided. In one embodiment, a method for fabricating carbon nanotubes aligned on a tip includes forming nanostructures on the tip, and aligning the nanostructures on the tip using a fluid flowing on t... | 03/29/2011 |
| 7597717 | Rotatable multi-cantilever scanning probe microscopy head A scanning probe microscopy head may include a base portion, cantilevers coupled to the base portion, and at least one tip coupled to each of the cantilevers. At least two of the cantilevers and associated tips may be configured to perform a different scanning probe... | 10/06/2009 |
| 7442922 | Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology The invention relates to a combined method in which a high-resolution image of a sample surface is recorded by means of scanning force microscopy and the locally high-resolution, chemical nature (which is correlated with this) of the sample surface is measured by me... | 10/28/2008 |
| 7429732 | Scanning probe microscopy method and apparatus utilizing sample pitch The preferred embodiments are directed to a method and apparatus of operating a scanning probe microscope (SPM) to perform sample measurements using a survey scan that is less than five lines, and more preferably two lines, to accurately locate a field of features o... | 09/30/2008 |
| 7427754 | Telegraph signal microscopy device and method A microscope device includes a probe having a dielectric material with a first side and a second side. First and second electrodes are disposed on the first side of the dielectric material. A nanotube connects the first and second electrodes. A gate electrode is dis... | 09/23/2008 |
| 7422696 | Multicomponent nanorods Multicomponent nanorods having segments with differing electronic and/or chemical properties are disclosed. The nanorods can be tailored with high precision to create controlled gaps within the nanorods or to produce diodes or resistors, based upon the identities of... | 09/09/2008 |
| 7420106 | Scanning probe characterization of surfaces Characterizing dielectric surfaces by detecting electron tunneling. An apparatus includes an atomic force probe. A mechanical actuator is connected to the atomic force probe. A mechanical modulator is connected to the mechanical actuator. The mechanical modulator mo... | 09/02/2008 |
| 7402736 | Method of fabricating a probe having a field effect transistor channel structure A probe of a scanning probe microscope having a sharp tip and an increased electric characteristic by fabricating a planar type of field effect transistor and manufacturing a conductive carbon nanotube on the planar type field effect transistor. To achieve this, the... | 07/22/2008 |
| 7395727 | Strain detection for automated nano-manipulation A strain detector for in-situ lift-out, comprises a nano-manipulator probe shaft; a strain gauge mounted on the probe shaft; and a first cut-out on the probe shaft. The first cut-out has a rectangular cross-section. There is a second cut-out on the probe shaft; the ... | 07/08/2008 |
| 7361893 | In situ scanning tunneling microscope tip treatment device for spin polarization imaging A tip treatment device for use in an ultrahigh vacuum in situ scanning tunneling microscope (STM). The device provides spin polarization functionality to new or existing variable temperature STM systems. The tip treatment device readily converts a conventional STM t... | 04/22/2008 |
| 7261352 | Electrostatically driven carbon nanotube gripping device An apparatus is provided for gripping nano-scale objects, wherein the apparatus includes a probe including a base portion and a terminal portion. First and second nanotubes are secured to the base portion of the probe, wherein each of the first and second nanotubes ... | 08/28/2007 |
| 7241987 | Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe In a manufacture of a probe for a scattering type near-field microscope, there is provided a method of coating, with a high reproducibility, uniform metal particles efficiently inducing a surface enhanced Raman scattering. It has been adapted such that, in the probe... | 07/10/2007 |
| 6677567 | Scanning probe microscope with improved scan accuracy, scan speed, and optical vision A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (als... | 01/13/2004 |
| 6244103 | Interpolated height determination in an atomic force microscope A method and apparatus associated with an atomic force microscope (AFM) to more accurately measure the height of a microscopic feature in a substrate, particularly one having a sloping face. The probe tip is sequentially positioned at a number of vertical... | 06/12/2001 |
| 4850707 | Optical pulse particle size analyzer A system for determining the cluster size distribution of submicron-size particles in a solution by optical pulse particle size analysis is provided. The system comprises a laminar flow cell having a translucent chamber, means for passing a sheath liquid ... | 07/25/1989 |
