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| Number | Title | Issue Date |
| 8141168 | Scanning probe microscope and a method to measure relative-position between probes A main object of the present claimed invention is to provide a scanning probe microscope that can recognize a relative position between multiple probes accurately. The scanning probe microscope comprises multiple probes 21, 22, 23, 24 movable in the XYZ-direc... | 03/20/2012 |
| 7946156 | Glide test heads using heating elements to form a planar detection surface Glide test systems and associated methods are described. A glide test system includes a glide test head that is flown over the surface of a recording disk to detect asperities on the recording disk. The glide test head includes a detection pad on the trailing end of... | 05/24/2011 |
| 7841230 | Stabilizing device and method for handheld measurement device A stabilizing device for a handheld measurement device. An illustrative embodiment of the stabilizing device includes a device harness adapted to receive the handheld measurement device and having a handle opening and a nose opening and at least one harness attachme... | 11/30/2010 |
| 7823440 | Systems and methods for characterizing thickness and topography of microelectronic workpiece layers Metrology systems, tools, and methods that characterize one or more layers of a microelectronic workpiece are disclosed herein. In one embodiment, a system for characterizing thickness and topography of a workpiece layer includes a layer thickness instrument configu... | 11/02/2010 |
| 7770438 | Head slider, glide height checking apparatus, and glide height checking method The head slider has a plurality of heaters each heating a corresponding region of the ABS, and a sensor detecting collision of the ABS with a projection on a surface of the magnetic disk. Currents supplied to the respective heaters are controlled and produce heats i... | 08/10/2010 |
| 7748259 | Systems and methods for solid oxide fuel cell surface analysis Systems and methods for solid oxide fuel cell (SOFC) surface analysis. Exemplary embodiments include systems and methods for solid oxide fuel cell (SOFC) surface analysis, including a SOFC having a ceramic surface, a scanner adjacent the ceramic surface for collecti... | 07/06/2010 |
| 7603890 | Method of inspecting a metal alloy part for incipient melting A method of inspecting a repaired metal alloy part to analyze a microstructure of the metal part includes placing a replicating material on a surface of the metal part to create an inverted replica of the microstructure. The replicating material is then removed from... | 10/20/2009 |
| 7562563 | Apparatus for automatically inspecting road surface pavement condition Provided is an apparatus for automatically inspecting a road surface pavement condition, includes: a road surface photographing unit; a road surface rutting measuring unit; a flatness measuring unit; a data analysis and storage unit; a traveling noise measuring unit... | 07/21/2009 |
| 7559233 | Method for surface replication via thermoplastic media A method of inspecting a specimen under test may comprise the step of disposing melted thermoplastic media onto a surface under test of the specimen under test, maintaining a constant temperature of the specimen under test at or about room temperature wherein the te... | 07/14/2009 |
| 7526948 | Device and method for detecting foreign material on the surface of plasma processing apparatus A detection technique for detecting foreign material on the surface of a plasma processing apparatus, capable of accurately sucking/extracting and measuring foreign material contained in the measurement object surface is provided. The detection device comprises a ga... | 05/05/2009 |
| 7481098 | Method of determining depth of intergranular attack (IGA) for a metal part A method of determining a depth of intergranular attack (IGA) on a surface of a metal part includes applying a replicating material on a second surface of the part that is essentially perpendicular to and intersects with the surface of interest. The replicating mate... | 01/27/2009 |
| 7423264 | Atomic force microscope In one embodiment, an atomic force microscope comprises a frame, a beam coupled to the frame at a first end and a second end, a probe mounted to the beam, means for inducing relative motion between the beam and an underlying surface, and means for detecting a charac... | 09/09/2008 |
| 7392692 | Surface scan measuring device, surface scan measuring method, surface scan measuring program and recording medium A surface scan measuring device, a surface scan measuring method, a surface scan measuring program and a recording medium storing such a program which can appropriately adjust the scanning speed, the sampling pitch and other measurement parameters according to the s... | 07/01/2008 |
| 7367242 | Active sensor for micro force measurement An active micro-force sensor is provided for use on a micromanipulation device. The active micro-force sensor includes a cantilever structure having an actuator layer of piezoelectric material and a sensing layer of piezoelectric material bonded together. When an ex... | 05/06/2008 |
| 7363802 | Measurement device for electron microscope This invention relates to a measurement device for use in an electron microscope. The device comprises a sample holder, for holding a sample to be studied, and an indentation tip, being arranged in proximity of the sample holder, whereby an interaction between the s... | 04/29/2008 |
| 7361941 | Calibration standards and methods Parameters of a metrology tool may be determined by measuring a dimension of a feature on a calibration standard with the tool and using the measured dimension and a known traceable value of the dimension to determine a value for the parameter. If the dimension of t... | 04/22/2008 |
| 7363181 | Straightness correcting method for surface texture measuring instrument, and surface texture measuring instrument A surface texture measuring instrument is provided that is capable of performing a correction operation depending on the rotation angle position of a detector even when the detector is rotated for measurement. ... | 04/22/2008 |
| 7357017 | Wafer level capped sensor A sensor has a die (with a working portion), a cap coupled with the die to at least partially cover the working portion, and a conductive pathway extending through the cap to the working portion. The pathway provides an electrical interface to the working portion. | 04/15/2008 |
| 7359155 | Slider, head assembly and disk apparatus Disclosed is a slider which is substantially rectangular and has a disc facing surface with an air inflow end and an air outflow end in the longitudinal direction, comprising a first positive pressure-generating section disposed near the air inflow end; a pair of se... | 04/15/2008 |
| 7355709 | Methods and systems for optical and non-optical measurements of a substrate Methods and systems for measurements of a substrate are provided. One system includes a non-optical subsystem configured to perform first measurements on a substrate. The system also includes an optical subsystem coupled to the non-optical subsystem. The optical sub... | 04/08/2008 |
| 7353609 | Hole location method and apparatus The invention discloses differing embodiments of methods for checking the location or potential location of one or holes in structure relative to edges, fillets, and thickness changes. The area in the vicinity of the hole may be checked in order to determine whether... | 04/08/2008 |
| 7352271 | Probe and contour measuring instrument A probe body (200) includes a middle closing portion (250) formed upright on a connector front portion (261A) and a female thread (261D) into which a male screw (110) is screwed. A sensor module (300) includes a slidable-con... | 04/01/2008 |
| 7350404 | Scanning type probe microscope and probe moving control method therefor The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is... | 04/01/2008 |
| 7347084 | Roughness measuring instrument with testing standard The roughness measuring instrument (1) has a receiving device (2) for a feeder device (3), which serves to drag a roughness sensor (4) over a workpiece surface. The receiving device (2) carries a testing standard (24) with a... | 03/25/2008 |
| 7339383 | Nanogripper device having length measuring function and method for length measurement executed with nanogripper device having length measuring function A fixed electrode and a movable electrode used to drive each arm are disposed at a drive unit. As a voltage is applied between the fixed electrode and the movable the electrode, a coulomb force causes the movable the electrode to move, thereby driving the arms along... | 03/04/2008 |
| 7334485 | System, method and computer-readable medium for locating physical phenomena A method, system and computer product for detecting the location of a deformation of a structure includes baselining a defined energy transmitting characteristic for each of the plurality of laterally adjacent conductors attached to the structure. Each of the plural... | 02/26/2008 |
| 7325446 | Rough road detection system using normalization analysis A rough road detection system for an engine having a crankshaft includes a control module and a comparison module. The control module receives a crankshaft speed signal and determines a crankshaft rotation time and a crankshaft acceleration and jerk. The crankshaft ... | 02/05/2008 |
| 7325445 | Air test to determine surface roughness A surface roughness measuring apparatus (11) has a probe (27, 41) with a smooth surface region (31, 43) contoured to conform to a surface (33) the roughness of which is to be measured, and an aperture (25, 49) located generally cen... | 02/05/2008 |
| 7322229 | Device and method for measuring the profile of a surface The invention provides a surface profile measurement device for use on rigid or semi-rigid substrates, such as floors. The device includes (a) a beam; (b) at least one beam support mounted on the beam; (c) a sensor assembly slidably connected to said beam and adapte... | 01/29/2008 |
| 7317992 | Method and apparatus for inspecting dovetail edgebreak contour A method and tooling for inspecting a contour of an edge of a cutout formed in a disk, each cutout fixedly receiving a turbine blade. A first device receives the disk containing the cutouts. A second device has a sensor associated with the movement of an instrument,... | 01/08/2008 |
| 7316506 | Dual temperature indicator stick holder An apparatus to combine temperature indicator sticks used in the welding, metal fabrication, and heat treatment industries and capable of identifying at least two given temperatures is disclosed. The apparatus includes a first temperature indicator stick aligned alo... | 01/08/2008 |
| 7312607 | Eddy current part inspection system At least one measurement coil of an eddy current part inspection system is oriented relative to a track surface so that the longitudinal axis of the magnetic field generated by the at least one measurement coil is skewed relative to the track surface so as to be sub... | 12/25/2007 |
| 7308822 | Capillary devices for determination of surface characteristics and contact angles and methods for using same Devices are presented which allow determination of unknown surface properties through the creation of a channel capillary, comprised in part of the subject surface or surfaces, and measurement of the capillary pressure created by a test fluid within the resultant ch... | 12/18/2007 |
| 7304021 | Color changing paint and varnish remover A color change paint and varnish removal formulation is provided. The formulation comprises: at least one penetrant, at least one carrier and at least one colorant whereby the formulation is applied to the target area and as the surface of the formulation dries, the... | 12/04/2007 |
| 7299701 | Compressive fatigue and energy test apparatus and method for testing clutch plate friction materials The present invention presents a means for simultaneously testing the compressive strength and measuring the thermal energy dissipated by a given friction material during slip. The testing apparatus includes a rotatable flywheel that rotates a transmission reaction ... | 11/27/2007 |
| 7293451 | Sharpness tester A sharpness tester for testing the sharpness of a blade. The tester has a blade holder 19 and a mounting arrangement 21, 22 for mounting a cuttable material 20. The blade holder 19 is mounted by a carriage 18 which is moveable on a... | 11/13/2007 |
| 7278299 | Method of processing vertical cross-section using atomic force microscope An indentation is formed by thrusting a probe of a scanning probe microscope for processing, which has a vertical surface or a vertical ridge and is harder than sample material, into sample for measuring the indentation. A high-fidelity AFM observation is performed ... | 10/09/2007 |
| 7276380 | Transparent liquid inspection apparatus, transparent liquid inspection method, and transparent liquid application method The present invention provides a transparent liquid inspection apparatus capable of identifying a boundary between a transparent liquid applied on a base material which provides a multi-piece product and the base material, and automatically inspecting an applied con... | 10/02/2007 |
| 7275423 | Automatic speed calculation for scratch machine An improved surface testing apparatus, such as a scratch test apparatus, allows accurate determination of the test speed, for example using one or more magnetic sensors. An example scratch test apparatus comprises an arm assembly, and an attached blade moving over t... | 10/02/2007 |
| 7275424 | Wafer level capped sensor A sensor has a die (with a working portion), a cap coupled with the die to at least partially cover the working portion, and a conductive pathway extending through the cap to the working portion. The pathway provides an electrical interface to the working portion. | 10/02/2007 |
