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Class 702/68 - Having specified user interface (e.g., marker, menu)


Subclass of Class 702 - Data processing: measuring, calibrating, or testing
Definition: Subject matter comprising operator input control means (e.g.,
No. of patents: 139
Last issue date: 02/12/2013


1        
NumberTitleIssue Date
8374811High waveform throughput with a large acquisition memory
A waveform display apparatus and method displays one or more waveforms of a signal under test at high throughput while acquiring digital data of the signal under test in a large acquisition memory. A user sets a time interval of user's interest when viewing a signal...
02/12/2013
8255177System and method for calibrating oscillograph channels
A system and method for calibrating oscillograph channels assigns the same value to a drawing parameter of each channel. Each channel receives a signal sent by a signal generator. The oscillograph calculates a voltage difference between a standard signal voltage of ...
08/28/2012
8195413Measuring device for a preview display of several time-variable electrical signals
A measuring device for displaying several time-variable electrical signals. The measuring device includes a front panel, which provides various operating elements, with a screen, which provides several display fields. The first display field provides at least one wi...
06/05/2012
8055464Method of processing waveform data from one or more channels using a test and measurement instrument
The method of processing waveform data from one or more channels using a test and measurement instrument, such as an oscilloscope, is described in which waveform data is collected from a DUT; defining a context is defined by instructing the instrument to obtain the ...
11/08/2011
7860673Distance measuring device
Parallax is the apparent “shift” or “movement” of an object caused by a change in the position of the observer and is the phenomenon upon which the claimed invention operates. The invention is a mechanical device, comprising a viewing slide which has been ma...
12/28/2010
7516028User-placed marks in a long record length waveform
A test and measurement instrument includes a memory configured to store a digitized signal, a display configured to display the digitized signal, a mark interface configured to generate a mark creation signal, a processor coupled to the memory, the display, and the ...
04/07/2009
7451049Automatic delays for alignment of signals
In one embodiment, a system comprises a delay determining unit that may be operable to determine a relative delay between the first signal provided by the first source and the second signal provided by the second source, based upon a travel path of the first signal ...
11/11/2008
7412355Analog display of signal swing and logic analyzer thresholds
A Logic Analyzer has an intuitive and informative analog presentation of signal activity and threshold settings formed by gathering a collection of factors pertaining to the measurement to be performed, such as information about which channels are members of labeled...
08/12/2008
7405723Apparatus for testing display device and method for testing the same
An apparatus for testing a display device includes a display device to display test patterns, a graphic process unit to supply analog mode signals and digital mode signals to the display device, and a control unit to allow test patterns of an analog testing mode and...
07/29/2008
7401007Method, computer program and apparatus for extracting large size signal data samples with an automatically adjusted decimation ratio
A method for rapidly extracting data file samples with an a signal monitor and an automatically adjusted decimation ratio is provided to solve the long-standing problems caused by large data files and small buffers by reducing a large data segment to a smaller, more...
07/15/2008
7386041Method for normalization of an eye diagram and selection of sampling parameters for a receiver
Measurements for an eye diagram of a signal of interest are placed in a data structure that is examined to locate an eye opening of interest. The eye opening of interest is normalized into figure of merit units related to the operational voltage and timing requireme...
06/10/2008
7386406Forced-alignment measurement tools for composite eye diagrams
An original composite eye diagram is reformulated by deliberately re-aligning its component eye diagrams according to some appropriate standard. This ‘forced-alignment’ shifts the components in one or both of the time and voltage axes. Notice is taken of the shi...
06/10/2008
7380176Method for testing displays
This invention relates to a method for testing displays. A user interface is used to provide the user with options for different display modes, different power management modes and mode delay times to be selected. Tests of the display frequency and the power managem...
05/27/2008
7373263Analog-type measurements for a logic analyzer
A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes...
05/13/2008
7362836Method for selecting optimum sampling parameters for a plurality of data receivers having at least one sampling parameter in common
Eye diagrams are made for signals on each channel in a group thereof. Outlying signals that do not exhibit overlap for a sampling parameter that is to be common for all channels may be ignored and a warning given. Selected, normalized eye openings are used to discov...
04/22/2008
7359810Characterizing newly acquired waveforms for identification of waveform anomalies
A method of characterizing a newly acquired waveform with respect to previously acquired waveforms during monitoring of a generally repetitive signal, where the previously acquired waveforms have been rasterized into a two-dimensional array of memory locations, read...
04/15/2008
7359820In-cycle system test adaptation
Disclosed are a method, information processing system and computer readable medium for performing a system test on a program. The method comprises creating a test plan associated with a system test. The system test is for testing a program within an environment. At ...
04/15/2008
7353137Shoe-based weight measuring system
A shoe-based weight measuring system, comprising: a shoe; one or more weight sensitive detectors constructed and arranged with the shoe to sense weight of a person wearing the shoe and walking or standing; a processor for processing signals from the detectors to det...
04/01/2008
7352167Digital trigger
An improved digital trigger circuit has a plurality of data samples extracted from an input electrical signal for each sample clock cycle. The plurality of data samples are compared in parallel with a high threshold level and a low threshold level which provides hys...
04/01/2008
7346464Gait waveform feature extracting method and individual identification system
A gait waveform feature extracting method and an individual identification system extract features of the gait waveform. A one-step waveform corresponding to one step of a walking movement is specified using, as an index, a peak amplitude corresponding to a state wh...
03/18/2008
7301484Data decoder
A method, apparatus and computer program for decoding a data stream. The method comprises the steps of acquiring an analog data signal, determining an initial polarity of the analog data signal, determining a threshold transition level, determining a plurality of tr...
11/27/2007
7302017System and method for adaptive matched filter signal parameter measurement
A robust and flexible system for signal parameter measurements in the field of signal processing dynamically uses signal parameters from previous signal detections and parametric priorities to adaptively control and process the signal in an efficient and reliable ma...
11/27/2007
7292656Signal pulse detection scheme for use in real-time spectrum analysis
A spectrum analysis engine (SAGE) that comprises a spectrum analyzer component, a signal detector component, a universal signal synchronizer component and a snapshot buffer component. The spectrum analyzer component generates data representing a real-time spectrogra...
11/06/2007
7280934Method for test of electronic component
A method for testing an electronic component. The method includes connecting the electronic component to a test machine; specifying search range limits, low-to-high transition edge and high-to-low transition edge found criterion, and number of outcomes in a trial in...
10/09/2007
7268783Image alias rejection using shaped statistical filtering
Image alias rejection when converting a high resolution rasterized waveform to a lower resolution rasterized waveform for display uses a statistical filter. The statistical filter provides a shaped probability density function either by combining the outputs of mult...
09/11/2007
7257641Multipoint processing unit
A system to provide a multipoint processing terminal and a multicast bridging terminal to provide mixing, switching, and other processing of media streams under the control of H.323 components. Application Programming Interfaces defined for the multipoint processing...
08/14/2007
7254500Monitoring and representing complex signals
A method of displaying signals containing a spatial and a temporal aspect, where multiple signals are received by multiple sensors. The received signals are decomposed into separate signal components within one or more distinct frequency bands. Signal components are...
08/07/2007
7254191System and method for real-time spectrum analysis in a radio device
A real-time spectrum analysis engine (SAGE) that comprises a spectrum analyzer component, a signal detector component, a universal signal synchronizer component and a snapshot buffer component. The spectrum analyzer component generates data representing a real-time ...
08/07/2007
7254499Method and apparatus for displaying a current configuration of test instruments to a user
In one embodiment, a computer-implemented method 1) determines a current configuration of instruments which are connected in a user's test system; 2) retrieves an icon associated with each instrument (the icons being sized proportionally to the instruments they repr...
08/07/2007
7243034Sensor device
A sensor device according to the present invention has a detection mode for detecting an object W, a first setting mode for changing the output duration of an output signal, and a second setting mode for changing a light-emission period of light emitted to the objec...
07/10/2007
7233349Video timing display indicator
A timing alignment or offset display shows the relationship between a reference signal and a test signal, in particular two analog or digital video signals. Timing extraction circuits derive a lower frequency signal synchronized to horizontal lines and a higher freq...
06/19/2007
7228257Architecture for general purpose programmable semiconductor processing system and methods therefor
A method of optimizing a set of steps in a semi-conductor processing system comprising a software control program, wherein the semi-conductor processing system includes a first function, a second function, and a third function, and further includes a memory for stor...
06/05/2007
7224363Computer-readable recording medium with waveform editing program stored and waveform editing system
A waveform editing program displays waveforms of different types generated from the same data on the same screen, so that the characteristics of the waveforms can be easy to know, and with improved operability in the waveform editing, desired waveforms can be easily...
05/29/2007
7224752System and method for real-time spectrum analysis in a communication device
A spectrum analysis engine (SAGE) that comprises a spectrum analyzer component, a signal detector component, a universal signal synchronizer component and a snapshot buffer component. The spectrum analyzer component generates data representing a real-time spectrogra...
05/29/2007
7218093Reduced chip testing scheme at wafer level
The present invention relates to production testing of semiconductor devices, more specifically to production testing of such devices at wafer level. A method according to the present invention comprises the steps of generating (20) quality test-data a...
05/15/2007
7171587Automatic test system with easily modified software
An automatic test system, such as might be used to test semiconductor devices as part of their manufacture. The test system uses instruments to generate and measure test signals. The automatic test system has a hardware and software architecture that allows instrume...
01/30/2007
7159187In-context creation and editing of masks and waveforms
A method of creation/editing masks/waveforms for an instrument invokes a mask editor from an application running on the instrument. A context or signal waveform displayed in the application is transferred as a reference to a mask editor graphic display together with...
01/02/2007
7133738System and method for programming an automation system, based on pulse timing diagrams
The invention relates to a system and method for programming an automation system. To avoid conversion errors and to guarantee data during the programming of an automated system, a graphic description by means of pulse timing diagrams is used to generate a program o...
11/07/2006
7123845Receiving apparatus with waveform degradation compensating function
A receiving apparatus comprises a first waveform degradation compensating unit, a second waveform degradation compensating unit, a received waveform measuring unit for measuring waveform data on a received signal, a control unit for controlling compensation characte...
10/17/2006
7120545Method and apparatus for displaying a current configuration of test instruments to a user
A current configuration of instruments which are connected in a user's test system is determined. The current configuration of instruments is then displayed within a graphical user interface (GUI) by 1) displaying icons representing the instruments, and 2) graphical...
10/10/2006
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