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Class 702/134 - By radiant energy


Subclass of Class 702 - Data processing: measuring, calibrating, or testing
Definition: Subject matter comprising means for measuring emitted or
No. of patents: 117
Last issue date: 01/17/2012


1      
NumberTitleIssue Date
RE43117Method of and apparatus for studying fast dynamical mechanical response of soft materials
The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much faster way. The apparatus can be used as a stand-alone deice or an add-...
01/17/2012
8050884Method and apparatus for determining the emissivity, area and temperature of an object
Methods and apparatus are provided to determine the emissivity, temperature and area of an object. The methods and apparatus are designed such that the emissivity and area of the object may be separately determined as functions dependent upon the temperature of the ...
11/01/2011
7899644Threat launch detection system and method
A threat launch detection system includes at least one temporal threat detector, each temporal threat detector including a single sensing element operable to sense radiation from various types of short-burn threats that occur within a field of view of the detector. ...
03/01/2011
7761255Method of and apparatus for studying fast dynamical mechanical response of soft materials
The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much faster way. The apparatus can be used as a stand-alone device or an add...
07/20/2010
7561983Technique for improving ion implantation based on ion beam angle-related information
A technique for improving ion implantation based on ion beam angle-related information is disclosed. In one particular exemplary embodiment, the technique may be realized as a method for improving ion implantation. The method may comprise obtaining angle-related inf...
07/14/2009
7478007Method for compensation of degradation in tunable lasers
The invention provides a method to compensate for degradation in a tunable laser and ensure its performance by tracking the degradation and adjusting the control information accordingly. This is accomplished by performing some measurements of the output of the tunab...
01/13/2009
7451054Method of using a wafer-temperature-dependent profile library
A method for facilitating an ODP measurement of a semiconductor wafer. The method includes obtaining real time wafer characteristic data for a measurement site on said wafer and detecting a measured diffraction signal from a structure within the measurement site of ...
11/11/2008
7409313Method and apparatus for nondestructive evaluation of insulative coating
An apparatus is provided for determining thickness and thermal conductivity for an insulative coating disposed on a substrate in an object. The apparatus includes a source for rapidly applying a multiple optical pulses on a surface of the object, where the surface c...
08/05/2008
7368734Ion beam measuring method and ion implanting apparatus
A beam current density distribution in y direction of an ion beam 4 at a position of a forestage beam restricting shutter 32 is measured by measuring a change in a beam current of the ion beam 4 incident on a forestage multipoint Faraday 24
05/06/2008
7369060Distributed intelligence ballast system and extended lighting control protocol
A ballast for use in a multi-ballast lighting system wherein the ballasts are coupled together by a digital communication network. The ballast comprises a power circuit portion for providing an electrical current to power a lamp. The ballast further includes a senso...
05/06/2008
7364355Method and apparatus for obtaining a temperature measurement using an InGaAs detector
A method of linearizing the output a infrared camera having an InGaAs includes determining the an equivalent black body temperature of an object by utilizing a plurality of calibration constants determined by collecting data from a number of temperatures of the obje...
04/29/2008
7353722Contactless measurement of the surface temperature of naturally or artificially weathered samples
A holding frame (2) is mounted in a weathering chamber (1) of a weathering tester so that it can be rotated around a xenon radiation source (3), which is located on the cylinder or rotation axis, and an infrared filter (5) placed around i...
04/08/2008
7324915Data transmission to a position sensor
A method for transmitting control instructions to a sensor in a position tracking system includes generating a drive signal for driving a field generator. A control signal including the control instructions is superimposed on the drive signal. The field generator is...
01/29/2008
7315018Machine tool analysis device and method
The invention relates to a device and method for analysis of a tool (50) e.g. used on a machine tool. A tool detector (5) includes a light emitter (12) and a light receiver (34). Tool (50) when progressed into a beam (20) of...
01/01/2008
7300203Non-contacting sensor multichip module with integral heat-sinks
A sensor assembly having a housing including a first portion and a second portion. One of the portions of the housing includes a plurality of walls. The walls at least partially define a chamber. The assembly also includes a hinge connected to the first portion and ...
11/27/2007
7285951Method and device for magnetic measurement of the position and orientation of a mobile object relative to a fixed structure
A method and device for magnetic measurement of the position and orientation of a mobile object relative to a fixed structure. The device comprises, Integral with the structure, a magnetic fields emitter assembly having three orthogonal emission coils defining a ref...
10/23/2007
7239122Multi-channel radiometer imaging system
A radiometer system includes a housing and an RF board contained within the housing. Balanced radiometer channels receive an unknown signal and known reference. Each balanced radiometer channel includes at least one quadrature hybrid and amplifier circuit to provide...
07/03/2007
7239974Explosive device detection based on differential emissivity
Techniques for monitoring thermal emissivity levels of human traffic within a plurality of sections of a zone of interest are presented. The thermal emissivity levels are monitored using an infrared detector with sensitivity range of less than fifty milliKelvin, and...
07/03/2007
7234862Apparatus for measuring temperatures of a wafer using specular reflection spectroscopy
An apparatus (295) using specular reflection spectroscopy to measure a temperature of a substrate (135). By reflecting light (100) from a substrate, the temperature of the substrate can be determined using the band-edge characteristics of the su...
06/26/2007
7221139Multi-channel radiometer imaging system
A radiometer system includes a housing and an RF board contained within the housing. Balanced radiometer channels receive an unknown signal and known reference. Each balanced radiometer channel includes at least one quadrature hybrid and amplifier circuit to provide...
05/22/2007
7218762Method for user training for a scanning microscope, scanning microscope, and software program for user training for a scanning microscope
A method for user training for a scanning microscope makes possible rapid setting of a scanning microscope with little specimen impact. It is possible to acquire an entire spectrum of a specimen. This specimen can be retrieved from the memory of the computer system ...
05/15/2007
7212933Absolutely and uniformly convergent iterative approach to inverse scattering with an infinite radius of convergence
A method and system for solving the inverse acoustic scattering problem using an iterative approach with consideration of half-off-shell transition matrix elements (near-field) information, where the Volterra inverse series correctly predicts the first two moments o...
05/01/2007
7202475Rapid defect composition mapping using multiple X-ray emission perspective detection scheme
Disclosed are methods and apparatus for characterizing defects by using X-ray emission analysis techniques. The X-rays are emitted in response to an impinging beam, such as an electron beam, directed towards the sample surface where a defect resides. It may also be ...
04/10/2007
7199570Multi-channel radiometer imaging system
A radiometer includes a housing and an RF board carried by the housing. A hybrid and amplifier circuit receives an unknown signal and a known reference signal. A switch receives signals as inputs from the hybrid and amplifier circuit and switches between the inputs....
04/03/2007
7196509Thermopile temperature sensing with color contouring
A color contour of an object is displayed from information that is obtained using an array of thermopile sensors. A color contour of an object is generated by pre-establishing a relationship between IR radiation power and color, measuring the power of incident IR ra...
03/27/2007
7155296Configuration method for an installation comprising solar protection and/or lighting devices
The configuration method for an installation comprising solar protection and/or lighting devices controlled by a central unit comprising a memory, microprocessor and a user interface, is characterized in that method comprises an iteration, over all of the solar prot...
12/26/2006
7154241Wiper control method and wiper control device
There are provided a wiper control method and a wiper control device in which unnecessary wiping operation is not performed. When a fixed amount of water passing through a detection area 4, the water being carried by the wiping operation of a wiper 5
12/26/2006
7155363Thermal imaging for semiconductor process monitoring
The method measures the temperature, emissivity, and other properties of relatively smooth surfaces radiating thermal energy, and is especially adapted for monitoring semiconductor fabrication processes. Temperature is determined by relating measured radiance to the...
12/26/2006
7107306Method and apparatus for adaptive real-time signal conditioning, processing, analysis, quantification, comparision, and control
Various components of the present invention are collectively designated as Adaptive Real-Time Embodiments for Multivariate Investigation of Signals (ARTEMIS). It is a method, processes, and apparatus for measurement and analysis of variables of different type and or...
09/12/2006
7101725Solution to thermal budget
A method of fabricating on optical detector, the method including providing a substrate that includes an optical waveguide formed therein and having a surface for fabricating microelectronic circuitry thereon; fabricating microelectronic circuitry on the substrate, ...
09/05/2006
7096148Magnetic tracking system
The present invention provides an electromagnetic tracking system that includes a field generator and a field sensor arranged to generate and detect, respectively, an electromagnetic field. Both the transmitter and receiver coils are connected to signal conditioning...
08/22/2006
7088086Multi-channel radiometer imaging system
A radiometer includes a housing and an RF board carried by the housing. A hybrid and amplifier circuit receives an unknown signal and a known reference signal. A switch receives signals as inputs from the hybrid and amplifier circuit and switches between the inputs....
08/08/2006
7069169Method and apparatus for measuring heat flux distribution on object surface using temperature-sensitive paint
An object of the present invention is to provide a method that allows the heat flux distribution on an object surface to be measured even when the heat flux is an unsteady or short-duration phenomenon, and that does not depend on the material of the object; and to p...
06/27/2006
7034516Multi-channel radiometer imaging system
A radiometer system includes a housing and an RF board contained within the housing. Balanced radiometer channels receive an unknown signal and known reference. Each balanced radiometer channel includes at least one quadrature hybrid and amplifier circuit to provide...
04/25/2006
7010455Method and relevant device for revealing objects
The invention concerns a method and device, for remote sensing of objects that emit variable thermal emissions having phases, which may include: A. acquisition of a map of the radiation coming from the surface of the portion of space within or behind the object to b...
03/07/2006
6996492Spectrum simulation for semiconductor feature inspection
Techniques for determining certain parameters of semiconductor specimens using X-ray spectroscopy are described. The invention can be used to determine parameters such as composition, dimensions, and density of semiconductor specimens. Specifically, an X-ray spectru...
02/07/2006
6976782Methods and apparatus for in situ substrate temperature monitoring
In a plasma processing system, a method of determining the temperature of a substrate is disclosed. The method includes positioning the substrate on a substrate support structure, wherein the substrate support structure includes a chuck. The method further includes ...
12/20/2005
6978187Method and apparatus for scheduling production lots based on lot and tool health metrics
A method for scheduling production flow includes processing a plurality of manufactured items in a process flow. Item health metrics are determined for at least a subset of the plurality of manufactured items. Tool health metrics are determined for a plurality of to...
12/20/2005
6971793Test handler temperature monitoring system
The invention provides a temperature monitoring system for a semiconductor test handler. A preparation stage brings a test device to a predetermined temperature for testing at a test platform at said predetermined temperature. At least one radiation sensor, such as ...
12/06/2005
6963816Systems and methods for integrated emissivity and temperature measurement of a surface
A multi-channel spectrometer and a light source are used to measure both the emitted and the reflected light from a surface which is at an elevated temperature relative to its environment. In a first method, the temperature of the surface and emissivity in each wave...
11/08/2005
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