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The Quarterly Review ; March edition, 1825
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| Number | Title | Issue Date |
| 8078423 | Data generating method, connection checking system, and computer product A computer terminal retrieves pin data related to respective pins of a plurality of Field Programmable Gate Array that are mounted on a board. The computer terminal retrieves setting data related to a connection check. Upon retrieving the pin data and the setting da... | 12/13/2011 |
| 7987065 | Automatic quality testing of multimedia rendering by software drivers A method and system for automatically verifying the quality of multimedia rendering are disclosed. Specifically, one embodiment of the present invention sets forth a method, which includes the steps of directing a command intended for a first driver to both the firs... | 07/26/2011 |
| 7983871 | Method and apparatus for employing previous test insertion results for testing a device A method includes determining at least a first characteristic of a device during a first test insertion and storing the first characteristic. The device is identified during a second test insertion. The first characteristic is retrieved responsive to the identificat... | 07/19/2011 |
| 7945418 | Stream based stimulus definition and delivery via interworking An approach is provided to manage test transactors that interface with components of a hardware design. A first set of transactors is launched with the first set of transactors sending stimuli to various components that correspond to the first set of transactors. A ... | 05/17/2011 |
| 7933735 | Semiconductor integrated circuit A semiconductor integrated circuit having a test circuit for collecting test data at any time based on interaction with an external source is provided. A communication circuit receives a data frame that is transferred to a data buffer. Data portions are transferred ... | 04/26/2011 |
| 7925464 | Multifunctional distributed analysis tool and method for using same A multi-function, intelligent, distributed analysis test tool (MFDAT) suitable for performing maintenance on complex, sophisticated electronic systems. MFDAT replaces ordinary test instruments such as spectrum analyzers, oscilloscopes, power meters, frequency counte... | 04/12/2011 |
| 7917326 | Storage medium for estimating and improving test case generation A technique for estimating and improving the test coverage for large machines, while accumulating minimum information of past test cases (i.e., minimum feedback) is provided. The technique is scalable in the sense that the number of machine instructions needed to me... | 03/29/2011 |
| 7904270 | System for estimating and improving test case generation A technique for estimating and improving the test coverage for large machines, while accumulating minimum information of past test cases (i.e., minimum feedback) is provided. The technique is scalable in the sense that the number of machine instructions needed to me... | 03/08/2011 |
| 7899640 | Integrated circuit characterisation system and method There is presented a system and method for characterizing an integrated circuit (IC) for comparison with a pre-defined system-level characteristic related to an aspect of IC operation, wherein a test procedure on the IC that invokes this aspect is executed, while at... | 03/01/2011 |
| 7809520 | Test equipment, method for loading test plan and program product Test equipment includes a memory to which a test plan that includes a plurality of sub-test plans is loaded and a system controller that, when the test equipment actually examines a device-under-test (DUT), loads the test plan to the memory by the unit of the sub-te... | 10/05/2010 |
| 7702480 | Manufacturing test and programming system A manufacturing test and programming system (100) is presented including providing a PCB tester (108), providing an in-system programmer (102) electrically attached to the PCB tester (108), mounting a device under test (114) having... | 04/20/2010 |
| 7636642 | Direct jitter analysis of binary sampled data A technique for determining the timing location and/or jitter of a signal edge includes computing differences between pairs of adjacent samples of the signal edge to yield difference values. First and second statistical moments are computed directly from the differe... | 12/22/2009 |
| 7603248 | Testing circuit and testing method for semiconductor device and semiconductor chip A testing circuit for a semiconductor device having a test mode in which the information about built-in memory cannot be read after conducting a test on a semiconductor device, and cutting a pad formed in a scribe area is provided. The scribe PAD and the scribe ROM ... | 10/13/2009 |
| 7590504 | Graphical user interface for creation of IBIST tests A graphical user interface (GUI) that configures a test for a circuit. More particularly, the circuit includes a built-in-self-test (BIST) compatible device and has a test configuration. The device has an associated value. Moreover, the circuit, the device, and the ... | 09/15/2009 |
| 7577540 | Re-configurable embedded core test protocol for system-on-chips (SOC) and circuit boards A test system for a circuit board , wherein the circuit board has a plurality of cores such that at least one of the plurality of cores is adapted to use a test protocol independent of a communication fabric used in the circuit board. A system-on-chip (SOC) with an ... | 08/18/2009 |
| 7536268 | Collecting information to identify defective locations of a display monitor Indications of user inputs with respect to a diagnostic image displayed on a display monitor are received to identify defective locations of the display monitor. Information is collected based on the received user inputs that identify defective locations of the disp... | 05/19/2009 |
| 7474979 | Integrated circuit device test system and method A method for integrated device testing can include the steps of: receiving wafer test data that identifies wafer test failures with the dice tested while part of a shared common substrate; receiving package test data that identifies test failures for at least a subs... | 01/06/2009 |
| 7444258 | Automated simulation testbench generation for serializer/deserializer datapath systems Embodiments herein present a method for automated simulation testbench generation for serializer/deserializer datapath systems. The method provides a database of transactors for generating and checking data within the datapath system, wherein the transactors are ada... | 10/28/2008 |
| 7444257 | Generation of a testbench for a representation of a device A system and method for generating a testbench for a representation of a device to be incorporated in a data processing apparatus is provided. The representation of the device is configurable based on configuration data specifying predetermined attributes of one or ... | 10/28/2008 |
| 7444256 | System and method for testing hardware or software modules via a computer network The present invention is a system for facilitating the access by an end user to a component to be tested via a global computer network comprising an interface for enabling an end user to access a central computer network in communication with a component to be teste... | 10/28/2008 |
| 7440864 | Controller system for pool and/or spa A method of programming a microcomputer based controller system for a bathing installation. The microcomputer is configured to receive input command and sensor information from a plurality of input devices including a control panel and a bathing installation sensor,... | 10/21/2008 |
| 7430486 | Datalog support in a modular test system A method for communicating test information from a source to a destination is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, the at least one s... | 09/30/2008 |
| 7430697 | Method of testing circuit blocks of a programmable logic device A method of testing circuits in a programmable logic device is described. According to one embodiment of the invention, a method comprises steps of configuring a configurable logic block of the programmable logic device with a test signal source and a logic circuit;... | 09/30/2008 |
| 7415377 | Relay testing system and method A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relay... | 08/19/2008 |
| 7404071 | Memory modules having accurate operating current values stored thereon and methods for fabricating and implementing such devices Memory modules having accurate operating current values stored thereon and methods for fabricating and implementing such devices to improve system performance. Memory modules comprising a number of volatile memory devices may be fabricated. Operating current values ... | 07/22/2008 |
| 7395170 | Methods and apparatus for data analysis A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components. ... | 07/01/2008 |
| 7386411 | Automatic hi-pot test apparatus and method An exemplary automatic hi-pot test apparatus (20) includes a high voltage supply (21), a transmission device configured for transmitting an electronic device (26) to be tested, a connecting device electrically connected to the high voltage suppl... | 06/10/2008 |
| 7373360 | Methods and apparatus that use contextual test number factors to assign test numbers In a method for assigning test numbers, current testflow context information is maintained during the execution of a testflow. If one or more test number factors have been specified for one or more levels of the current testflow context, the test number factors are ... | 05/13/2008 |
| 7373263 | Analog-type measurements for a logic analyzer A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes... | 05/13/2008 |
| 7369958 | System and method for setting motherboard testing procedures The present invention discloses system and method for setting motherboard testing procedures. The method includes the steps of: selecting the required testing mode numeral corresponding to one of a plurality of BIOS programs, which required a next testing station vi... | 05/06/2008 |
| 7370087 | Method and apparatus for providing access to a peripheral device management interface Embodiments of the present invention provide mechanisms and techniques for providing access to a peripheral management interface, such as a Web-based graphical user interface (GUI) associated with a peripheral device. In order to access a GUI associated with a perip... | 05/06/2008 |
| 7365554 | Integrated circuit for determining a voltage An integrated circuit includes a current generator circuit with a first input terminal for applying a reference voltage and a second input terminal for applying an input voltage, which is generated internally from an externally applied supply voltage by a voltage ge... | 04/29/2008 |
| 7366991 | Method and system for providing an extensible user interface Displaying a custom user interface in response to a determination that the application program is configured to display the custom user interface. To create the custom user interface, the end user can customize one or more default user interface files to create cust... | 04/29/2008 |
| 7363188 | Apparatus and method for operating automated test equipment (ATE) An apparatus and method of operating automated test equipment (ATE) in a networked environment of multiple external test controllers. The system resources responsible for coordinating the shared uses of the ATE by the multiple external test controllers are centraliz... | 04/22/2008 |
| 7360184 | Method and apparatus for scenario search based random generation of functional test suites A method of describing a set of tests capable of being performed on a device under test (DUT) is disclosed. The method includes identifying a scenario space of the DUT. ... | 04/15/2008 |
| 7359820 | In-cycle system test adaptation Disclosed are a method, information processing system and computer readable medium for performing a system test on a program. The method comprises creating a test plan associated with a system test. The system test is for testing a program within an environment. At ... | 04/15/2008 |
| 7359822 | Testing device A testing device that tests an electronic device includes a test pattern outputting unit operable to output a test pattern to the electronic device, a deciding unit operable to decide whether an output signal from the electronic device satisfies a predetermined cond... | 04/15/2008 |
| 7359819 | Evaluation of device driver output The testing of driver output is automated. Embodiments of the invention filter out data that is known to change between two similar outputs of a driver. By filtering this dynamic data out, the remaining data can be compared to known-good data to identify any variati... | 04/15/2008 |
| 7359490 | Systems and methods for facilitating placement of telecommunications test calls A method for placing a test call in a telecommunications network. The method includes retrieving an indication of a translation change for a telecommunications switch from storage and placing a test call to test whether the translation change was successful. ... | 04/15/2008 |
| 7356436 | Method, system, and storage medium for estimating and improving test case generation A technique for estimating and improving the test coverage for large machines, while accumulating minimum information of past test cases (i.e., minimum feedback) is provided. The technique is scalable in the sense that the number of machine instructions needed to me... | 04/08/2008 |
