Did You Know...
...that the Slinky toy was the result of a failed attempt by engineer Richard James to produce an antivibration device for ship instruments? His goal was to develop a spring that would instantaneously counterbalance the wave motion that rocks a ship at sea. Instead, he developed the Slinky.
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| Number | Title | Issue Date |
| 8112241 | Methods and systems for generating an inspection process for a wafer Methods and systems for generating an inspection process for a wafer are provided. One computer-implemented method includes separately determining a value of a local attribute for different locations within a design for a wafer based on a defect that can cause at le... | 02/07/2012 |
| 8112240 | Method and apparatus for providing leak detection in data monitoring and management systems Method and apparatus for providing a leak detection circuit for a data monitoring and management system using the guard trace of a glucose sensor by applying a leak detection test signal to determine whether a leakage current is present is provided. The leak detecti... | 02/07/2012 |
| 8103474 | Debug system A debug system includes equipment to be debugged (onboard information equipment 10) which is controlled by a microcomputer 11; and a command return jig 20 which is connected to the equipment to be debugged via a communication interface unit 1... | 01/24/2012 |
| 8099254 | Elastomeric conductor and shield fault detection The systems and methods described herein provide for the early detection of wire/cable faults. For example, a system may detect electrical/electronic faults with power lines, data lines, communication lines, coaxial cables, and the like (generally referred to herein... | 01/17/2012 |
| 8095331 | Transaction based verification of a system on chip on system level by translating transactions into machine code In a transaction-based verification environment for complex semiconductor devices, enhanced verification efficiency may be achieved by providing a transaction to machine code translator and an appropriate interface that enables access of the translated machine code ... | 01/10/2012 |
| 8078422 | System and method for testing frequency range A system is used to test whether a device works normally in a preset frequency range. The system presets a frequency range, and controls a frequency generator to send a test frequency signal to the device according to each of a predetermined number of frequencies of... | 12/13/2011 |
| 8073648 | Measuring threshold voltage distribution in memory using an aggregate characteristic A threshold voltage distribution of a set of storage elements in a memory device is measured by sweeping a control gate voltage while measuring a characteristic of the set of storage elements as a whole. The characteristic indicates how many of the storage elements ... | 12/06/2011 |
| 8065106 | Moving light table A moving light test system allows connecting moving lights to an interface board and conveying the lights and orienting and testing the lights while they are attached to the board. The lights can be mechanically and electrically connected to the board, and once conn... | 11/22/2011 |
| 8027800 | Apparatus and method for testing a panel of interferometric modulators In some embodiments, each interferometric modulator has a stiction threshold voltage. If a voltage above the stiction threshold voltage is applied to the interferometric modulator, the interferometric modulator enters a stiction state permanently, i.e., becomes “s... | 09/27/2011 |
| 8024148 | End-of-life disabling of a diagnostic test system Systems and methods for end-of-life disabling of a diagnostic test system are described. In one aspect, a diagnostic test system that includes a test unit and a disabling unit. The test unit performs at least one diagnostic test on a diagnostic assay to determine wh... | 09/20/2011 |
| 8014968 | Self-test circuit for high-definition multimedia interface integrated circuits A high-definition multimedia interface circuit uses a high-definition multimedia interface encoder to produce a plurality of channels of data. An output circuit, connected to the high-definition multimedia interface encoder, produces a plurality of channels of high ... | 09/06/2011 |
| 8010310 | Method and apparatus for identifying outliers following burn-in testing A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison. ... | 08/30/2011 |
| 8005637 | Method and apparatus for measuring characteristics of an electrical device An arrangement to determine at least one electrical feature of an electrical device including a signal injection unit configured to inject first and second test signals into the electrical device, a signal conversion unit configured to measure electrical qualities i... | 08/23/2011 |
| 8000920 | Procedure to diagnose an electrical circuit Procedure to diagnose an electrical circuit for the operation of actuators of an internal combustion engine, in which the circuit is checked for electrical errors, and whereby information from a misfire recognition is additionally taken into account. ... | 08/16/2011 |
| 7996175 | PCI load card A PCI load card includes a PCI interface, an operational amplifier, at least two switches, and a controller. A terminal of each switch is connected to an input terminal of the operational amplifier and connected to a standby power pin of the PCI interface via a firs... | 08/09/2011 |
| 7983870 | Integrated circuit and method for determining the operating range of an integrated circuit Method for ascertaining an operating range for an integrated circuit which has a plurality of system components, in which a test routine is performed for testing at least one system component from the plurality of system components, where the at least one system com... | 07/19/2011 |
| 7966144 | Clock circuits and counting values in integrated circuits A clock circuit for an integrated circuit having at least one MOS transistor. The clock circuit includes a first circuit for inducing a degradation of the transistor as a function of time and means for measuring a parameter of the transistor that reflects a lowering... | 06/21/2011 |
| 7945416 | Software or hardware test apparatus and method A software or hardware test system and method repeatedly obtains testing status of a plurality of test units in a group while the test units are testing hardware or software being executed on the test units. The system and method provides for display of the current ... | 05/17/2011 |
| 7945417 | Method of digital extraction for accurate failure diagnosis A method for testing VLSI circuits comprises a two-pass diagnostic method for testing a circuit wherein a first pass comprises a conventional test flow wherein an ATPG tool generates a set of test patterns and identifies possible faulty nets within the circuit. A se... | 05/17/2011 |
| 7933734 | Method for testing an electronic control system A method is presented and described for testing of at least one electronic control system, in which the control system is connected via a data channel to a test device, at least one environmental model is calculated on the test device and the environmental model int... | 04/26/2011 |
| 7930128 | Robust damage detection A method of improving damage detection in a structural health monitoring system includes obtaining a baseline set of signals corresponding to a range of values of an environmental effect variable for a plurality of first selected paths between pairs of a plurality o... | 04/19/2011 |
| 7912670 | Testing processor cores Systems, methods and program codes are provided for testing multi-core processor chip structures. Individual processor core power supply voltages are provided through controlling individual power supplies for each core, in one aspect to ensure that one or more cores... | 03/22/2011 |
| 7912667 | Electrical circuit and method for testing electronic component An electrical test circuit is disclosed. In one embodiment, the electrical test circuit includes a first input for receiving a test signal of an integrated circuit, a second input for receiving a control signal and a third input for receiving a normalized reference ... | 03/22/2011 |
| 7912668 | System for determining the true electrical characteristics of a device A system and method for determining the true electrical characteristics of a device. A codec is configured to measure at least one electrical characteristic of a device connected to a jack and to identify the device based on the measured electrical characteristics. ... | 03/22/2011 |
| 7912669 | Prognosis of faults in electronic circuits A process for a prognosis of faults in electronic circuits identifies parameters of a circuit under test. An upper and a lower limit is determined for one or more components of the circuit under test. A population of faulty and non-faulty circuits are generated for ... | 03/22/2011 |
| 7908108 | Circuit testing apparatus A circuit testing apparatus for testing a device under test is disclosed. The device under test comprises a first output end and second output end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines... | 03/15/2011 |
| 7908109 | Identifying manufacturing disturbances using preliminary electrical test data A method includes receiving measured values for a plurality of electrical test parameters associated with integrated circuit devices on at least one wafer measured prior to completion of the wafer. Values of the electrical test parameters are predicted. The measured... | 03/15/2011 |
| 7890284 | Identification system and method for recognizing any one of a number of different types of devices An identification system and method for recognizing a device as one of a plurality of different types of devices connected to at least one terminal of an information handling system includes supplying a test signal to a device in a test mode; measuring an electrical... | 02/15/2011 |
| 7885781 | Acquiring test data from an electronic circuit Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board, capturing by the probe an electronic signal of the electronic circuit, di... | 02/08/2011 |
| 7873489 | Dialysis machine with servicing indicator A dialysis machine that monitors an elapsed time and a number of accumulated hours during a current servicing interval is disclosed. The machine executes a machine-servicing algorithm on at least the elapsed time and the accumulated operating hours to generate a pro... | 01/18/2011 |
| 7865325 | Test system and failure parsing method thereof A test system and a failure parsing method. The test system may comprise a cell array including defective cells formed according to various failure causes, a test apparatus configured to measure electric characteristics from the defective cells and make the measured... | 01/04/2011 |
| 7831404 | Histogram generation with configurable memory The configuration and utilization of multiple memories is disclosed to efficiently gather histogram data for either multiple devices or single devices. Each memory can be configured depending on the number of ADCs to be tested. Rather than utilizing a separate histo... | 11/09/2010 |
| 7826995 | Apparatus for testing electronic devices The invention provides an apparatus for testing an integrated circuits on devices including a plurality of electrical subassemblies including a plurality of pattern generator, driver, and power boards divided into physical zones with each physical zone including one... | 11/02/2010 |
| 7818137 | Characterization circuit for fast determination of device capacitance variation A test circuit for fast determination of device capacitance variation statistics provides a mechanism for determining process variation and parameter statistics using low computing power and readily available test equipment. A test array having individually selectab... | 10/19/2010 |
| 7797123 | Method and apparatus for extracting assume properties from a constrained random test-bench One embodiment of the present invention provides systems and techniques to extract assume properties from a constrained random test-bench. During operation, the system can receive a constrained random test-bench for verifying the design-under-test (DUT), wherein the... | 09/14/2010 |
| 7788058 | Method and apparatus for diagnosing broken scan chain based on leakage light emission A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices wi... | 08/31/2010 |
| 7778790 | Semiconductor integrated circuit device and delay fault testing method A semiconductor integrated circuit device includes a plurality of flip-flops configured to form a scan chain in a scan path test to operate as a shift register. The first flip-flop of the plurality of flip-flops latches a first input signal in synchronization with a... | 08/17/2010 |
| 7774154 | Test unit and test apparatus In the digitizer, a plurality of ADCs convert a plurality of analogue signals output from the device to be tested, to digital signals, respectively. The processing circuit is configured as a software-independent circuit and processes a plurality of digital signals o... | 08/10/2010 |
| 7756664 | Test apparatus and measurement circuit There is provided a test apparatus for testing a device under test. The test apparatus includes a gradient adjusting section that separately adjusts a gradient of a rising edge of a signal under measurement which is output from the device under test and a gradient o... | 07/13/2010 |
| 7752004 | Method and apparatus for configuring plurality of devices on printed circuit board into desired test port configuration A system on a circuit board includes a plurality of devices designed to access an electronic system on the circuit board, and a programmable logic device (PLD) connected to the plurality of devices. Each of the plurality of devices complies with a test port architec... | 07/06/2010 |
