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Patent No. 5356330

Apparatus for Simulating a High Five

A self-righting hand-arm configuration which is adapted to pivot when struck by a user, thereby simulating a "high five."

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Class 702/108 - TESTING SYSTEM


Subclass of Class 702 - Data processing: measuring, calibrating, or testing
Definition: Subject matter wherein the data processing or calculating
No. of patents: 590
Last issue date: 01/17/2012


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NumberTitleIssue Date
8099251Systems and methods for certifying a racked computer assembly
In some embodiments, a method for testing a chassis including one or more information handling systems is provided. The method includes receiving a chassis configuration specification that defines a set of required components for a chassis configuration, generating ...
01/17/2012
8099252Self-test power management unit
Systems and methods are disclosed for a self-testing power management unit (PMU) in an electronic device. Self-testing may enable the testing of PMU power supply outputs while reducing the need for test points to conserve circuit board real estate. In one embodiment...
01/17/2012
8090551Self-testing, monitoring and diagnostics in grouped circuitry modules
An electrical test system for providing a power source to each of a plurality of electrical components under electrical test includes a grouped circuitry module. The grouped circuitry module includes a plurality of individually-programmable power sources, each coupl...
01/03/2012
8046187Test systems for media drives of data storage systems
A test system is described for testing a media drive, such as a tape drive. The test system includes a host emulator, a storage library emulator, and a control system. The host emulator communicates with a first interface of the media drive and mimics a host system ...
10/25/2011
8000919Calibration of a partially symmetric fixture
A method useful for the characterization of a fixture splits a partially symmetric THRU structure into portions which may then be mathematically removed from both ports of a 2-port measured structure, leaving only the desired device under test (DUT). ...
08/16/2011
7996173Method, apparatus, and article to facilitate distributed evaluation of objects using electromagnetic energy
Objects such as manufactured goods or articles, works of art, media such as identity documents, legal documents, financial instruments, transaction cards, other documents, and/or biological tissue are sampled via sequential illumination in various bands of the elect...
08/09/2011
7987063Fast, low power formatter for automatic test system
Automated test equipment (ATE) used to test semiconductor components during the manufacturing process. The ATE generates and measures signals at test points of a device under test. The ATE includes a signal formatter with an SR latch having set an reset inputs each ...
07/26/2011
7987064Dynamic determination of a minimal configured product to achieve desired test coverage
The present disclosure is directed to a method for determining dynamic test coverage for a product. The method may comprise: receiving a customer order, the customer order comprising at least one product configuration; receiving a rule set associated with the at lea...
07/26/2011
7979232Apparatuses and methods for determining configuration of SAS and SATA cables
Apparatus, systems, and methods for testing SAS cables by applying a signal to one end of a SAS cable, receiving the signal from another end of the SAS cable, and generating an output of information relating to the testing. The testing apparatus may test one or more...
07/12/2011
7953570Method for continuous analysis of the transmission quality in fieldbus networks
A method is disclosed for continuous analysis of the transmission quality in fieldbus networks in automation systems with a plurality of fieldbus participants, which communicate with one another over the fieldbus network. Directly measurable logical and physical bus...
05/31/2011
7933732Electronic load device for power supply product to be tested and method for regulating bandwidth thereof
An electronic load device provided for testing an OT (power supply to be tested) and the working bandwidth is regulated and set according to the output impedance of the OT. The electronic load device comprises a CPU, an impedance-bandwidth table, a voltage-current m...
04/26/2011
7926012Design-For-testability planner
A method is provided to improve the usability of Design-For-Testability Synthesis (DFTS) tools and to increase the design process productivity. The method comprises receiving a list of testability and design impact analysis functions, to be performed on the circuit,...
04/12/2011
7895011Method and apparatus for performing remote calibration verification
A method and apparatus for remotely verifying the calibration status of a diagnostic instrument, for example, following remote installation of a software upgrade on the instrument. In one example, a method of verifying the calibration status of the instrument, inclu...
02/22/2011
7885780Operating device for calibrating torque wrenches
The invention relates to an operating device for testing torque wrenches with a data storage. A carrier is provided for fixing a torque wrench to be tested. A transducer is arranged at the carrier and coupled to the head portion of the torque wrench to be tested. A ...
02/08/2011
7881898Priority system and method for processing standardized tests
Systems and methods are provided for prioritizing the processing of standardized tests. One aspect of the present subject matter relates to a method for processing completed standardized tests. In one embodiment, test-processing priority information is received, and...
02/01/2011
7867664Diagnostic apparatus and diagnostic method for fuel cell
According to an aspect of the invention, a diagnostic apparatus which diagnoses a state of the fuel cell includes an operation device which is used for operating the fuel cell; an operational state detecting portion which detects a change in an operational state of ...
01/11/2011
7869974Connector or other circuit element having an indirectly coupled integrated circuit
An apparatus (130) including an integrated circuit (200 200a) and at least one coupler (302a 302b) for electromagnetically coupling the integrated circuit (200 200a) to a conductor (323a
01/11/2011
7860679Method of testing and installing a home automation remote control unit
A method of testing and installing a remote control unit (RCU) for controlling elements (ACT1, ACT2, ACT3) of a home automation network, intended for managing the security or heat or light comfort in a building, comprising the use of software (A...
12/28/2010
7826993Method and device for analyzing substances
Some of the embodiments of the present disclosure provide a method for analyzing a substance, where the method includes subjecting the substance to a dynamic excitation to produce an observable response, and determining a characteristic quantity of the substance bas...
11/02/2010
7826994GPS module test system for automatically calibrating test signal
A GPS module test system for automatically calibrating a test signal includes a GPS test fixture, a satellite signal simulator, and a computer. The GPS test fixture carries a GPS module under test and is electrically connected to the same through contact, so as to r...
11/02/2010
7797121Test apparatus, and device for calibration
The test apparatus includes a first comparator and a second comparator that measure a measured signal output from the device under test at a given sampling clock timing, a deciding section that decides a quality of the device under test on the basis of a measurement...
09/14/2010
7788057Test apparatus and methods thereof
A system that incorporates teachings of the present disclosure may include, for example, an apparatus for testing having a controller to perform test case conflict resolution by comparing an execution descriptor to one or more platform descriptors. The execution des...
08/31/2010
7747406Method for testing and controlling workflows in a clinical system and/or components thereof
In a method to test a clinical and/or medical-technical system and a method for controlling medical-technical examination workflows in a clinical and/or medical-technical system, medical examination workflows in the appertaining system are simulated. For this purpos...
06/29/2010
7702479On-board guard-band chamber environment emulator
A method and system for testing a computer is presented. The temperature of the computer is controlled by one or more on-board fans inside the computer's enclosure. Voltages are controlled at the Voltage Regulator Module (VRM) level. A test program is then run under...
04/20/2010
7684948Electrical connection for testing head gimbal assemblies
A method for forming an electrical connection with head gimbal assembly. At least a portion of an unmounted head gimbal assembly is placed on a surface. The unmounted head gimbal assembly includes a flexible portion, the flexible portion includes contact pads, and t...
03/23/2010
7680619Parallel test architecture
A measurement system for testing a DUT includes a plurality of procedures for performing test functions, each procedure having a phase variable; a task queue where the procedures are entered in the task queue with a sign-up value of the phase variable; and a multiph...
03/16/2010
7668680Operational qualification by independent reanalysis of data reduction patch
Methods systems and computer readable media for testing operation of an instrument controlled by a system under test. Raw data, used by the system under test to calculate reduced data, is inputted to an independent data reduction engine. Independent reduced data is ...
02/23/2010
7668681Distributed sensor network with a common processing platform for CBMRNE devices and novel applications
An integrated chemical, biological, metals, radiation, nuclear, explosives sensor system I-CBMRNE deployed on a common platform supports chemical, biological, metals, radiation, nuclear, explosives (CBMRNE) surveillance systems. The common platform provides a databa...
02/23/2010
7657390Reclaiming substrates having defects and contaminants
Test substrates used to test semiconductor fabrication tools are reclaimed by reading from a database the process steps performed on each test substrate and selecting a reclamation process from a plurality of reclamation processes. The reclamation process can includ...
02/02/2010
7640131Data analysis method for analyzing failure root causes for products
Embodiments of the present invention provide a data group for each parameter that is classified into a first group and a second group, based on the performance of the products, a base point of a distribution of the data group is calculated, based on the distribution...
12/29/2009
7634375Multi-drive adaptor for use in a slot of a disk drive test system
Disclosed is a multi-drive adaptor that includes at least two disk drive ports, a connector, and a communication path. The connector is configured to receive at least one disk drive command transmitted according to a serial protocol from a serial controller. The com...
12/15/2009
7623981Testing of embedded systems
An embedded device testing system for comparing actual device under test input/output vector pairs with modelled device under test input/output vector pairs, wherein actual device under test output vectors are sampled in accordance with a predefined timing reference...
11/24/2009
7617063Remote witness testing system
A master testing control system includes at least one remote computer with one or more communications lines for communicating over a communications network and a plurality of remote sensors, a two way real-time digital video system, a two-way real-time digital audio...
11/10/2009
7587292Method of monitoring a semiconductor manufacturing trend
A parametric parameter is selected, which has an upper specification limit and a lower specification limit. A storage percentile is determined. The storage percentile is equal to a product yield percentage if the number of the set of measurements greater than the up...
09/08/2009
7587293Semiconductor CP (circuit probe) test management system and method
A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the ...
09/08/2009
7574318I/O port tester
An I/O port tester includes a first relay, a second relay, a first resistor, a second resistor, a plurality of serial plugs, a water sensor plug, a direct current (DC) voltage plug, and two data plugs. A half of the serial plugs is correspondingly connected to the o...
08/11/2009
7546216End effector for head gimbal assembly testing
A method for testing head gimbal assemblies includes picking a first head gimbal assembly and holding the first head gimbal assembly with a first an end effector. The first end effector and the picked head gimbal assembly are positioned adjacent a nest using at leas...
06/09/2009
7529635Method and apparatus for head gimbal assembly testing
A method for dynamic electrical testing of head gimbal assemblies may include initiating an automated continuous process that includes selecting an unmounted head gimbal assembly; aligning the unmounted head gimbal assembly; loading the unmounted head gimbal assembl...
05/05/2009
7516036System testing and methods therefor
A computer-implemented method of testing a target system using a stimulus-response test. The method includes obtaining the responses of the target system at predefined monitoring times. Each time the response changes state, a clock is reset, and the elapsed duration...
04/07/2009
7509224Solderless electrical connection for testing head gimbal assemblies
A method for making an electrical connection between a head gimbal assembly and a tester. The method includes providing a solderless connector including a housing with bores extending from a first side of the housing to a second opposed side of the housing, and cond...
03/24/2009
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