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Vehicular Impact Signaling Device
An apparatus for the deployment of a visible plume to alert other motorists that a proximate motor vehicle has been involved in a collision.
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| Number | Title | Issue Date |
| 7955122 | Conductive contact unit A conductive contact unit includes a conductive contact holder, a conductive contact, and an aligning unit. The conductive contact holder includes a first guiding grooves and a second guiding groove opposite to the first guiding groove, each slidably engaging one ed... | 06/07/2011 |
| 7934945 | Electrical connecting apparatus An embodiment of an electrical connecting apparatus comprises a support board, a plate spring arranged on the support board, an attachment device attaching the plate spring to the support board, a block having an attachment surface directing downward, and a flexible... | 05/03/2011 |
| 7934944 | Electrical connecting apparatus An embodiment of an electrical connecting apparatus comprises a support board having an upper surface and a lower surface, a block having an attachment surface directing downward and attached to the support board in a state where at least the attachment surface is l... | 05/03/2011 |
| 7727004 | Testing a high speed serial bus within a printed circuit board An apparatus and associated method for analyzing a communications link between two components on a common PCB. The communications link has a pair of through-board conductors connected by a first conductive etching on one side of the PCB. The communications link furt... | 06/01/2010 |
| 7618281 | Interconnect assemblies and methods Interconnect assemblies and methods for forming and using them. In one example of the invention, an interconnect assembly comprises a substrate, a resilient contact element and a stop structure. The resilient contact element is disposed on the substrate and has at l... | 11/17/2009 |
| 7611377 | Interface apparatus for electronic device test apparatus An interface apparatus 5 mounted on a test head 4 comprises: an electrical cable 54 having one end electrically connected to a socket board 66; a device side connector 541 attached to the other end of the electrical cable 54... | 11/03/2009 |
| 7507110 | Probe connector A probe connector includes a barrel, a plunger and an elastic element. The barrel disposes a base at one end thereof. The plunger has a basic portion received in the barrel and a contact portion extending out of the barrel from the other end of the barrel opposite t... | 03/24/2009 |
| 7422441 | Semiconductor component and device and method for connecting such a component, particularly for test purposes An electrical connection device includes a platform and a moving head. Between these components a semiconductor component is received and retained. The semiconductor component includes an electrical connection plate bearing an integrated circuit chip. The platform s... | 09/09/2008 |
| 7371128 | Cable terminal with air-enhanced contact pins An electrical connector has a body with a number of probes. Each probe has a spring biased pin with a contact tip, and includes a sleeve receiving the pin. Each sleeve has a first end connected to an incoming conductor, a second end connected to the body and from wh... | 05/13/2008 |
| 7368930 | Adjustment mechanism A probe card assembly can comprise a support structure to which a plurality of probes can be directly or indirectly attached. The probes can be disposed to contact an electronic device to be tested. The probe card assembly can further comprise actuators, which can b... | 05/06/2008 |
| 7365553 | Probe card assembly A probe card assembly has a probe contractor substrate having a plurality of probe contractor tips thereon and a probe card wiring board with an interposer disposed between the two. Support posts contacting the probe contractor substrate are vertically adjustable un... | 04/29/2008 |
| 7364474 | Cable terminal with contact pins including electrical component A cable terminal or connector has several electrical probes. Each probe has a conductive sleeve defining a bore, with a probe pin received in the bore. The probe pin has a free end contact tip extending in a first direction beyond the periphery of a circuit board su... | 04/29/2008 |
| 7347699 | Surface-mounted electrical connector A contactor (20) has a joint portion (27) which is jointed to each contactor pad (32) of one wiring board (30) by using a solder at one end portion thereof and a connecting portion (24) which is dip-soldered in each through hole ( | 03/25/2008 |
| 7331795 | Spring probe-compliant pin connector Provided is an electrical connector for interconnecting electrical components such as a printed wiring assembly to one or more additional printed wiring assemblies. The connector includes a housing containing one or more compliant pins, one or more spring probes, an... | 02/19/2008 |
| 7331613 | Medical tubing connector assembly incorporating strain relief sleeve A connector assembly for interconnecting separate sections of tubing, e.g., medical tubing. Connector assemblies are a two-piece construction having a connector pin and a connector sleeve. The connector sleeve includes a first end, a second end, and a passageway ext... | 02/19/2008 |
| 7322851 | Coaxial cable connector A coaxial cable connector including a plurality of arms, each arm having: a lever, a gripper having inwardly extending teeth, the gripper being on an opposite side of a longitudinal axis of the coaxial cable connector from the lever, and a joint connecting the lever... | 01/29/2008 |
| 7312617 | Space transformers employing wire bonds for interconnections with fine pitch contacts Method and apparatus for electrical testing of a device under test (DUT) that employs a connection board with signal contacts for applying test signals and a space transformer that has low pitch contacts arranged on one or more circumferential shelves that define an... | 12/25/2007 |
| 7300288 | Electrical connector The present invention discloses an electrical connector, comprising an insulating body disposed with a plurality of receiving holes, each of which is disposed with a first terminal and a second terminal inter-penetrating each other, wherein the second terminal is a ... | 11/27/2007 |
| 7301354 | Contact probe for a testing head having vertical probes for semiconductor integrated devices A contact probe for a testing head is presented. The contact probe for a testing head has a plurality of these probes which are inserted in guide holes realized in respective dies, the probe comprising a rod-shaped body equipped at an end with at least a contact tip... | 11/27/2007 |
| 7283086 | Fill level measuring device working with microwaves A fill level measuring device working with microwaves is provided, with which, with very small inventory cost, many applications having a wide variety of different measuring conditions can be handled. The device includes a modularly assembled antenna, having a cylin... | 10/16/2007 |
| 7283694 | Transmitter photonic integrated circuits (TxPIC) and optical transport networks employing TxPICs A photonic integrated circuit (PIC) chip comprising an array of modulated sources, each providing a modulated signal output at a channel wavelength different from the channel wavelength of other modulated sources and a wavelength selective combiner having an input o... | 10/16/2007 |
| 7266885 | Method of making a nerve cuff A method of producing an electrode brain probe assembly, using a flexible substrate comprising a polymeric layer bearing a conductive material coating. Photolithography and electroplating are used to form a set of contacts and conductors on the polymeric layer of th... | 09/11/2007 |
| 7248065 | Arcuate blade probe An arcuate blade probe is disclosed. The arcuate blade probe includes a shaft with a pair of faces that converge towards each other along a probe axis and terminate at a single edge that includes an arcuate profile. The arcuate profile provides a surface that makes ... | 07/24/2007 |
| 7239127 | Apparatus and method for inspecting electronic circuits The present invention provides an apparatus and a method for used in a board inspection capable of an inspection of defect in a circuit board with high resolution over a wide range. The method is used for manufacturing a sensor probe comprising layers which include ... | 07/03/2007 |
| 7231704 | Contact spring and socket combination for high bandwidth probe tips A high-bandwidth electrical test probe having a probe contact spring of reduced size and characteristic capacitance is presented. The probe includes a contact spring connected at one end to the input port of a probe circuit. The opposite end of the contact spring en... | 06/19/2007 |
| 7229327 | Canted coil spring power terminal and sequence connection system The present invention provides an electrical power system comprising a plurality of battery modules in series connection between adjacent battery modules, wherein each of the battery modules comprises a positive male terminal, a negative male terminal, and a socket ... | 06/12/2007 |
| 7227368 | Testing head contact probe with an eccentric contact tip A contact probe for a testing head effective to test a plurality of semiconductor-integrated electronic devices comprises a rod-like probe body having a cross section of prefixed contour and provided in correspondence with at least one end with an eccentric contact ... | 06/05/2007 |
| 7201613 | Pressure contact holding-type connector A pressure contact holding-type connector in accordance with the present invention is configured to be interposed between opposing electrodes. A conductive pin is located in at least one end portion of each through-hole of an insulating housing having a through-hole... | 04/10/2007 |
| 7201584 | Electrical connector for a chip module An electrical connector for a chip module including an insulator body and a conductive terminal. The insulator body has a plurality of receptor holes. Each of the plurality of receptor holes has a first conductive terminal and a second receptor hole. A first end of ... | 04/10/2007 |
| 7196532 | Test probe for semiconductor package An embodiment may comprise a test probe to measure electrical properties of a semiconductor package having ball-shaped terminals. The probe may include a signal tip and a ground tip. The signal tip may have a spherical lower surface allowing good contact with a ball... | 03/27/2007 |
| 7180321 | Tester interface module In one embodiment, a tester interface module for connecting a plurality of signal paths from at least one electronic assembly to at least one other electronic assembly is provided. The interface module includes a capture board having center conductor vias with cente... | 02/20/2007 |
| 7175449 | Integrated circuit connector for LGA package An integrated circuit connector for LGA package is used to fix a support assembly and a back assembly to circuit board. An integrated circuit is mounted in the support assembly and corresponding to the circuit board. The support assembly comprises protection board a... | 02/13/2007 |
| 7172431 | Electrical connector design and contact geometry and method of use thereof and methods of fabrication thereof A probe or an electrical connector comprises a substrate with a surface having a plurality of electrical contact locations. A shaped elongated electrical conductor has a first end coupled to one of the electrical contact locations and a second end thereof which proj... | 02/06/2007 |
| 7161364 | Dermal phase meter with replaceable probe tips A probe for a dermal phase meter includes a handle with a removable extension that terminates with a displaceable center conductor. A replaceable tip attaches to the distal end of the extension and includes a center conductor that engages the center conductor in the... | 01/09/2007 |
| 7160122 | Power connectors and contacts The present invention relates to electrical connectors, and, in particular, to power connectors and to improved contact structures and methods related thereto. ... | 01/09/2007 |
| 7154286 | Dual tapered spring probe A contact spring probe includes a plunger and a spring with a pair of opposed closed coils separated by an open coil. The plunger is secured at one end to one set of closed coils with a shoulder, flange or barb extending from the body of the plunger. ... | 12/26/2006 |
| 7148709 | Freely deflecting knee probe with controlled scrub motion A rigid column and a suspension knee are combined in a probe held in assembly via its column. The suspension knee has a base arm laterally connecting at and propagating away from the column. The base arm extends up to a lateral knee extension where a reverse arm con... | 12/12/2006 |
| 7126364 | Interface comprising a thin PCB with protrusions for testing an integrated circuit The invention relates to a test device for testing an integrated circuit called test circuit, comprising a plurality of housings intended to be tested in a printed circuit called main circuit. The device comprises an insulating membrane of soft material having two o... | 10/24/2006 |
| 7112974 | Proble for testing integrated circuits In one embodiment, a probe for testing integrated circuits includes a body having a tip and a hardening material on the tip. The hardening material helps improve the hardness of the tip. The hardening material thus allows the probe to reliably penetrate a layer to m... | 09/26/2006 |
| 7097485 | Electrical connector having resilient conductive terminals An electrical connector includes a terminal-mounting seat configured with receiving spaces. Each of conductive members has a connecting base connected to a contact block that is disposed in the respective receiving space. Each of conductive terminals has a lower cla... | 08/29/2006 |
