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Class 438/782 - With substrate handling during coating (e.g., immersion, spinning, etc.)


Subclass of Class 438 - Semiconductor device manufacturing: process
Definition: Processes wherein the semiconductor substrate is handled
No. of patents: 601
Last issue date: 06/14/2011


1                      
NumberTitleIssue Date
7960296Crystalline semiconductor film, method of manufacturing the same, and semiconductor device
A spin addition method for catalyst elements is simple and very important technique, because the minimum amount of a catalyst element necessary for crystallization can be easily added by controlling the catalyst element concentration within a catalyst element soluti...
06/14/2011
7906441System and method for mitigating oxide growth in a gate dielectric
Oxide growth of a gate dielectric layer that occurs between processes used in the fabrication of a gate dielectric structure can be reduced. The reduction in oxide growth can be achieved by maintaining the gate dielectric layer in an ambient effective to mitigate ox...
03/15/2011
7803720Coating process and equipment for reduced resist consumption
A coating system and method of coating semiconductor wafers is disclosed that is able to maintain a wet condition on the outer portion of the semiconductor wafer to provide ease of spreading for a photo-resist or anti-reflective coating (ARC) that is being dispensed...
09/28/2010
7723244Method for internal electrical insulation of a substrate for a power semiconductor module
A method for internal electrical insulation of a substrate for a power semiconductor module having a framelike insulating housing with a cap and having an insulating substrate. The substrate has conductor tracks and power semiconductor components mounted thereon. Th...
05/25/2010
7718550Method for low temperature growth of inorganic materials from solution using catalyzed growth and re-growth
The present invention involves a method and apparatus for depositing a silicon oxide onto a substrate from solution at low temperatures in a manner that produces homogeneous growth of the silicon oxide. The method generally comprises the following steps: (a) Chemica...
05/18/2010
7718551Method for forming photoresist layer
A method for forming a photoresist layer is provided. The method includes following steps. A wafer is provided in a semiconductor machine. The wafer is spun at a first spin speed. A pre-wet solvent is dispensed on the spinning wafer by using a nozzle disposed at a f...
05/18/2010
7704895Deposition method for high-k dielectric materials
A method for depositing a high-k dielectric material on a semiconductor substrate is disclosed. The method includes applying a chemical bath to a surface of a substrate, rinsing the surface, applying a co-reactant bath to the surface of the substrate, and rinsing th...
04/27/2010
7582573Spin-on glass composition and method of forming silicon oxide layer in semiconductor manufacturing process using the same
A spin-on glass (SOG) composition and a method of forming a silicon oxide layer utilizing the SOG composition are disclosed. The method includes coating on a semiconductor substrate having a surface discontinuity, an SOG composition containing polysilazane having a ...
09/01/2009
7517815Spin-on glass composition, method of preparing the spin-on glass composition and method of forming a porous silicon oxide layer using the spin-on glass composition
A spin-on glass composition includes a solvent, about 3 to about 20 percent by weight of a porogen, and about 3 to about 20 percent by weight of a silsesquioxane oligomer represented by formula (1), where, in the formula (1...
04/14/2009
7435692Gas jet reduction of iso-dense field thickness bias for gapfill process
A system and method affecting mass transport to reduce or eliminate iso-dense bias in spin-on-dielectric (SOD) or spin-on-glass (SOG) processes use a nozzle to dispense the liquid dielectric and a separate nozzle for jetting N2 or other gas onto a semicon...
10/14/2008
7429369Silicon nanoparticle nanotubes and method for making the same
A relatively thick electrode is positioned opposite the surface of a substrate/second electrode. The electrode and the substrate surface are both contacted by a solution including silicon nanoparticles. The substrate surface is completely immersed in the solution in...
09/30/2008
7427570Porous organosilicate layers, and vapor deposition systems and methods for preparing same
The present invention provides porous organosilicate layers, and vapor deposition systems and methods for preparing such layers on substrates. The porous organosilicate layers are useful, for example, as masks. ...
09/23/2008
7410899Defectivity and process control of electroless deposition in microelectronics applications
Methods and compositions for electrolessly depositing Co, Ni, or alloys thereof onto a substrate in manufacture of microelectronic devices. Grain refiners, levelers, oxygen scavengers, and stabilizers for electroless Co and Ni deposition solutions. ...
08/12/2008
7402535Method of incorporating stress into a transistor channel by use of a backside layer
The present invention provides the method includes forming source/drain regions 170 in a semiconductor wafer substrate 110 adjacent a gate structure 130 located on a front side of the semiconductor wafer substrate 110. The source/drain re...
07/22/2008
7387974Methods for providing gate conductors on semiconductors and semiconductors formed thereby
A method of providing a gate conductor on a semiconductor is provided. The method includes defining an organic polymer plating mandrel on the semiconductor, activating one or more sites of the organic polymer plating mandrel, binding a seed layer to the activated si...
06/17/2008
7384878Method for applying a layer to a hydrophobic surface
A method of forming a coating. The method includes: providing a substrate having a surface; forming a layer of water on the surface; and forming a layer of a material on the layer of water. ...
06/10/2008
7371434Liquid film forming method and solid film forming method
A method of forming a liquid film characterized by dropping a liquid on a substrate from a dropping unit while rotating the substrate, moving the dropping unit in the radial direction from the inner periphery of the substrate to the outer periphery of the substrate ...
05/13/2008
7371698Method of forming film pattern, active matrix substrate, electro-optic device, and electronic apparatus
A method of forming a film pattern includes the steps of forming a bank for partitioning a pattern forming area including a first pattern forming area and a second pattern forming area having an intersection with the first pattern forming area and divided in the int...
05/13/2008
7369947Quantification of adsorbed molecular contaminant using thin film measurement
A test method for measuring adsorbed molecular contamination uses a test structure that includes a substrate comprising a plurality of separated test sites having a plurality separate thicknesses having a base design thickness and a designed thickness interrelations...
05/06/2008
7367725Method for removing developing solution
An apparatus (3) for removing developing solution from a substrate (30) includes a working table (36) for placing the substrate, a supporting frame (33) positioned on the working table, a gas dispensing nozzle (31) mounted on the s...
05/06/2008
7368368Multi-chamber MOCVD growth apparatus for high performance/high throughput
In one embodiment the present invention is a method of conducting multiple step multiple chamber chemical vapor deposition while avoiding reactant memory in the relevant reaction chambers. The method includes depositing a layer of semiconductor material on a substra...
05/06/2008
7364939Active matrix display device
In order to provide an active matrix display device in which a thick insulating film is preferably formed around an organic semiconductive film of a thin film luminescent device without damaging the thin film luminescent device, the active matrix display device is p...
04/29/2008
7365000Method for fabricating semiconductor device
Disclosed is a method for fabricating a semiconductor device capable of preventing an inter-layer insulation layer from being damaged during a wet cleaning process due to a density difference created by reliance on a thickness of a SOG layer subjected to a curing pr...
04/29/2008
7358199Method of fabricating semiconductor integrated circuits
A method of fabricating semiconductor integrated circuits includes (1) providing a spin-on tool comprising a rotatable platen for holding and spinning a wafer disposed thereon, a fluid supply system for providing spin-on solution onto the wafer, and a detector fixed...
04/15/2008
7358554Semiconductor manufacturing apparatus for modifying-in-film stress of thin films, and product formed thereby
An apparatus for depositing a thin film on a substrate and product produced thereby are disclosed. In particular, deposition of the thin film is carried out on the substrate having an applied pressure. This applied pressure flexes the substrate to reduce in-plane st...
04/15/2008
7354834Semiconductor devices and methods to form trenches in semiconductor devices
Semiconductor devices and methods of fabricating the same are disclosed. One example method may include forming sequentially a pad oxide film and a silicon nitride film on an entire surface of a semiconductor substrate, forming the trench by etching the silicon nitr...
04/08/2008
7351669Method of forming a substantially closed void
To form a substantially closed void between two structures on a substrate, a flowable liquid dielectric material is deposited to fill partially the space between the structures, and a surface is placed to bridge and substantially close the space between the structur...
04/01/2008
7348283Mechanically robust dielectric film and stack
A method for forming a mechanically robust dielectric film comprises depositing a dielectric film on a substrate and then inducing a compressive strain in a top surface of the dielectric film to form a compressive strained surface. The compressive strain may be indu...
03/25/2008
7345002Replication and transfer of microstructures and nanostructures
A method for the duplication of microscopic patterns from a master to a substrate is disclosed, in which a replica of a topographic structure on a master is formed and transferred when needed onto a receiving substrate using one of a variety of printing or imprint t...
03/18/2008
7338917Purification catalyst for exhaust gas
A purification catalyst for exhaust gas enhances the activity for each precious metal by effectively utilizing the precious metal without incurring a high production cost, thereby improving endurance. The purification catalyst for exhaust gas comprises a composite o...
03/04/2008
7335391Method for coating implantable devices
A method of forming a coating for an implantable medical device, such as a stent, is provided which includes applying a composition to the device in an environment having a selected pressure. ...
02/26/2008
7335611Copper conductor annealing process employing high speed optical annealing with a low temperature-deposited optical absorber layer
A method of forming a conductor in a thin film structure on a semiconductor substrate includes forming high aspect ratio openings in a base layer having vertical side walls, depositing a dielectric barrier layer comprising a dielectric compound of a barrier metal on...
02/26/2008
7332409Methods of forming trench isolation layers using high density plasma chemical vapor deposition
A method of forming a trench isolation layer can include forming an isolation layer in a trench using High Density Plasma Chemical Vapor Deposition (HDPCVD) with a carrier gas comprising hydrogen. Other methods are disclosed. ...
02/19/2008
7328713Nozzle apparatus for stripping edge bead of wafer
There is provided a nozzle apparatus for stripping an edge bead from a wafer, which includes a rotatable support arm, and a side rinse nozzle coupled to a leading end of the support arm to remove the bead of photoresist remaining on the edge of a wafer. The side rin...
02/12/2008
7329619Method for patterning thin film, method and apparatus for fabricating flat panel display
Disclosed is a method and apparatus for fabricating a patterned thin film layer within a flat panel display that employs a soft mold and heat treatment in place of a photolithographic process. The disclosed method may reduce process time as well as substantially min...
02/12/2008
7323401Semiconductor substrate process using a low temperature deposited carbon-containing hard mask
A method of processing a thin film structure on a semiconductor substrate using an optically writable mask includes placing the substrate in a reactor chamber, the substrate having on its surface a target layer to be etched in accordance with a predetermined pattern...
01/29/2008
7320734Plasma immersion ion implantation system including a plasma source having low dissociation and low minimum plasma voltage
A system for processing a workpiece includes a plasma immersion ion implantation reactor with an enclosure having a side wall and a ceiling and defining a chamber, and a workpiece support pedestal within the chamber having a workpiece support surface facing the ceil...
01/22/2008
7312164Selective passivation of exposed silicon
A method for applying a passivation layer selectively on an exposed silicon surface includes use of a liquid phase solution supersaturated in silicon dioxide. The application is conducted at substantially atmospheric temperature and pressure and achieves an effectiv...
12/25/2007
7312148Copper barrier reflow process employing high speed optical annealing
A method of forming a barrier layer for a thin film structure on a semiconductor substrate includes forming high aspect ratio openings in a base layer having vertical side walls, depositing a dielectric barrier layer comprising a dielectric compound of a barrier met...
12/25/2007
7312162Low temperature plasma deposition process for carbon layer deposition
A method of depositing a carbon layer on a workpiece includes placing the workpiece in a reactor chamber, introducing a carbon-containing process gas into the chamber, generating a reentrant toroidal RF plasma current in a reentrant path that includes a process zone...
12/25/2007
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