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Class 438/413 - With epitaxial semiconductor formation


Subclass of Class 438 - Semiconductor device manufacturing: process
Definition: Process for making a total dielectric isolation semiconductor
No. of patents: 189
Last issue date: 02/21/2012


1          
NumberTitleIssue Date
8119494Defect-free hetero-epitaxy of lattice mismatched semiconductors
A method includes providing a semiconductor substrate formed of a first semiconductor material; and forming a plurality of insulation regions over at least a portion of the semiconductor substrate, with a plurality of trenches separating the plurality of insulation ...
02/21/2012
7989306Method of forming alternating regions of Si and SiGe or SiGeC on a buried oxide layer on a substrate
Semiconductor structures and methods of forming semiconductor structures, and more particularly to structures and methods of forming SiGe and/or SiGeC buried layers for SOI/SiGe devices. An integrated structure includes discontinuous, buried layers having alternatin...
08/02/2011
7951684Semiconductor device method of manfacturing a quantum well structure and a semiconductor device comprising such a quantum well structure
A semiconductor device (1) and a method are disclosed for obtaining on a substrate (2) a multilayer structure (3) with a quantum well structure (4). The quantum well structure (4) comprises a semiconductor layer (5) sandwich...
05/31/2011
7927962Semiconductor device having buried insulation films and method of manufacturing the same
A method of manufacturing a semiconductor device and a semiconductor device manufactured by the method, the method comprising: (a) forming a buffer layer on a semiconductor substrate; (b) patterning the buffer layer in a first direction to form buffer layer patterns...
04/19/2011
7838388Method for producing SOI substrate
Provided is a method for producing an SOI substrate having a thick-film SOI layer, in which an ion-implanted layer is formed by implanting at least one kind of ion of hydrogen ion and a rare gas ion into a surface of a bond wafer, an SOI substrate having an SOI laye...
11/23/2010
7803690Epitaxy silicon on insulator (ESOI)
Methods and structures for semiconductor devices with STI regions in SOI substrates is provided. A semiconductor structure comprises an SOI epitaxy island formed over a substrate. The structure further comprises an STI structure surrounding the SOI island. The STI s...
09/28/2010
7759213Pattern independent Si:C selective epitaxy
Trenches are formed in a silicon substrate by etching exposed portions of the silicon substrate. After covering areas on which deposition of Si:C containing material is to be prevented, selective epitaxy is performed in a single wafer chamber at a temperature from a...
07/20/2010
7691720Vertical nanotube semiconductor device structures and methods of forming the same
Vertical device structures incorporating at least one nanotube and methods for fabricating such device structures by chemical vapor deposition. Each nanotube is grown by chemical vapor deposition catalyzed by a catalyst pad and encased in a coating of a dielectric m...
04/06/2010
7670923Method of fabricating strain-silicon CMOS
Recesses are formed in the drain and source regions of an MOS transistor. The recesses are formed using two anisotropic etch processes and first and second sidewall spacers. The recesses are made up of first and second recesses, and the depths of the first and secon...
03/02/2010
7405098Smooth surface liquid phase epitaxial germanium
A method is provided for forming a liquid phase epitaxial (LPE) germanium (Ge)-on-insulator (GOI) thin-film with a smooth surface. The method provides a silicon (Si) wafer, forms a silicon nitride insulator layer overlying the Si wafer, and selectively etches the si...
07/29/2008
7390710Protection of tunnel dielectric using epitaxial silicon
Layers of epitaxial silicon are used to protect the tunnel dielectric layer of a floating-gate memory cell from excessive oxidation or removal during the formation of shallow trench isolation (STI) regions. Following trench formation, the layers of epitaxial silicon...
06/24/2008
7364990Epitaxial crystal growth process in the manufacturing of a semiconductor device
First and second preliminary epitaxial layers are grown from single-crystalline seeds in openings in an insulation layer until the first and second epitaxial layers are connected to each other. While the first and second preliminary epitaxial layers are being grown,...
04/29/2008
7329923High-performance CMOS devices on hybrid crystal oriented substrates
An integrated semiconductor structure containing at least one device formed upon a first crystallographic surface that is optimal for that device, while another device is formed upon a second different crystallographic surface that is optimal for the other device is...
02/12/2008
7320926Shallow trench filled with two or more dielectrics for isolation and coupling for stress control
A method for forming shallow trenches having different trench fill materials is described. A stop layer is provided on a substrate. A plurality of trenches is etched through the stop layer and into the substrate. A first layer is deposited over the stop layer and fi...
01/22/2008
7303963Method for manufacturing cell transistor
Disclosed herein is a method of manufacturing a cell transistor which can achieve an improvement in a short-channel effect of a cell transistor as well as an improvement in a refresh characteristic of the transistor, and can also prevent a reduction in the threshold...
12/04/2007
7271023Floating body germanium phototransistor
A floating body germanium (Ge) phototransistor and associated fabrication process are presented. The method includes: providing a silicon (Si) substrate; selectively forming an insulator layer overlying the Si substrate; forming an epitaxial Ge layer overlying the i...
09/18/2007
7271066Semiconductor device and a method of manufacturing the same
Disclosed are a semiconductor devices and method of fabricating the same. Anti-etch films are formed in the top corners of the device isolation film using a material that has a different etch selectivity ratio from nitride or oxide and is not etched in an oxide gate...
09/18/2007
7235433Silicon-on-insulator semiconductor device with silicon layers having different crystal orientations and method of forming the silicon-on-insulator semiconductor device
A semiconductor device comprising a substrate having a first crystal orientation and an insulating layer overlying the substrate is provided. A plurality of silicon layers are formed overlying the insulating layer. A first silicon layer comprises silicon having the ...
06/26/2007
7202143Low temperature production of large-grain polycrystalline semiconductors
An oxide or nitride layer is provided on an amorphous semiconductor layer prior to performing metal-induced crystallization of the semiconductor layer. The oxide or nitride layer facilitates conversion of the amorphous material into large grain polycrystalline mater...
04/10/2007
7199031Semiconductor system having a pn transition and method for manufacturing a semiconductor system
A semiconductor system having a pn transition and a method for manufacturing a semiconductor system are disclosed. The semiconductor system is designed in the form of a chip having an edge region, the semiconductor system includes a first layer of a first conductivi...
04/03/2007
7195985CMOS transistor junction regions formed by a CVD etching and deposition sequence
This invention adds to the art of replacement source-drain cMOS transistors. Processes may involve etching a recess in the substrate material using one equipment set, then performing deposition in another. Disclosed is a method to perform the etch and subsequent dep...
03/27/2007
7195984Reduce 1/f noise in NPN transistors without degrading the properties of PNP transistors in integrated circuit technologies
An interfacial oxide layer (185) is formed in the emitter regions of the NPN transistor (280, 220) and the PNP transistor (290, 200). Fluorine is selectively introduced into the polysilicon emitter region of the NPN transistor (220) to re...
03/27/2007
7183175Shallow trench isolation structure for strained Si on SiGe
A structure, and a method for fabricating the structure, for the isolation of electronic devices is disclosed. The electronic devices are processed in substrates comprising a SiGe based layer underneath a strained Si layer. The isolation structure comprises a trench...
02/27/2007
7183573Disposable spacer for symmetric and asymmetric Schottky contact to SOI mosfet
A silicon on insulator transistor is disclosed which has a Schottky contact to the body. The Schottky contact may be formed on the source and/or drain side of the gate conductor. A spacer, with at least a part thereof being disposable, is formed on the sidewalls of ...
02/27/2007
7176101Method of forming isolation oxide layer in semiconductor integrated circuit device
A method is provided in which a first oxide layer is deposited on a silicon substrate and etched to form openings. A first silicon epitaxial layer is grown on the substrate in the openings, forming first active regions, a second oxide layer is deposited thereon, and...
02/13/2007
7175966Water and aqueous base soluble antireflective coating/hardmask materials
A multilayer lithographic structure which includes a substrate, having on a major surface thereof a first layer including a water and/or aqueous base soluble material which includes Ge, O, and H, and optionally X, wherein X is at least one of Si, N, and F; and dispo...
02/13/2007
7172930Strained silicon-on-insulator by anodization of a buried p+ silicon germanium layer
A cost efficient and manufacturable method of fabricating strained semiconductor-on-insulator (SSOI) substrates is provided that avoids wafer bonding. The method includes growing various epitaxial semiconductor layers on a substrate, wherein at least one of the semi...
02/06/2007
7170184Treatment of a ground semiconductor die to improve adhesive bonding to a substrate
Methods are provided to improve the adhesive bonding of a semiconductor die to a substrate through an adhesive paste by forming a layer of silicon dioxide on the back surface of the semiconductor die prior to applying the adhesive paste. Contacting the semiconductor...
01/30/2007
7166520Thin handle substrate method and structure for fabricating devices using one or more films provided by a layer transfer process
A method for fabricating one or more devices, e.g., integrated circuits. The method includes providing a substrate (e.g., silicon), which has a thickness of semiconductor material and a surface region. The substrate also has a cleave plane provided within the substr...
01/23/2007
7144764Method of manufacturing semiconductor device having trench isolation
The invention relates to improvements in a method of manufacturing a semiconductor device in which deterioration in a transistor characteristic is avoided by preventing a channel stop implantation layer from being formed in an active region. After patterning a nitri...
12/05/2006
7132347Semiconductor device with trench structure and method for manufacturing the same
A semiconductor device includes a common diffusion structure formed in each region of a substrate in which semiconductor components are formed. The diffusion structures are separated into sections by trenches to form semiconductor components. The trenches define siz...
11/07/2006
7118976Methods of manufacturing MOSFETs in semiconductor devices
Methods of fabricating MOSFETs in semiconductor/r devices are disclosed. One example method may include forming an isolation layer on a semiconductor substrate and forming a capping layer thereon, forming an epitaxial active region which is not covered with the isol...
10/10/2006
7105895Epitaxial SiObarrier/insulation layer
A method for producing an insulating or barrier layer (FIG. 1B), useful for semiconductor devices, comprises depositing a layer of silicon and at least one additional element on a silicon substrate whereby said deposited layer is substantially free of defects...
09/12/2006
7094634Structure and method for manufacturing planar SOI substrate with multiple orientations
The present invention provides a method of forming a substantially planar SOI substrate having multiple crystallographic orientations including the steps of providing a multiple orientation surface atop a single orientation layer, the multiple orientation surface co...
08/22/2006
7081397Trench sidewall passivation for lateral RIE in a selective silicon-on-insulator process flow
A lateral trench in a semiconductor substrate is formed by the following steps. Form a lateral implant mask (LIM) over a top surface of the semiconductor substrate. Implant a heavy dopant concentration into the substrate through the LIM to form a lateral implant reg...
07/25/2006
7071039Manufacturing method of partial SOI wafer, semiconductor device using the partial SOI wafer and manufacturing method thereof
A semiconductor device includes a first semiconductor region having a buried oxide layer formed therein, a second semiconductor region in which the buried oxide layer does not exist, a trench formed to such a depth as to reach at least the buried oxide layer in a bo...
07/04/2006
7067846Semiconductor light-emitting device, surface-emission laser diode, and production apparatus thereof, production method, optical module and optical telecommunication system
A semiconductor light-emitting device has a semiconductor layer containing Al between a substrate and an active layer containing nitrogen, wherein Al and oxygen are removed from a growth chamber before growing said active layer and a concentration of oxygen incorpor...
06/27/2006
7045435Shallow trench isolation method for a semiconductor wafer
The present invention relates to a shallow trench isolation method of a semiconductor wafer which fills dielectric material into shallow trenches between components on the surface of the semiconductor wafer to electrically isolate the components. This method can pre...
05/16/2006
7018904Semiconductor chip having multiple functional blocks integrated in a single chip and method for fabricating the same
A semiconductor chip comprises a base substrate, a bulk device region having a bulk growth layer on a part of the base substrate, an SOI device region having a buried insulator on the base substrate and a silicon layer on the buried insulator, and a boundary layer l...
03/28/2006
7018886Shallow trench filled with two or more dielectrics for isolation and coupling or for stress control
A method for forming shallow trenches having different trench fill materials is described. A stop layer is provided on a substrate. A plurality of trenches is etched through the stop layer and into the substrate. A first layer is deposited over the stop layer and fi...
03/28/2006
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