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Class 438/376 - Single dopant forming regions of different depth or concentrations


Subclass of Class 438 - Semiconductor device manufacturing: process
Definition: Process wherein the plural doping steps form regions which
No. of patents: 72
Last issue date: 08/23/2011


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NumberTitleIssue Date
8003476Semiconductor device having a plurality of kinds of wells and manufacturing method thereof
A semiconductor device has a configuration in which more than three kinds of wells are formed with small level differences. One kind of well from among the more than three kinds of wells has a surface level higher than other kinds of wells from among the more than t...
08/23/2011
7615458Activation of CMOS source/drain extensions by ultra-high temperature anneals
A method of manufacturing a semiconductor device that includes forming a gate dielectric layer over a semiconductor substrate. A gate electrode is formed over the gate dielectric layer. A dopant is implanted into an extension region of the substrate, with an amount ...
11/10/2009
7384853Method of performing salicide processes on MOS transistors
A method of performing salicide processes on a MOS transistor, wherein the MOS transistor comprises a gate structure and a source/drain region, the method comprising: performing a selective growth process to form a silicon layer on the top of the gate and the source...
06/10/2008
7338876Method for manufacturing a semiconductor device
A method for forming a semiconductor memory device includes the steps of: implanting a dopant in a semiconductor substrate; heat treating the semiconductor substrate in an oxidizing ambient to diffuse the dopant for forming diffused regions in the semiconductor subs...
03/04/2008
7288829Bipolar transistor with self-aligned retrograde extrinsic base implant profile and self-aligned silicide
Disclosed is a method of forming a transistor in an integrated circuit structure that begins by forming a collector in a substrate and an intrinsic base above the collector. Then, the invention patterns an emitter pedestal for the lower portion of the emitter on the...
10/30/2007
7271070Method for producing transistors
The invention relates to a method for producing integrable semiconductor components, especially transistors or logic gates, using a p-doped semiconductor substrate. First of all, a mask is applied to the semiconductor substrate in order to define a window that is de...
09/18/2007
7195986Microfluidic device with controlled substrate conductivity
A method to achieve controlled conductivity in microfluidic devices, and a device formed thereby. The method comprises forming a microchannel or a well in an insulating material, and ion implanting at least one region of the insulating material at or adjacent the mi...
03/27/2007
6995068Double-implant high performance varactor and method for manufacturing same
A varactor designed to enable voltage controlled oscillator (VCO) integration in wireless systems is the base-emitter junction of a specially optimized NPN device formed with a double base implant. A first, shallow implant optimizes capacitance, leakage current, and...
02/07/2006
6893934Bipolar transistor device having phosphorous
A Si1-xGex layer 111b functioning as the base composed of an i—Si1-xGex layer and a p+ Si1-xGex layer is formed on a collector layer 102, and a Si cap layer 111
05/17/2005
6716712Process for producing two differently doped adjacent regions in an integrated semiconductor
During the production of integrated semiconductor structures, it is often necessary to differently dope immediately adjacent regions. A method is provided for producing two adjacent regions of a predetermined area in an integrated semiconductor, whereby a first regi...
04/06/2004
6337252Semiconductor device manufacturing method
There is provided a method of manufacturing a semiconductor device which can use commonly a part of a step of forming a PAP transistor with a step of forming an NON transistor. In an area separated by a side separation region (5) of PNP formed by doping N...
01/08/2002
6329257Method for laterally peaked source doping profiles for better erase control in flash memory devices
A system and method for controlling a characteristic of at least one memory cell on a semiconductor is disclosed. The at least one memory cell includes a gate stack, a source, and a drain. The semiconductor includes a surface. In one aspect, the method an...
12/11/2001
6309940Latch-up resistant CMOS structure
Provided with a semiconductor device including: a semiconductor substrate having a first conductivity type; a first well having a second conductivity type formed in a first region in a major surface of the semiconductor substrate; a second well having the...
10/30/2001
6225180Semiconductor device and method of manufacturing the same
A photoresist pattern is formed on a field oxide film and an element forming region across the field oxide film and the element forming region such that a portion of a surface of the field oxide film and a portion of a surface of a silicon epitaxial layer...
05/01/2001
6215151Methods of forming integrated circuitry and integrated circuitry
Integrated circuitry and methods of forming integrated circuitry are described. In one implementation, a common masking step is utilized to provide source/drain diffusion regions and halo ion implantation or dopant regions relative to the source/drain reg...
04/10/2001
6146953Fabrication method for mosfet device
A fabrication method for a MOSFET device including the steps of forming a first insulating film on a semiconductor substrate wherein an active region and an isolated region are defined, forming a channel ion region by implanting impurity ions into the act...
11/14/2000
6043130Process for forming bipolar transistor compatible with CMOS utilizing tilted ion implanted base
A bipolar transistor compatible with CMOS processes utilizes only a single layer of polysilicon while maintaining the low base resistance associated with conventional double-polysilicon bipolar designs. Dopant is implanted to form the intrinsic base throu...
03/28/2000
5976921Method for manufacturing electrostatic discharge protection (ESD) and BiCMOS
A semiconductor device having an electrostatic discharge protection device and at least one accompanying device selected from the group comprising of a N or P channel MOS transistor, CMOS, bipolar transistor and BiCMOS, in which the electrostatic discharg...
11/02/1999
5885880Bipolar transistor device and method for manufacturing the same
A semiconductor device is provided in which a vertical NPN transistor and a vertical PNP transistor electrically isolated from each other are formed on a p-type semiconductor substrate. An n-type buried separating region of the vertical PNP transistor is ...
03/23/1999
5850242Recording head and recording apparatus and method of manufacturing same
The occupied area of a heater drive circuit of a recording head is reduced, and the number of manufacturing steps is decreased. As a circuitry of the heater drive unit, the final stage of the drive unit is constituted of a pnp or npn bipolar transistor, t...
12/15/1998
5780329Process for fabricating a moderate-depth diffused emitter bipolar transistor in a BICMOS device without using an additional mask
A bipolar transistor with a relatively deep emitter region is formed in a BICMOS device using the source/drain mask used to form the source and drain regions of MOSFETs of the device and the base region mask which would otherwise be required in any event ...
07/14/1998
5756387Method for forming zener diode with high time stability and low noise
Zener diode with high stability in time and low noise for integrated circuits and provided in an epitaxial pocket insulated from the rest of a type N epitaxial layer grown on a substrate of type P semiconductor material. In said pocket are included a type...
05/26/1998
5700730Semiconductor processing method of providing dopant impurity into a semiconductor substrate
A semiconductor processing method of providing dopant impurity into a semiconductor substrate includes: a) providing a semiconductor substrate, the substrate comprising a first bulk region having a blanket doping of a first conductivity type dopant, the s...
12/23/1997
5593905Method of forming stacked barrier-diffusion source and etch stop for double polysilicon BJT with patterned base link
A bipolar transistor (100) and a method for forming the same. A base-link diffusion source layer (118) is formed over a portion of the collector region (102). The base-link diffusion source layer (118) comprises a material that is capable of being used as...
01/14/1997
5569612Process for manufacturing a bipolar power transistor having a high breakdown voltage
There is described a bipolar power transistor with high breakdown voltage, obtained in a heavily doped semiconductor substrate of the N type, over which a lightly doped N type layer, constituting a collector region of the transistor, is superimposed. The ...
10/29/1996
5496746Method for fabricating a bipolar junction transistor exhibiting improved beta and punch-through characteristics
A bipolar transistor having an emitter, a base, and a collector includes an intrinsic base region having narrow side areas and a wider central area. The side areas are located adjacent to the extrinsic base region, while the central area is disposed under...
03/05/1996
5453387Fabrication method of semiconductor device with neighboring n- and p-type regions
A fabrication method of a semiconductor device that can form n- and p-type buried regions separately in a semiconductor substrate of a first conductivity type through a single lithography process. A first impurity of a second conductivity type is doped in...
09/26/1995
5279976Method for fabricating a semiconductor device having a shallow doped region
A method is provided for the formation of ultra-shallow boron doped regions in a semiconductor device. In one embodiment of the invention an N-type semiconductor substrate (15) is provided having a first P-type region formed therein. A dielectric layer (1...
01/18/1994
5137840Vertical bipolar transistor with recessed epitaxially grown intrinsic base region
A method of manufacturing a vertical bipolar transistor including the steps of: providing a semiconductor substrate including a first region of a first conductivity type; forming an extrinsic base region of a second conductivity type in the surface of the...
08/11/1992
5128272Self-aligned planar monolithic integrated circuit vertical transistor process
A process for creating self-aligned vertically arrayed planar transistors. The preferred embodiment relates to the simultaneous fabrication of both NPN and PNP planar vertically arrayed transistors in a conventional monolithic, epitaxial, PN junction isol...
07/07/1992
5098638Method of manufacturing a semiconductor device
A method of manufacturing a semiconductor device forms an intrinsic base layer by doping an impurity in the emitter polysilicon electrode into the intrinsic base region of the surface of a semiconductor substrate by heat treatment through the emitter lead...
03/24/1992
5064774Self-aligned bipolar transistor process
A fully self-aligned bipolar transistor having low emitter and base-resistances is formed in a semiconductor device. In one embodiment, a patterned masking layer is formed on an active device region of a semiconductor substrate. The patterned masking laye...
11/12/1991
5039624Method of manufacturing a bipolar transistor
A bipolar transistor having an intrinsic base portion for forming emitter-base PN junction with an emitter region and an extrinsic base portion for connecting a base electrode is disclosed. A concavity is formed between the intrinsic and extrinsic base po...
08/13/1991
5023192Method of manufacturing a bipolar transistor
A first device region (20) of one conductivity type is provided adjacent one major surface (11) of a semiconductor body (10). A layer (30) doped with impurities of the opposite conductivity type is provided on the one major surface (11) for forming an ext...
06/11/1991
5019523Process for making polysilicon contacts to IC mesas
Disclosed is a process for making a bipolar transistor which comprises an n-type Si semiconductor body having a convex portion, an insulation film covering the surface of the semiconductor body other than the convex portion, and a p-type polycrystalline S...
05/28/1991
5010026Process for making bipolar transistor
A bipolar transistor has a base region consisting of a graft base region, linking base region and an intrinsic base region, and a diffusion suppressing region of an opposite conductivity type to that of the base region is formed at least at the lower port...
04/23/1991
4946798Semiconductor integrated circuit fabrication method
In a semiconductor integrated circuit fabrication method, isolated regions are in a silicon substrate, which is then covered with polysilicon, a passive base region is then formed, the polysilicon is selectively oxidized, the unoxidized polysilicon is the...
08/07/1990
4902640High speed double polycide bipolar/CMOS integrated circuit process
A mixed bipolar-CMOS self-aligned process and integrated circuit provide a high performance NPN bipolar transistor in parallel to fabrication of a PMOSFET and an NMOSFET. Gate and base contacts are formed in a first polysilicon layer. The base contacts ar...
02/20/1990
4849364Semiconductor devices
A method of manufacturing a bipolar transistor (1) with semi-self-aligned p+ base contacts (27,27a). A p-type base region (28) is formed in a surface region of an n-type region 5 comprising a collector. An element (29) of, for example, n+...
07/18/1989
4830972Method of manufacturing bipolar transistor
A method of manufacturing an ultra-miniaturized bipolar transistor is disclosed, wherein an insulating film and a first polysilicon film doped with an impurity of a second conductivity type are formed, in this order, as a collector on a semiconductor laye...
05/16/1989
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