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Microwave Oven With Removable Storage Cassette in Dashboard of Motor Vehicle
A microwave oven adapted for use within a motor vehicle dashboard area. The microwave oven has a removable storage cassette, and slidable platforms for securing and serving containers of beverages and foods.
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| Number | Title | Issue Date |
| 8369604 | Position detector, position detection method, exposure apparatus, and device manufacturing method A position detector, which detects the position of a mark formed on a substrate (W), comprises a creating unit (9), a search unit (13), and a correction unit (14). The creating unit (9) creates a template used for identifying a mark to be... | 02/05/2013 |
| 8369605 | Method and apparatus for determining the position of a structure on a carrier relative to a reference point of the carrier A method is provided for determining the position of a structure on a carrier, relative to a reference point of the carrier, said method comprising the steps of: a) providing an image including a reference structure; b) recording an image of the structure on the car... | 02/05/2013 |
| 8363924 | Electronic device testing apparatus An electronic device testing apparatus for conveying electronic devices to be tested to sockets of a contact portion and bringing the electronic devices to be tested electrically contact with the sockets to conduct a test of electric characteristics of the electroni... | 01/29/2013 |
| 8345951 | Image binarizing method, image processing device, and computer program A binarizing method for binarizing an original image of an electrode pad on a substrate. The method includes the steps of processing an electrode image to generate a binary image of the electrode by binarzing the original image with a first threshold value, calculat... | 01/01/2013 |
| 8306313 | Method for placing at least one component provided with connection points on a substrate, as well as such a device A method for placing at least one component provided with connection points on a substrate. First, positions of the connection points are determined, after which the component is positioned at desired positions on the substrate with the connection points thereof. Up... | 11/06/2012 |
| 8295585 | Method for determining the position of an object in space A method for determining the position of an object (1) in space is described, in which measurement characteristics (4) of the object (1) are recorded with an optical recording device (3) calibrated to a space coordinate system (5),... | 10/23/2012 |
| 8295586 | Position detecting method and position detecting apparatus in consideration of non-pinhole characteristic of a camera A position detection method and a position detection device for detecting with sufficient accuracy the position or the attitude of an object by using an image of the object captured by a single camera. The position detection method detects the position or the attitu... | 10/23/2012 |
| 8275191 | Image processing apparatus and method for generating coordination calibration points The invention provides an image processing apparatus for generating coordination calibration points. The image processing apparatus includes a subtracting module, an edge detection module and an intersection point generation module. The subtracting module subtracts ... | 09/25/2012 |
| 8244024 | Method and apparatus for guiding placement of vehicle service fixtures A machine vision system is configured to facilitate placement of a vehicle service apparatus relative to an associated vehicle. The machine vision system is configured to utilize images of optical targets received from one or more cameras to guide the placement of t... | 08/14/2012 |
| 8233700 | Solder printing inspection apparatus and component mounting system A component mounting system includes a solder printing inspection apparatus and a component mounting apparatus. The solder printing inspection apparatus includes an ideal solder position generation unit, an ideal loading position generation unit, an image processing... | 07/31/2012 |
| 8224063 | Inspection apparatus and inspection method An inspection apparatus and method for precisely detect an amount of misalignment of a component mounted on a panel through an adhesive which contains conductive particles. The inspection apparatus detects an amount of misalignment, from a predetermined mounting pos... | 07/17/2012 |
| 8204298 | Focusing method and apparatus Methods and apparatus for placing wafers axially in an optical inspection system. A “best worst” focus method includes a series of through-focus images of a test wafer acquired using full field of view of the inspection optics. The value of the worst quality in ... | 06/19/2012 |
| 8198906 | Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The i... | 06/12/2012 |
| 8094925 | Method for increasing the accuracy of the positioning of a first object relative to a second object A method is provided for increasing the accuracy of the positioning of a first object relative to a second object. The method overcomes the disadvantageous influence of thermal drift between a first and a second object during a positioning of a first object on a sec... | 01/10/2012 |
| 8090192 | Pattern misalignment measurement method, program, and semiconductor device manufacturing method A pattern misalignment measurement method includes acquiring an inspection image of a composite pattern formed by superposing a plurality of kinds of element patterns on each other, acquiring reference images of at least two kinds of element patterns from reference ... | 01/03/2012 |
| 8068664 | Component sensor for pick and place machine using improved shadow imaging A method of sensing a component held by a nozzle of a pick and place machine is provided. The method includes engaging a source of illumination and recording a reference background image when no component is held by the nozzle. Then, a component is adhered to the no... | 11/29/2011 |
| 8050490 | Method for inspecting overlay shift defect during semiconductor manufacturing and apparatus thereof A method of inspecting for overlay shift defects during semiconductor manufacturing is disclosed. The method can include the steps of providing a charged particle microscopic image of a sample, identifying an inspection pattern period in the charged particle microsc... | 11/01/2011 |
| 8045790 | Method for automatically de-skewing of multiple layer wafer for improved pattern recognition A method for processing wafers includes learning a first pattern at a de-skew site on a first wafer layer, saving the first patterns in a recipe for de-skewing wafers, learning a second pattern at the de-skew site a second wafer layer, and saving the second pattern ... | 10/25/2011 |
| 8009896 | Coplanarity inspection device for printed circuit boards A coplanarity inspection device for a printed circuit board includes a base, a supporting disk, a driver, a printed circuit board, a light source, an image acquisition means, and a controller. The supporting disk is arranged on the base, and the driver rotates the s... | 08/30/2011 |
| 7995833 | Method of alignment for efficient defect review An inspection system includes a SEM visual inspection apparatus for detecting a defect in a semiconductor sample in steps of manufacturing a semiconductor device and a review apparatus for observing, at a high resolution, the defect in the semiconductor sample detec... | 08/09/2011 |
| 7991218 | Pattern matching apparatus and semiconductor inspection system using the same Solving means is configured of a signal input interface, a data calculation unit, and a signal output interface. The signal input interface allows image data which is obtained by photographing hole patterns, and CAD data which corresponds to hole patterns included i... | 08/02/2011 |
| 7991219 | Method and apparatus for detecting positions of electrode pads A method for detecting positions of a plurality of electrode pads of semiconductor chips formed on a semiconductor wafer includes: setting an imaging target region greater than a semiconductor chip on the semiconductor wafer; performing split imaging so as to entire... | 08/02/2011 |
| 7983472 | Position detecting method A method detects a position of a mark based on an image signal of the mark. The method includes steps of obtaining a first position of the mark by performing a first process for the image signal, extracting plural feature values from the image signal based on the fi... | 07/19/2011 |
| 7945087 | Alignment of printed circuit board targets A method for micromachining a material, including configuring an optical system to provide illumination of an illumination wavelength to a site via a given element of the optical system, the illumination generating returning radiation from the site. The method furth... | 05/17/2011 |
| 7925076 | Inspection apparatus using template matching method using similarity distribution An inspection apparatus performing template matching of a search image capable of outputting a correct matching position even if a pattern similar to a template exists in the search image is provided. The inspection apparatus includes a template cutout means for cut... | 04/12/2011 |
| 7894659 | Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer Methods for identifying an edge of a care area for an array area formed on a wafer and/or for binning defects detected in the array area are provided. One method for identifying an edge of a care area for an array area formed on a wafer includes determining a value ... | 02/22/2011 |
| 7894660 | Image processing alignment method and method of manufacturing semiconductor device An alignment mark is arranged to be within an image screen and the alignment mark is formed with rectangular patterns having varied dimensions from each other. The signal waveforms from each of the rectangular patterns are measured. The number of the rectangular pat... | 02/22/2011 |
| 7873206 | Registration detection system A registration detection system performing registration-detecting each substrate in a lot without lowering an original throughput of a lithography system and maintaining high accuracy usable for the correction of an exposure process. Therefore, registration detectio... | 01/18/2011 |
| 7844103 | Microscopic inspection apparatus for reducing image smear using a pulsed light source and a linear-periodic superpositioned scanning scheme to provide extended pulse duration, and methods useful therefor An automated optical inspection system includes a pulsed light source illuminating an article to be inspected thereby to generate at least one image thereof, at least one camera having a field of view, and a relative motion provider operative to provide relative mot... | 11/30/2010 |
| 7817846 | Method of correcting bonding coordinates using reference bond pads A method of correcting bonding coordinates according to locations of a die and leads loaded for bonding is provided. The method includes searching for locations of die recognition areas and lead recognition areas, comparing the detected locations of the recognition ... | 10/19/2010 |
| 7813542 | Wafer aligning apparatus and related method Embodiments of the invention provide a wafer aligning apparatus and a wafer aligning method. In one embodiment, the wafer aligning apparatus comprises an imaging unit adapted to take an image of a wafer being transferred from a load lock chamber to a transfer chambe... | 10/12/2010 |
| 7809181 | Pattern inspection apparatus, image alignment method, displacement amount estimation method, and computer-readable recording medium with program recorded thereon A pattern inspection apparatus includes a first unit configured to acquire an optical image of pattern, a second unit configured to generate a reference image to be compared, a third unit configured to calculate elements of a normal matrix for a least-squares method... | 10/05/2010 |
| 7804994 | Overlay metrology and control method An overlay method for determining the overlay error of a device structure formed during semiconductor processing is disclosed. The overlay method includes producing calibration data that contains overlay information relating the overlay error of a first target at a ... | 09/28/2010 |
| 7760931 | Apparatus and method for measuring at least one of arrangement and shape of shots on substrate, exposure apparatus, and device manufacturing method An apparatus for measuring at least one of an arrangement and shape of shots formed on a substrate, comprises a scope configured to obtain an image of an alignment mark corresponding to a shot; and a calculating device configured to calculate a difference between a ... | 07/20/2010 |
| 7734084 | Method and system for offset estimation and alignment A method for determining an offset vector. The method includes obtaining an image of a first feature. An image of a second feature is also obtained. Also, a combination image of the first feature and the second feature is obtained. A plurality of composite images is... | 06/08/2010 |
| 7724942 | Optical aberration correction for machine vision inspection systems A high-accuracy optical aberration correction system and method. Z-heights determined by an auto-focus tool, which would otherwise vary depending on the orientation angle of surface features or edges in the focus region of interest, and on the location of the focus ... | 05/25/2010 |
| 7711178 | Pattern inspection method and its apparatus A pattern inspection method including: sequentially imaging plural chips formed on a substrate; selecting a pattern which is suitable for calculating position gap between an inspection image of a subject chip and reference image stored in memory from an image of a f... | 05/04/2010 |
| 7672502 | Substrate positioning device, substrate positioning method and program Noise reduction processing for detecting the circumferential edge of a wafer W placed on a rotary stage with a light-transmitting sensor, obtaining detection values provided by the light-transmitting sensor as substrate edge shape data, detecting sudden abnormal dat... | 03/02/2010 |
| 7664312 | Information input and output method using dot pattern Making a dot pattern so that misalignment in a x direction and a y direction is alternately generated for every adjacent information dots on a virtual grid line, the misalignment is alternately generated in the x direction and the y direction for each dot and this r... | 02/16/2010 |
| 7634128 | Stereoscopic three-dimensional metrology system and method A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from tw... | 12/15/2009 |
