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| Number | Title | Issue Date |
| 8144972 | Manufacturing method of printed circuit board and manufacturing apparatus for the same The present invention relates to a method for manufacturing a printed circuit board and an apparatus for manufacturing the same; and, more particularly, to a method for manufacturing a printed circuit board and an apparatus for manufacturing the same capable of impr... | 03/27/2012 |
| 8144973 | Multi-modal imaging A method for scanning a surface with a number of different illumination configurations, the method comprises capturing a plurality of images in a sequential manner during a single sweep, each image including one or more lines of pixels, sequentially altering an illu... | 03/27/2012 |
| 8111901 | Apparatus and method for separating a circuit pattern into multiple circuit patterns A method for separating an original circuit pattern to be printed on a wafer, into multiple circuit patterns is disclosed. Simulation to obtain an image log-slope (ILS), normalized image log-slope (NILS), or any other characteristic of an image quality on edges of p... | 02/07/2012 |
| 7869645 | Image capture and calibratiion Embodiments of the present invention enable image capture and validation. Certain applications of the present invention are its use in various embodiments of a system for inspection of a printed circuit board (“PCB”) substrate. In embodiments, an image capture s... | 01/11/2011 |
| 7869644 | Methods of and apparatus for inspecting substrate Inspection apparatus are used to inspect a substrate as solder is printed, components are mounted and the substrate is heated for a soldering process. Images of the substrate are taken both before and after a production process such as the component mounting process... | 01/11/2011 |
| 7822261 | Board inspecting apparatus, its parameter setting method and parameter setting apparatus For each teaching image, a plurality of patterns of color pickup regions each include a first region for picking up a color of a first part and a second region for picking up a color of a second part are set, the color of each pixel in the first region and the color... | 10/26/2010 |
| 7751611 | Apparatus for inspecting appearance of inspection piece An appearance inspection apparatus for inspecting a board is provided with multiple imaging units for capturing respective images of the board. Multiple slave personal computers respectively provided for the multiple imaging units inspect the board by referring to d... | 07/06/2010 |
| 7734083 | Printed board, image pickup apparatus and camera The present invention relates to a bendable printed board, an image pickup apparatus, and a camera. The bendable printed board is provided with: a first end connected to a moving body movable in an arbitral direction within a predefined plane; a second end connected... | 06/08/2010 |
| 7724941 | Defect analysis place specifying device and defect analysis place specifying method A defect analysis place specifying device for specifying defect analysis places from an inspection result of produced printed wiring boards in an electronic part mounting device for mounting parts on the printed wiring boards through plural steps, including an accep... | 05/25/2010 |
| 7676078 | Inspection method, processor and method for manufacturing a semiconductor device An inspection method for an illumination optical system of an exposure tool includes coating a surface of an exposure target substrate with a resist film; placing a plurality of imaging components deviating from an optical conjugate plane of a surface of the resist ... | 03/09/2010 |
| 7606410 | Miniaturized imaging module construction technique A method of constructing an image reader module and the image reader are described. The image reader module includes two or more circuit boards in a stacked configuration. Corresponding notches for receiving supports are formed along adjacent edges of the boards, wh... | 10/20/2009 |
| 7590279 | Appearance inspection apparatus for inspecting inspection piece A first imaging unit and a second imaging unit of an appearance inspection apparatus for inspecting a board scan one surface of the board by being moved relative to the board. A third imaging unit and a fourth imaging unit are provided opposite to the first imaging ... | 09/15/2009 |
| 7519216 | Systems and methods of maintaining equipment for manufacturing semiconductor devices Disclosed is a method of operating a manufacturing facility. A processor detects whether abnormal first image data exists at a first common location for each of the last N wafers of the first set of wafers to be placed on a platform, excluding any abnormal image dat... | 04/14/2009 |
| 7483561 | Miniaturized imaging module construction technique A method of constructing an image reader module and the image reader are described. The image reader module includes two or more circuit boards in a stacked configuration. Corresponding notches for receiving supports are formed along adjacent edges of the boards, wh... | 01/27/2009 |
| 7428326 | Method for improving reliability in a component placement machine by vacuum nozzle inspection The present invention features a method whereby each vacuum nozzle in a multi-spindle component placement machine is inspected placement cycle. This process also allows for updating calibration of the nozzle position as well as immediate feedback regarding the condi... | 09/23/2008 |
| 7428328 | Method of forming a three-dimensional image of a pattern to be inspected and apparatus for performing the same In a method and apparatus for forming a three-dimensional image for an inspection pattern, a reference intensity function of an inspection X-ray is formed in accordance with a continuous scanning depth, and is differentiated with respect to the scanning depth. The d... | 09/23/2008 |
| 7424145 | Device and method for inspecting photomasks and products fabricated using the same An inspection device for photomasks and products fabricated using the same, capable of reducing the time from inspection to repair. A reference data generator generates reference data that is based on design data and includes sensitivity class codes that differentia... | 09/09/2008 |
| 7410737 | System and method for process variation monitor A method to extend the process monitoring capabilities of a semiconductor wafer optical inspection system so as to be able to detect low-resolution effects of process variations over the surface of a wafer at much higher sensitivity than heretofore possible. The met... | 08/12/2008 |
| 7406191 | Inspection data producing method and board inspection apparatus using the method After a CAD data and a parts library are combined to produce an inspection data, the set data for the inspection window is automatically corrected using the image of a bare board for a board to be inspected. In this correcting process, an inspection window based on ... | 07/29/2008 |
| 7372632 | Apparatus and methods for the inspection of microvias in printed circuit boards An imaging method and imaging system for inspecting features located at a known inter-feature pitch on portions of a target surface. The system includes a lens array having a plurality of lenses wherein the lenses of the lens array have an inter-lens pitch and an in... | 05/13/2008 |
| 7369276 | Multi-level halftoning providing improved texture uniformity A method for multi-level halftoning an input digital image to form an output digital image which includes a multi-level error diffusion halftoning process incorporating periodic dither signals whose amplitudes are adjusted as a function of the error-diffusion textur... | 05/06/2008 |
| 7366343 | Pattern inspection method and apparatus A pattern inspection method and a pattern inspection apparatus, which has an improved precision in detecting and correcting the positional deviation of images for a die comparison, have been disclosed. The quantity of correction of positional deviation of the images... | 04/29/2008 |
| 7365837 | Vision inspection apparatus using a full reflection mirror The present invention relates to a vision inspection apparatus and method using total reflection mirrors. The present invention provides a vision inspection apparatus using the total reflection mirrors comprising; a board position control module for fixing a printed... | 04/29/2008 |
| 7366321 | System and method for performing automated optical inspection of objects A system and method for performing optical inspection are provided. At least one “invariant feature” of an object design is determined, and such invariant feature is used in inspecting objects having the corresponding design. An “invariant feature” is a feat... | 04/29/2008 |
| 7363102 | Method and apparatus for precise marking and placement of an object The present invention provides a precise marking apparatus for performing precise marking on an object and methods of using the same. The precise marking apparatus comprises an object input handler and an object output handler for handling the object; a transport sy... | 04/22/2008 |
| 7359070 | Multi-function peripheral with camera A multi-function peripheral device for producing output images. The device includes a scanning system for creating a scanned input image, a camera for creating a captured input image, a controller for receiving at least one of said scanned input image and said captu... | 04/15/2008 |
| 7359043 | Pattern inspecting method and pattern inspecting apparatus A pattern inspecting method, comprising preparing a sample having a first and a second inspection regions and an imaging device having a plurality of pixels, scanning the first inspection region to a first direction using the imaging device to obtain a first measure... | 04/15/2008 |
| 7359544 | Automatic supervised classifier setup tool for semiconductor defects Disclosed are methods and apparatus for efficiently setting up and maintaining a defect classification system. In general terms, the setup procedure optionally includes automatically grouping a set of provided defects and presenting a representative set from each de... | 04/15/2008 |
| 7340084 | Quality assessment of product in bulk flow A method is disclosed for generating data relating to the quality of product in a bulk stream product during its passage through a monitoring station. An inspection of at least a portion of product in the monitoring station is conducted at intervals while the stream... | 03/04/2008 |
| 7336816 | Method and apparatus for measuring shape of bumps The present invention provides a bump shape measuring apparatus comprising an illumination optical system which illuminates bumps arranged on a board with illumination light of a low tilt angle to a surface of the board; a detection optical system where reflected li... | 02/26/2008 |
| 7336814 | Method and apparatus for machine-vision A system and method facilitate machine-vision, for example three-dimensional pose estimation for target objects, using one or more images sensors to acquire images of the target object at one or more positions, and to identify features of the target object in the re... | 02/26/2008 |
| 7334171 | Test pattern generating apparatus, circuit designing apparatus, test pattern generating method, circuit designing method, test pattern generating program and circuit designing program A test pattern generating apparatus comprises a circuit data read in section 11 that divides circuit data into a plurality of functional blocks, a correspondence setting up table preparing section 12 that sorts the plurality of functional blocks into t... | 02/19/2008 |
| 7324685 | Inspection systems and methods In one embodiment, a system comprises logic configured to identify a tip of a pin that has been press fit into a circuit board, logic configured to measure characteristics that pertain to a flat end surface and a chamfered surface of the identified pin tip, logic co... | 01/29/2008 |
| 7322745 | Single boom cargo scanning system The inspection methods and systems of the present invention are mobile, rapidly deployable, and capable of scanning a wide variety of receptacles cost-effectively and accurately on uneven surfaces. The present invention is directed toward a portable inspection syste... | 01/29/2008 |
| 7320928 | Method of forming a stacked device filler Numerous embodiments of a stacked device filler and a method of formation are disclosed. In one embodiment, a method of forming a stacked device filler comprises forming a material layer between two or more substrates of a stacked device, and causing a reaction in a... | 01/22/2008 |
| 7317522 | Verification of non-recurring defects in pattern inspection A system and method for verifying defects in electrical circuit patterns including supplying a plurality of like electrical circuit patterns to a defect verification assembly after identification of candidate defects at an automated inspection assembly; verifying se... | 01/08/2008 |
| 7315641 | Pattern correcting method of mask for manufacturing a semiconductor device and recording medium having recorded its pattern correcting method A pattern correcting method of a mask for manufacturing a semiconductor device includes extracting a correction portion to be corrected from a mask pattern on the mask, obtaining a surrounding environment of the correction portion and giving a correction amount to t... | 01/01/2008 |
| 7304730 | Inspection apparatus having two sensors, method for inspecting an object, and a method for manufacturing a photolithography mask A photolithography mask inspection apparatus has at least two sensors. One sensor is configured to sense light transmitted through an object to be inspected, and the other sensor senses light reflected off the object. A first optical system is arranged to expose a f... | 12/04/2007 |
| 7301620 | Inspecting apparatus, image pickup apparatus, and inspecting method An inspecting apparatus includes an illuminating optical system which irradiates irradiation light onto an object to be inspected, an object placing stage which moves the object along a first direction, an accumulative sensor which converts a transmitted image of th... | 11/27/2007 |
| 7295695 | Defect detection via multiscale wavelets-based algorithms A method of detecting a defect in a reticle or wafer uses wavelet transforms to differentiate between real defects and pattern noise. A first image and a second image of a sample are aligned. A wavelet transform is obtained of the difference between the images. The ... | 11/13/2007 |
