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| Number | Title | Issue Date |
| 8184898 | Analysis of leaded components A system to facilitate analysis of component leads is provided and includes a device to form a picture of the leads, from which an image is extracted, to apportion the image and to perform first and second scans of the portions, and a processor, including a memory u... | 05/22/2012 |
| 7539339 | Part recognition data creation method and apparatus, electronic part mounting apparatus, and recorded medium It is an object of the present invention to provide a parts recognition data preparing method and a preparing device and an electronic parts mounting device and a recording medium, which are capable of preparing parts recognition data, which are set to respective el... | 05/26/2009 |
| 7352892 | System and method for shape reconstruction from optical images Reconstructing the shape of the surface of an object in greater than two dimensions is performed using a noise-tolerant reconstruction process and/or a multi-resolution reconstruction process. The noise-tolerant reconstruction process can be a Bayesian reconstructio... | 04/01/2008 |
| 7337939 | Bonding apparatus A bonding apparatus is constituted by a bonding tool, a substrate stage, a moving mechanism for moving the bonding tool and the substrate stage, an up-and-down mechanism for moving up and down said bonding tool, and a chip recognition camera. The bonding apparatus i... | 03/04/2008 |
| 7340085 | Rotating prism component inspection system An inspection system is provided. The system includes a rotating prism having a first end and a second end. The first end receives a first image area, such as a circular view, and rotates about a center point so as to cover a field of view area that is larger than t... | 03/04/2008 |
| 7330606 | Method and system for extracting data from surface array deposited features A method for evaluating an orientation of a molecular array having features arranged in a pattern. An image of the molecular array is obtained by scanning the molecular array to determine data signals emanating from discrete positions on a surface of the molecular a... | 02/12/2008 |
| 7324685 | Inspection systems and methods In one embodiment, a system comprises logic configured to identify a tip of a pin that has been press fit into a circuit board, logic configured to measure characteristics that pertain to a flat end surface and a chamfered surface of the identified pin tip, logic co... | 01/29/2008 |
| 7251348 | Land appearance inspecting device, and land appearance inspecting method Land circle calculating means (7) calculates a land circle as an approximate circle from label information (S6). Land circle accuracy-enhancing means (8) calculates again the land circle by changing a mask angle if land circle candidate informat... | 07/31/2007 |
| 7242801 | Image preprocessing for probe mark inspection Digital image processing methods are applied to an image of a semiconductor interconnection pad to preprocess the image prior to an inspection or registration. An image of a semiconductor pads exhibiting spatial patterns from structure, texture or features are filte... | 07/10/2007 |
| 7236624 | Mark for visual inspection upon assembling a display In the neighborhood of each connecting region of a panel substrate, tape automated bonding (TAB) substrates, and a flexible substrate, marks for a visual inspection are provided at a preset distance apart from the connecting region. According to the present marks, i... | 06/26/2007 |
| 7231081 | Stereoscopic three-dimensional metrology system and method A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from tw... | 06/12/2007 |
| 7218771 | Cam reference for inspection of contour images This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more than two different types of regions and an analysis subsystem for analy... | 05/15/2007 |
| 7201802 | Apparatus for providing a substrate with viscous medium Solder paste application, inspection and correction. Following or during application of solder paste on a substrate, the result thereof is inspected and any detected errors are registered. Following an evaluation as to whether correction of these errors is required ... | 04/10/2007 |
| 7190393 | Camera with improved illuminator An illumination and imaging system is provided with a co-axial illuminator that does not include a beamsplitter. The co-axial illuminator achieves efficiencies substantially in excess of those achieved with a beamsplitter. In one aspect, an optical stop is used to r... | 03/13/2007 |
| 7171036 | Method and apparatus for automatic measurement of pad geometry and inspection thereof An image of a semiconductor interconnection pad is analyzed to determine a geometric description of the zone regions of a multiple zone semiconductor interconnection pad. Edge detection machine vision tools are used to extract features in the image. The extracted fe... | 01/30/2007 |
| 7164496 | Image correction apparatus The image correction apparatus includes an image reading unit for reading a print image of an original image, where a mark is given to a defect on an image and an image correction unit for correcting image data of the original image by utilizing the position of the ... | 01/16/2007 |
| 7154596 | Method and apparatus for backlighting and imaging multiple views of isolated features of an object Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconduc... | 12/26/2006 |
| 7142718 | Fast pattern searching An accumulation transformation method for fast pattern search accurately locates general patterns of interest. The method can be used for fast invariant search to match patterns of interest in images where the searched pattern varies in size or orientation or aspect... | 11/28/2006 |
| 7142301 | Method and apparatus for adjusting illumination angle A machine-vision system that provides quick changing and/or automatic adjustment of illumination angle, dispersion, intensity, and/or color of illumination. One such system includes a light source emitting polarized light, a machine-vision imager, an image processor... | 11/28/2006 |
| 7139441 | Image processing device performing inclination correcting processing An image processing device extracts resolution data from an input image data, and executes resolution converting processing on the input image data to provide longitudinal and lateral resolutions equal to each other when the longitudinal and lateral resolutions are ... | 11/21/2006 |
| 7079679 | Image processing apparatus In an image processing system, a subject object 210 is placed on top of an object support 220 on a calibration object 34 having a known pattern of features thereon. Images recorded at different positions and orientations are processed to generat... | 07/18/2006 |
| 7076094 | Method and apparatus for detecting position of lead of electric component, and electric-component mounting method A method of detecting a position of a lead of an electric component which additionally includes a body from which the lead extends, the method including the steps of illuminating a lengthwise limited portion of the lead, with a light incident thereto in a direction ... | 07/11/2006 |
| 7072502 | Alternating phase-shift mask inspection method and apparatus A reticle inspection system and method for complete and fast inspection of phase shift mask reticles, both for incoming inspection and for periodic and pre-exposure inspection tool, is employable by facilities such as mask shops as an inspection tool compatible to t... | 07/04/2006 |
| 7062080 | Method of inspecting curved surface and device for inspecting printed circuit board A circuit board with lead-free solder is inspected by using light sources with different colors at different angles to obtain an image having a plurality of color components. For each pixel within an area in the obtained image, the brightness of a white component ge... | 06/13/2006 |
| 7058216 | Apparatus for detecting lead coplanarity, apparatus for detecting condition of electronic component, and system for mounting electronic component An apparatus for detecting a coplanarity of a plurality of leads of an electronic component that laterally extend from a main body thereof, including a holding device which holds the main body of the electronic component at an upper surface of the main body, an imag... | 06/06/2006 |
| 7050623 | Method and apparatus for component recognition Adjustment of image pickup conditions through alternative selection of two cameras different in resolution, adjustment of image lightness of a to-be-recognized component based on component information of the component, and performing control allows an image of the c... | 05/23/2006 |
| 7046837 | System and method for locating irregular edges in image data A system for processing image data, such as an image of a die cut from a silicon wafer, is provided. The system includes an irregular edge detection system, which can locate edge data of a feature of the image data, such as the edge of a probe mark in a bond pad. A ... | 05/16/2006 |
| 7027637 | Adaptive threshold determination for ball grid array component modeling A method for determining a number of balls in a projection space comprises determining a projection of a portion of a ball grid array, determining at least one local maximum of the projection space for a given threshold, and determining at least a distance between a... | 04/11/2006 |
| 7027640 | Method and apparatus for inspecting defects on polishing pads to be used with chemical mechanical polishing apparatus The present invention provides an apparatus and method for detecting or inspecting defects on a polishing pad for use in performing chemical mechanical polishing of a wafer. The apparatus for detecting the defects on the pad comprises a pad driving device for loadin... | 04/11/2006 |
| 6999632 | Image processing apparatus, image forming apparatus and image processing method Disclosed is an image processing apparatus including an enhancement amount calculation unit for calculating a density enhancement amount for each edge pixel, which is a pixel in an edge area of an image, an enhancement amount increasing unit for increasing the densi... | 02/14/2006 |
| 6990227 | Method for printed circuit board inspection This invention discloses a method for printed circuit board (PCB) inspection, including providing a multiplicity of PCBs placed on an inspection panel, defining each non-identical PCB in terms of geometry and features which are to be inspected, grouping the PCBs int... | 01/24/2006 |
| 6990226 | Pattern recognition method A method includes setting lead eye boxes and lead eye points on a gate and a support bar of a lead frame, before clamping the lead frame, and determining whether or not the lead frame is seated in an exact first position. The lead eye boxes and the lead eye points a... | 01/24/2006 |
| 6987875 | Probe mark inspection method and apparatus A method and apparatus for inspection of probe marks made on the interconnection lands of semiconductor devices using machine vision is disclosed. An image of an interconnection land is analyzed, and features of the image that may constitute indicia of probe marks a... | 01/17/2006 |
| 6980687 | Chip inspecting apparatus and method A method and apparatus for inspecting chips formed as a fine pattern on a surface of an object to be inspected, in which one visual field of an optical observation system is divided into a plurality of areas. A plurality of predetermined good chips are arranged sequ... | 12/27/2005 |
| 6970590 | Side lit, 3D edge location method Apparatus and a method for locating edges of a part for acceptance testing of the part. A white light source (12) illuminates the part which is mounted on a support (14) and rotated relative to the light source. Light reflected by the part creates an o... | 11/29/2005 |
| 6963338 | Method for refining geometric description models using images The creation of accurate geometric description-based models of objects in a machine vision system can be performed in a computer-assisted process. A rough model of an image of an object forms the basis of the model. The model is refined through the application of ma... | 11/08/2005 |
| 6956963 | Imaging for a machine-vision system Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconduc... | 10/18/2005 |
| 6954681 | Board align image acquisition device with improved interface An electronics assembly system includes an image acquisition system that is coupled to a controller through an improved interface. The coupling facilitates advanced monitoring and control of the image acquisition system. Multiple image acquisition systems can be cou... | 10/11/2005 |
| 6952491 | Optical inspection apparatus for substrate defect detection A method and apparatus for inspecting the surface of articles, such as chips and wafers, for defects, includes a first phase of optically examining the complete surface of the article inspected at a relatively high speed and with a relatively low spatial resolution,... | 10/04/2005 |
| 6950548 | Creating geometric model descriptions for use in machine vision inspection systems A method and system create a geometric object model for use in machine vision inspection. A pixel image representation of an object is acquired. Based on this pixel image representation, part models for the parts of the object are generated. Each part model correspo... | 09/27/2005 |
