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| Number | Title | Issue Date |
| 8189901 | Seed sorter The present disclosure provides systems and methods for sorting seeds based on identified phenotypes of the seeds. In various embodiments, the system includes an optics and controller station structured and operable to collect image data of a top portion, a bottom p... | 05/29/2012 |
| 8189902 | Creating an XY image pattern on a rotating substrate Various embodiments of the present invention are generally directed to a method and apparatus for transferring an XY image to a rotating substrate, such as a semiconductor substrate, storage medium, etc. An XY image pattern comprising a plurality of image elements i... | 05/29/2012 |
| 8184896 | Methods of determining quality of a light source Methods for determining a quality of a light source applied to a photolithographic process are provided. An image sensor array is exposed to a light from a light source. Addresses and respective intensities corresponding to a plurality of locations on a pupil map re... | 05/22/2012 |
| 8180138 | Method and system for inspection of containers A method and system for reconstructing and segmenting an image of the contents of a container. The method includes receiving actual scan data from a scan of the container, reconstructing the actual scan data to obtain a reconstructed image, and segmenting the recons... | 05/15/2012 |
| 8180139 | Method and system for inspection of containers A method and system for producing images of at least one object of interest in a container. The method includes receiving three-dimensional volumetric scan data from a scan of the container, reconstructing a three-dimensional representation of the container from the... | 05/15/2012 |
| 8170323 | Card shoe with card block A playing card delivery shoe is used in the play of the casino table card game of baccarat or blackjack or any game where cards are pulled one at a time from the shoe. The apparatus comprises a reader or an imager that scans lines bisecting the image at spaced inter... | 05/01/2012 |
| 8170322 | Optical imaging system and method using a reflective background A system for obtaining an image of an object using an optical imager having an illumination source that is positioned on one side of the object to be imaged and a reflective background positioned on the other side of the object. The imaging system may be implemented... | 05/01/2012 |
| 8165382 | Glazing inspection method Methods of determining the divergence angle between a primary image and a secondary image generated by a glazing are disclosed. In a first method, a glazing is illuminated with a light source and a primary and a secondary image of the light source, generated by the ... | 04/24/2012 |
| 8155426 | Inspection of wood surface roughness The invention relates to a method for optical inspection of the hirsuteness of a surface. The method comprises directing a light beam (B) to the surface (2) of a wooden piece (1) under study in a direction (D), which deviates from the normal to the sur... | 04/10/2012 |
| 8150140 | System and method for a semiconductor lithographic process control using statistical information in defect identification A system and method is described for evaluating a wafer fabrication process for forming patterns on a wafer based upon data. Multiple inspection regions are defined on the wafer for analysis. For each inspection region, images of patterns within the inspection regio... | 04/03/2012 |
| 8144967 | Mask data generation method, mask fabrication method, exposure method, device fabrication method, and storage medium The invention provides a generation method of generating data of a mask, comprising a calculation step of calculating an aerial image formed on an image plane of a projection optical system, an extraction step of extracting a two-dimensional image from the aerial im... | 03/27/2012 |
| 8144968 | Method and apparatus for scanning substrates A method and apparatus for scanning and acquiring 3D profile line data of an object, illustratively for use in an optical inspection system. A 3D scanning subsystem is provided in relative movement to the object being scanned. The subsystem is capable of simultaneou... | 03/27/2012 |
| 8139841 | Visual inspection method and apparatus and image analysis system An image feature is calculated based on the image of a detected defect, a coordinate feature is calculated based on position coordinates of the detected defect, and false alarm judgment is performed according to a decision tree constructed by threshold processing to... | 03/20/2012 |
| 8139842 | Device and method for inspecting rechargeable battery connection structure An inspection apparatus for inspecting a rechargeable battery electrode plate-connected structure to check whether electrode plates are properly connected to a current collector plate by filters. The apparatus includes an imaging device arranged on one side of the r... | 03/20/2012 |
| 8139840 | Inspection system and method for high-speed serial data transfer An inspection system and method for serial high-speed image data transfer is provided herein. According to one embodiment, the method may include receiving multiple channels of image data at an input data rate and buffering the image data at the input data rate unti... | 03/20/2012 |
| 8135204 | Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe are provided. One method includes separating defects into bins based on regions in which the defects are located... | 03/13/2012 |
| 8135205 | Rapid matching of noisy spectra or other signal patterns A method for use in an object scanning process includes obtaining a reference spectrum that includes a plurality of reference peaks, and comparing the reference spectrum with an input spectrum that has a plurality of input peaks, wherein a number of the reference pe... | 03/13/2012 |
| 8131056 | Constructing variability maps by correlating off-state leakage emission images to layout information Improved techniques are disclosed for monitoring or sensing process variations in integrated circuit designs. Such techniques provide such improvements by constructing variability maps correlating leakage emission images to layout information. By way of example, a m... | 03/06/2012 |
| 8131055 | System and method for assembly inspection A method for assembly inspection is disclosed. The system may include obtaining a digital image of an assembled product, extracting images of one or more objects from the digital image of the assembled product, and recognizing each of the one or more objects as a co... | 03/06/2012 |
| 8126254 | Measurement device for measuring the parameters of a blade rotor The invention relates to a measurement device for measuring the parameters of a blade rotor and a measurement process for measuring with said device, consisting of an element (1) in which at least one high speed camera (2) and a light beam emitter (... | 02/28/2012 |
| 8126255 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions Various systems and methods for creating persistent data for a wafer and using persistent data for inspection-related functions are provided. One system includes a set of processor nodes coupled to a detector of an inspection system. Each of the processor nodes is c... | 02/28/2012 |
| 8126253 | Automatically determining machine vision tool parameters A method for automatically determining machine vision tool parameters is presented, including: marking to indicate a desired image result for each image of a plurality of images; selecting a combination of machine vision tool parameters, and running the machine visi... | 02/28/2012 |
| 8121386 | Secure article, notably a security and/or valuable document A secure article, notably a security and/or valuable document, comprising at least one substrate, at least one visible authenticating structure, at least one inspection zone defined at least partly by the authenticating structure, the authenticating structure delimi... | 02/21/2012 |
| 8121388 | Device and method for automatically determining the individual three-dimensional shape of particles A method for automated determination of an individual three-dimensional shape of particles includes: a) dosing, alignment, and automated delivery of the particles; b) observation of the aligned particles and image acquisition, and c) evaluation of the images. A devi... | 02/21/2012 |
| 8121391 | Device for measuring the thickness of printed products An apparatus for measuring a thickness of a printed product conveyed in a conveying direction at a conveying speed. The apparatus includes a conveying device having a guide arrangement along which the printed product is conveyed at the conveying speed in the conveyi... | 02/21/2012 |
| 8121387 | Mask pattern verifying method A mask pattern verifying method include obtaining first information about a hot spot from design data of a mask pattern, obtaining second information about the mask pattern actually formed on a photo mask, and determining a measuring spot of the mask pattern actuall... | 02/21/2012 |
| 8121390 | Pattern inspection method, pattern inspection apparatus and semiconductor device manufacturing method A pattern inspection method includes scanning a substrate on which patterns are formed with a charged beam, detecting a charged particle generated from the surface of the substrate, and then acquiring an image of the patterns; comparing the image of the patterns wit... | 02/21/2012 |
| 8121389 | System, apparatus, method and computer program product for optical position recognition A system, apparatus, method, and computer program product for evaluating an object disposed on an upper surface of an object holder. At least one first frame representing a captured portion of the object is acquired, while the object holder is positioned at each of ... | 02/21/2012 |
| 8116553 | Rotation invariant 2D sketch descriptor A system, method, and computer program for determining a descriptor, comprising calculating a maximum distance for a plurality of points in a sector between each of said plurality of points and an origin; calculating a minimal distance from one of said plurality of ... | 02/14/2012 |
| 8116555 | Vision inspection system and method for inspecting workpiece using the same A vision inspection system and a workpiece inspection method are used in inspecting a workpiece. The vision inspection system includes a level block having an upper surface whose opposite end regions are defined as a first position and a second position. A first tra... | 02/14/2012 |
| 8116552 | Apparatus for generating data for determining a property of a gemstone and methods and computer programs for determining a property of a gemstone A method of capturing data for gemstone analysis is provided. The method includes capturing images of the gemstone under differing lighting conditions, and comparing the captured images. ... | 02/14/2012 |
| 8116556 | Method and apparatus for analyzing defect data and a review system In a process for manufacturing a semiconductor wafer, defect distribution state analysis is performed so as to facilitate identification of the defect cause including a device cause and a process cause by classifying the defect distribution state according to the de... | 02/14/2012 |
| 8116554 | Two colour vision system A vision system for viewing the end face of product mounted in a machine which in use produces measurements relating to the area of the end face and of at least one constituent part of the product which is visible in the end face. The end face is illuminated by ligh... | 02/14/2012 |
| 8111899 | Substrate-check equipment A substrate-check equipment has a conveyer, at least two lamps, at least two image acquisition units and a control unit. The conveyer conveys a substrate. The lamps are mounted respectively above and below the conveyer to respectively shine light onto the substrate.... | 02/07/2012 |
| 8111898 | Method for facilitating automatic analysis of defect printability Defect printability analysis in a mask or wafer requires the accurate identification of defect images and reference (i.e. defect-free) images, in particular for a die-to-die inspection mode. A method of automatically distinguishing a reference image from a defect im... | 02/07/2012 |
| 8107717 | Defect inspection method and apparatus Arrangements for inspecting a specimen on which plural patterns are formed; capturing a first image of a first area; capturing a second image of a second area in which patterns which are essentially the same with the patterns formed in the first area; creating data ... | 01/31/2012 |
| 8107716 | Defect detecting apparatus and method A front side surface of a cover glass of a solid state imaging device is focused, and a front side image is captured. Next, a rear side surface of the cover glass is focused, and a rear side image is captured. The front side image and the rear side image are combine... | 01/31/2012 |
| 8107715 | Method and detection device for the imaging detection of a sample The invention relates to a device for detecting a sample in a longitudinal sample container (10), comprising a sample container holder (30) for holding the sample container in a housing. Said sample container holder comprises a side viewing window in t... | 01/31/2012 |
| 8107714 | Methods for detecting and tagging scene changes Methods for determining a difference between a reference scene and a test scene are provided. An automated process calculates a power of the reference scene and a power of the test scene. The difference between the power of the reference scene and the test scene det... | 01/31/2012 |
| 8103085 | System and method for detecting flaws in objects using machine vision This invention overcomes the disadvantages of the prior art by providing a system and method for flexibly detecting flaws in the acquired runtime/live images of objects based upon an inspection process that employs a training or model image of the object. This syste... | 01/24/2012 |
