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Class 378/90 - Plural diverse X-ray analysis


Subclass of Class 378 - X-ray or gamma ray systems or devices
Definition: Subject matter including some type of X-ray analysis of
No. of patents: 111
Last issue date: 11/29/2011


1      
NumberTitleIssue Date
8068583X-ray analysis apparatus and X-ray analysis method
Provided is an X-ray analysis apparatus including: an X-ray tubular bulb for irradiating a sample with a radiation beam; an X-ray detector for detecting a characteristic X-ray and a scattered X-ray and outputting a signal containing energy information on the charact...
11/29/2011
7995707X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam, with both beams active simultaneously. Cross-talk between the beams ...
08/09/2011
7809109Multiple image collection and synthesis for personnel screening
An apparatus and method for inspecting personnel or their effects. A first and second carriage each carries a source for producing a beam of penetrating radiation incident on a subject. A positioner provides for synchronized relative motion of each carriage vis-à-v...
10/05/2010
7796734Multiple image collection and synthesis for personnel screening
An apparatus and method for inspecting personnel or their effects. A first and second carriage each carries a source for producing a beam of penetrating radiation incident on a subject. A positioner provides for synchronized relative motion of each carriage vis-á-v...
09/14/2010
7649978Automated selection of X-ray reflectometry measurement locations
The computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emi...
01/19/2010
7593506Backscatter inspection portal
A system and method for inspecting an object with multiple sources of substantially coplanar penetrating radiation. Irradiation of the inspected object by the sources is temporally sequenced such that the source of detected scattered radiation is unambiguous. Thus, ...
09/22/2009
7555099X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam, with both beams active simultaneously. Cross-talk between the beams ...
06/30/2009
7551719Multifunction X-ray analysis system
Apparatus for analysis of a sample includes a radiation source, which is adapted to direct a first, converging beam of X-rays toward a surface of the sample and to direct a second, collimated beam of the X-rays toward the surface of the sample. A motion assembly mov...
06/23/2009
7529341Automatic material discrimination by using computer tomography
Method and apparatus are provided for combining information obtained from CT and Coherent Scatter Computed Tomography to better determine whether there are dangerous materials in the baggage or not. Hence, the attenuation coefficient and the diffraction pattern of t...
05/05/2009
7499523Systems and methods for identifying a substance
A method for identifying a substance is described. The method includes detecting, by a first scatter detector, a first set of scattered radiation, generating a first effective atomic number from the first set of scattered radiation, detecting, by a second scatter de...
03/03/2009
7486773Megavoltage scatter radiation measurement using beam stop array
A system may include emission of megavoltage radiation from a megavoltage radiation source, acquisition of a first image using an imaging device while first megavoltage radiation is emitted from the megavoltage radiation source and while a plurality of elements is b...
02/03/2009
7427757Large collection angle x-ray monochromators for electron probe microanalysis
X-ray monochromators and electron probe micro-analysis (EPMA) systems using such monochromators are disclosed. A turretless x-ray monochromator may have a cassette of reflectors instead of a turret. The cassette stores a plurality of reflectors that can be inserted ...
09/23/2008
7368717Density detection using real time discrete photon counting for fast moving targets
A system for detecting and graphically displaying a contents of a fast-moving target object comprises: a radiation source, having a position such that at least a portion of radiation emitted from the radiation source passes through the fast-moving target object, the...
05/06/2008
7365332Density detection using real time discrete photon counting for fast moving targets
A system for detecting and graphically displaying a contents of a fast-moving target object comprises: a radiation source, having a position such that at least a portion of radiation emitted from the radiation source passes through the fast-moving target object, the...
04/29/2008
7366374Multilayer optic device and an imaging system and method using same
An optic device, system and method for imaging are described. The optic device includes a first solid phase layer having a first index of refraction with a first photon transmission property and a second solid phase layer having a second index of refraction with a s...
04/29/2008
7356115Radiation scanning units including a movable platform
A scanning unit for inspecting objects comprises in one embodiment a radiation source to emit a beam of radiation, a rotatable platform to support an object for inspection by the beam of radiation and a detector positioned to receive radiation after interaction of t...
04/08/2008
7335887System and method for target inspection using discrete photon counting and neutron detection
Described herein is system for the inspection of a target object. The system may include a gamma radiation source, a gamma detector and an image processor coupled to the gamma detector. When the inspection system is operating in a first active mode for imaging a tar...
02/26/2008
7295650Method for operating a primary beam stop
A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron de...
11/13/2007
7272206Method and apparatus for void content measurement and method and apparatus for particle content measurement
A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention incl...
09/18/2007
7258485X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer
An X-ray thin film inspection apparatus including a sample table on which an inspection target such as a product wafer or the like is mounted, a positioning mechanism for moving the sample table, a goniometer having first and second swing arms, at least one X-ray ir...
08/21/2007
7248672Multiple-position x-ray tube for diffractometer
An x-ray source provides both a line focus output and a point focus output, and is mounted on a rotatable support to allow easy changing between the two. A housing has ports at different angular positions relative to an anode, and each port has an associated optic a...
07/24/2007
7241381Method and apparatus for detecting chemical binding
The method for screening binding between a target binder and potential pharmaceutical chemicals involves sending a solution (preferably an aqueous solution) of the target binder through a conduit to a size exclusion filter, the target binder being too large to pass ...
07/10/2007
7242747Method for determining a gsm substance and/or a chemical composition of a conveyed material sample, and a device for this purpose
A method for determining a weight per unit area and/or a chemical composition of a conveyed material sample. From the analysis of a portion of an incident ionizing radiation, in particular an X-radiation, scattered from a material sample, a detector signal correspon...
07/10/2007
7231016Efficient measurement of diffuse X-ray reflections
A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse ref...
06/12/2007
7231017Lobster eye X-ray imaging system and method of fabrication thereof
A Lobster Eye X-ray Imaging System based on a unique Lobster Eye (LE) structure, X-ray generator, scintillator-based detector and cooled CCD (or Intensified CCD) for real-time, safe, staring Compton backscatter X-ray detection of objects hidden under ground, in cont...
06/12/2007
7226239System for measuring material properties from a moving construction vehicle
A system is for sensing a property of a material mat from a construction vehicle. The system includes a sensor for sensing the material property and a positioning mechanism connected with the vehicle and with the sensor. The mechanism displaces the sensor between fi...
06/05/2007
7218704X-ray backscatter mobile inspection van
An inspection system based upon an enclosed conveyance such as a van, capable of road travel, for inspecting persons or objects. The conveyance is characterized by an enclosing body, or skin. A source of penetrating radiation and a spatial modulator for forming the ...
05/15/2007
7215737Double-radiant-source framework for container detecting system
A double-radiant-source framework used for a radiation detecting system for containers, having a horizontal accelerator, a vertical accelerator and a gantry tower composed of a left vertical girder, a right vertical girder, an upper cross girder, and a lower cross g...
05/08/2007
7184517Analytical method for determination of crystallographic phases of a sample
An analytical method for determining crystallographic phases of a measuring sample comprises the steps of acquiring a diffraction pattern of the measuring sample and qualitative phase analysis of the measured diffraction pattern, acquiring an element spectrum of the...
02/27/2007
7172340X-ray imaging apparatus and method for moving X-ray detector
An X-ray imaging apparatus includes an X-ray irradiating unit configured to irradiate an X-ray to an object, an X-ray detecting unit configured to detect the irradiated X-ray, an image creating unit configured to create X-ray image data based on data detected by the...
02/06/2007
7166838X-ray imaging for patterned film measurement
An x-ray metrology system includes an e-beam generator to cause a test sample to emit x-rays, x-ray optics for focusing the x-rays, and an x-ray imager to generate an image of the test sample from the focused x-rays. Because the x-ray imager provides a direct repres...
01/23/2007
7162005Radiation sources and compact radiation scanning systems
An X-ray source is disclosed comprising a source of high energy electrons that travel along a longitudinal path. Target material lies along the longitudinal path and X-ray radiation is generated due to impact of the high energy electrons with the target. Shielding m...
01/09/2007
7130371System for alternately pulsing energy of accelerated electrons bombarding a conversion target
A RF linear electron accelerator system for generating a beam of accelerated electrons bunched in pulses having different energy spectra from pulse to pulse. The system is operable to generate a beam of high energy X-rays from such beam of accelerated electrons, usi...
10/31/2006
7120228Combined X-ray reflectometer and diffractometer
Apparatus for analysis of a sample includes a radiation source, which is adapted to direct a converging beam of X-rays toward a surface of the sample. At least one detector array is arranged to sense the X-rays scattered from the sample as a function of elevation an...
10/10/2006
7116755Non-uniform density sample analyzing method, device and system
A non-uniform density sample analyzing method for analyzing a distribution state of particle-like matter in a non-uniform density sample, where an actually measured X-ray scattering curve is an in-plane X-ray scattering curve obtained by in-plane diffraction measure...
10/03/2006
7110493X-ray detector system having low Z material panel
A method and apparatus for detecting concealed items on or in an object by utilizing a low Z material panel. The object to be scanned is located between an x-ray detector and the low Z material panel. The method includes producing a pencil beam of x-rays from an x-r...
09/19/2006
71068303D x-ray system adapted for high speed scanning of large articles
A system for forming an image of an object. The system includes a first scanning x-ray source for generating x-rays that diverge from a source point along a first scan path, the point being variable and determined by an input signal provided by a controller. A plura...
09/12/2006
7099434X-ray backscatter mobile inspection van
An inspection system based upon an enclosed conveyance such as a van, capable of road travel, for inspecting objects of inspection that may include persons. The conveyance is characterized by an enclosing body, or skin. A source of penetrating radiation and a spatia...
08/29/2006
7092485X-ray inspection system for detecting explosives and other contraband
A baggage scanning system and method employ combined angular and energy dispersive x-ray scanning to detect the presence of a contraband substance within an interrogation volume of a baggage item. The interrogation volume is illuminated with penetrating, polychromat...
08/15/2006
7076024X-ray apparatus with dual monochromators
X-ray apparatus, consisting of a single X-ray tube which is adapted to generate X-rays and a first optic which is adapted to focus a first portion of the X-rays onto a region of a sample via a first beam path, thereby generating first scattered X-rays from the regio...
07/11/2006
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