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| Number | Title | Issue Date |
| 8073106 | Estimating strengths of wooden supports by detecting backscattered gamma rays A method of estimating the strength of a wooden support wherein gamma rays (4) are transmitted and detected parallel to a neutral axis (5) through a cross section of the support. It also includes a method of locating regions of unsound wood in a wooden... | 12/06/2011 |
| 7724872 | Inspection method for thin film stack An X-ray reflectivity measuring method is provided to measure and inspect, with higher accuracy, film thickness of a thin film stack as a sample where a thick film is provided on the thin film stack. This X-ray reflectivity measuring method can measure X-ray reflect... | 05/25/2010 |
| 7668293 | High voltage x-ray generator and related oil well formation analysis apparatus and method An apparatus and method for determining the density and other properties of a formation surrounding a borehole using a high voltage x-ray generator. One embodiment comprises a stable compact x-ray generator capable of providing radiation with energy of 250 keV and h... | 02/23/2010 |
| 7634059 | Downhole imaging tool utilizing x-ray generator An X-ray downhole imaging tool is provided and includes an X-ray tube capable of operating at least at 50 KeV and emitting at least one hundred micro-amperes of continuous electron current and a radiation detector axially displaced from the X-ray tube, at least part... | 12/15/2009 |
| 7474734 | Method and apparatus for void content measurement and method and apparatus for particle content measurement A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention incl... | 01/06/2009 |
| 7412022 | Non-invasive stationary system for three-dimensional imaging of density fields using periodic flux modulation of compton-scattered gammas A three-dimensional image-generating device is an inspection system incorporating three components: a radiation source, a modulating unit, and a radiation detector. All three components of the inspection system may be stationary. The radiation source irradiates an e... | 08/12/2008 |
| 7406153 | Control of X-ray beam spot size Apparatus for analysis of a sample includes a radiation source, which is configured to direct a beam of radiation along a beam axis to impinge on a target area on a surface of the sample. A detector assembly is configured to sense the radiation scattered from the sa... | 07/29/2008 |
| 7400706 | Method and apparatus for liquid safety-detection by backscatter with a radiation source A method and an apparatus for liquid safety-detection by backscattering with a radiation source are provided that relate to a radiation detecting technology field. The invention comprises using a radiation source, a collimator, a detector, a data collector and a com... | 07/15/2008 |
| 7330527 | Method and system of dynamically controlling shaping time of a photon counting energy-sensitive radiation detector to accommodate variations in incident radiation flux levels A method and system of counting and tagging radiation energy received by a radiation detector is presented. The method and system are designed to dynamically control the sampling window or shaping time characteristics of a photon counting detector to accommodate var... | 02/12/2008 |
| 7321652 | Multi-detector EDXRD A method for analysis of a sample includes irradiating an area of the sample with a polychromatic X-ray beam. X-rays scattered from the sample are detected using a plurality of detectors simultaneously in different, respective positions, whereby the detectors genera... | 01/22/2008 |
| 7304750 | Systems and methods for non-destructive mass sensing The invention provides systems and methods for measuring the mass of a substance. In one method, energy is applied to a substance and a response resulting from the application of energy as measured. The mass of the substance is then determined based at least in part... | 12/04/2007 |
| 7285775 | Endpoint detection for the patterning of layered materials Photoelectron emissions are used to detect an endpoint of a thickness alteration of a topmost layer in a set of layers undergoing patterning. The set of layers are irradiated, which causes an emission of photoelectrons. Upon receipt of or absence of a photoelectron ... | 10/23/2007 |
| 7281361 | Method of article portioning A method for detecting and discriminating articles that are within a predetermined range of a specification into lots feeds a plurality of articles into an article portioning system having a counting head assembly that includes an article detecting unit located abov... | 10/16/2007 |
| 7266178 | Calibration source for X-ray detectors A method and device for calibrating the energy response of detectors of photons in the range from about 0.5 keV to at least 100 keV. The device makes use of the inherent property of a polarizable crystal such as a pyroelectric crystal to produce monoenergetic x-rays... | 09/04/2007 |
| 7257192 | Method and apparatus for X-ray reflectance measurement In a method for X-ray reflectance measurement in which an intensity of a reflected X-ray is observed for each incident angle, a measuring scale for the incident angle ω is corrected, before the reflectance measurement, using an analyzer crystal. In the corrective o... | 08/14/2007 |
| 7253901 | Laser-based cleaning device for film analysis tool A system for analyzing a thin film uses an energy beam, such as a laser beam, to remove a portion of a contaminant layer formed on the thin film surface. This cleaning operation removes only enough of the contaminant layer to allow analysis of the underlying thin fi... | 08/07/2007 |
| 7250608 | Radiographic image detector and radiographic imaging system A radiographic image detector to detect radiation applied thereto and obtain radiographic image information, includes: an internal power supply to supply power to drive units at least upon imaging; a communication unit to perform communication with an external devic... | 07/31/2007 |
| 7247865 | System and method of detecting, neutralizing, and containing suspected contaminated articles A comprehensive system and method of rendering the mail safe for handling and for detecting and containing suspect pieces and which can be fitted or retrofitted into mail and package processing facilities with relative ease. The system of the present invention inclu... | 07/24/2007 |
| 7245695 | Detection of dishing and tilting using X-ray fluorescence A method for testing a material applied to a surface of a sample includes directing an excitation beam, having a known beam-width and intensity cross-section, onto a region of the sample. An intensity of X-ray fluorescence emitted from the region responsively to the... | 07/17/2007 |
| 7242743 | X-ray diffraction apparatus and method A high resolution X-ray diffraction apparatus includes a source 4 of X-rays and a slit 6 to direct a collimated beam of X-rays 11 onto a sample 16 on a sample stage 8. Detector 10 records the intensity of diffracted X-rays a... | 07/10/2007 |
| 7235780 | Method and system for detecting a property of a pavement by measuring gamma-radiation For detecting a property of at least one layer (301) of a pavement (300), a flux of radiation of energy levels or at least one range selected from an energy spectrum received from the pavement is measured in a position above the pavement. The measured ... | 06/26/2007 |
| 7231016 | Efficient measurement of diffuse X-ray reflections A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse ref... | 06/12/2007 |
| 7221734 | Method for X-ray reflectance measurement An X-ray reflectance is measured with the use of an X-ray detector, which is not less than 107 cps in upper-limit counting rate and is not more than twenty cps in noise level, under the condition that a measuring time length per interval of scattering ang... | 05/22/2007 |
| 7202951 | Laser-based cleaning device for film analysis tool A system for analyzing a thin film uses an energy beam, such as a laser beam, to remove a portion of a contaminant layer formed on the thin film surface. This cleaning operation removes only enough of the contaminant layer to allow analysis of the underlying thin fi... | 04/10/2007 |
| 7149278 | Method and system of dynamically controlling shaping time of a photon counting energy-sensitive radiation detector to accommodate variations in incident radiation flux levels A method and system of counting and tagging radiation energy received by a radiation detector is presented. The method and system are designed to dynamically control the sampling window or shaping time characteristics of a photon counting detector to accommodate var... | 12/12/2006 |
| 7130376 | X-ray reflectometry of thin film layers with enhanced accuracy A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the su... | 10/31/2006 |
| 7127027 | Direct conversion energy discriminating CT detector A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direct... | 10/24/2006 |
| 7120228 | Combined X-ray reflectometer and diffractometer Apparatus for analysis of a sample includes a radiation source, which is adapted to direct a converging beam of X-rays toward a surface of the sample. At least one detector array is arranged to sense the X-rays scattered from the sample as a function of elevation an... | 10/10/2006 |
| 7116755 | Non-uniform density sample analyzing method, device and system A non-uniform density sample analyzing method for analyzing a distribution state of particle-like matter in a non-uniform density sample, where an actually measured X-ray scattering curve is an in-plane X-ray scattering curve obtained by in-plane diffraction measure... | 10/03/2006 |
| 7116754 | Diffractometer A monochromator 4 is used to direct X-rays from X-ray source 2 onto a sample 14 as a convergent beam. The sample 14 is in a growth chamber. The sample is rotated, and diffraction measurements are made in parallel with multichannel detecto... | 10/03/2006 |
| 7113566 | Enhancing resolution of X-ray measurements by sample motion A method for inspection of a sample includes directing a beam of X-rays toward a sample and configuring an array of detector elements to capture the X-rays scattered from the sample. The sample is shifted in a direction parallel to the axis of the array between at l... | 09/26/2006 |
| 7110491 | Measurement of critical dimensions using X-ray diffraction in reflection mode A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on an area of a periodic feature on a surface of the sample and receiving the X-rays scattered from the surface in a reflection mode so as to detect a spectrum of diffraction in t... | 09/19/2006 |
| 7098409 | Apparatus for weighing materials online An apparatus for weighing materials online is disclosed, which belongs to an art of online weighing of material. The apparatus comprises: a light-emitting unit, emitting light beams irradiating on the surface of materials transported on a belt to form a bright proje... | 08/29/2006 |
| 7099007 | Method for determining ion concentration and energy of shallow junction implants A method is disclosed for measuring the dose and energy level of ion implants forming a shallow junction in a semiconductor sample. In the method, two independent measurements of the sample are made. The first measurement monitors the response of the sample to perio... | 08/29/2006 |
| 7092485 | X-ray inspection system for detecting explosives and other contraband A baggage scanning system and method employ combined angular and energy dispersive x-ray scanning to detect the presence of a contraband substance within an interrogation volume of a baggage item. The interrogation volume is illuminated with penetrating, polychromat... | 08/15/2006 |
| 7076024 | X-ray apparatus with dual monochromators X-ray apparatus, consisting of a single X-ray tube which is adapted to generate X-rays and a first optic which is adapted to focus a first portion of the X-rays onto a region of a sample via a first beam path, thereby generating first scattered X-rays from the regio... | 07/11/2006 |
| 7068753 | Enhancement of X-ray reflectometry by measurement of diffuse reflections A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse ref... | 06/27/2006 |
| 7060980 | Method and system for combined photothermal modulated reflectance and photothermal IR radiometric system A method and apparatus for evaluating a semiconductor wafer. A combination of a photothermal modulated reflectance method and system with a photothermal IR radiometry system and method is utilized to provide information which can be used to determine properties of s... | 06/13/2006 |
| 7062013 | X-ray reflectometry of thin film layers with enhanced accuracy A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the su... | 06/13/2006 |
| 7047819 | Testing of samples Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, and processing means for processing the signals resulting from the monitoring of the sample... | 05/23/2006 |
