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Class 378/85 - With plural dispersing elements


Subclass of Class 378 - X-ray or gamma ray systems or devices
Definition: Subject matter comprising plural elements for focusing or
No. of patents: 202
Last issue date: 09/13/2011


1            
NumberTitleIssue Date
8019043High-resolution X-ray optic and method for constructing an X-ray optic
Described are optical apparatuses and methods for forming optical apparatuses. The optical apparatus includes a plurality of individually fabricated segments and a holder. Each of the plurality of individually fabricated segments include an inner annular surface and...
09/13/2011
7813476X-ray beam processor
An x-ray beam processor and system that includes an x-ray beam generator for generating x-ray beams; a mirror shield for shielding the x-ray beams from select areas; a cylindrical waveguide for guiding x-ray beams traveling through the waveguide, which includes a pl...
10/12/2010
7738630Highly aligned x-ray optic and source assembly for precision x-ray analysis applications
An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot...
06/15/2010
7684543X-ray beam conditioning device and X-ray analysis apparatus
An X-ray beam conditioning device that has a crystal holder and a motor is provided. The crystal holder supports a first crystal block and a second crystal block, each of which diffracts X-ray by a specific diffraction angle. The motor can rotate the crystal holder ...
03/23/2010
7555098Method and apparatus for X-ray fluorescence analysis and detection
A detector apparatus is disclosed that includes a housing and a multilayer disposed within the housing. The multilayer defining a leading edge and a trailing edge and is adapted to interact with a plurality of high-energy photons, impingent from the leading edge, to...
06/30/2009
7548607Refractive x-ray element
For reducing absorption in a refractive element, the present invention relates to a refractive element (10, 20), suitable for refracting x-rays, comprising a body with low-Z material having a first end adapted to receive rays emitted from a ray source and a s...
06/16/2009
7508912Sagittal focusing Laue monochromator
An x-ray focusing device generally includes a slide pivotable about a pivot point defined at a forward end thereof, a rail unit fixed with respect to the pivotable slide, a forward crystal for focusing x-rays disposed at the forward end of the pivotable slide and a ...
03/24/2009
7440546Method of making and structure of multilayer laue lens for focusing hard x-rays
A zone plate multilayer structure includes a substrate carrying a plurality of alternating layers respectively formed of tungsten silicide (WSi2) and silicon (Si). The alternating layers are sequentially deposited precisely controlling a thickness of each...
10/21/2008
7412030Apparatus employing conically parallel beam of X-rays
An apparatus directing x-rays along a predetermined axis includes an x-ray optic having one or more nested x-ray reflector rings positioned relative to a source generating broad spectrum x-rays so that generated x-rays moving away from the predetermined axis are col...
08/12/2008
7403593Hybrid x-ray mirrors
An x-ray mirror provides focusing and monochromatization while maintaining a high degree of reflectivity. The mirror has at least two mirror portions, one with a multilayer surface that provides the desired monochromating, and the other with a total external reflect...
07/22/2008
7400699Illumination system with raster elements of different sizes
There is provided an illumination system for lithography with wavelengths of ≦193 mn. The system comprises a first optical element, which is divided into first raster elements and lies in a first plane. The first plane defines an x-direction and a y-direction, the...
07/15/2008
7333188Method and apparatus for real-time measurement of trace metal concentration in chemical mechanical polishing (CMP) slurry
A system (and method) for real-time measurement of trace metal concentration in a chemical mechanical polishing (CMP) slurry, includes an electromagnetic radiation flow cell carrying a CMP slurry, a slurry pickup head coupled to the flow cell, and an analyzer for me...
02/19/2008
7331714Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument
A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging....
02/19/2008
7330530Diffraction enhanced imaging method using a line x-ray source
A method for detecting an enhanced image of an object by independently analyzing, detecting, digitizing, and combining images acquired on a high and a low angle side of a rocking curve of a crystal analyzer. An x-ray beam generated by a line x-ray source is collimat...
02/12/2008
7312462Illumination system having a nested collector for annular illumination of an exit pupil
There is provided an illumination system. The illumination system includes a source for light having a wavelength ≦193 nm, a field plane, and a collector having a mirror shell for receiving a part of the light. The mirror shell is arranged so that a real image of ...
12/25/2007
7305066X-ray generating equipment
An X-ray generating apparatus for generating X-rays by irradiating a target with an electron beam. Wherein the apparatus includes a vibration applying means for vibrating the target in directions parallel to a surface thereof. A colliding spot of the electron beam i...
12/04/2007
7302044X-ray generator tube comprising an orientable target carrier system
The field of the invention is that of X-ray generator tubes. The invention relates more specifically to the arrangement of the emitting surfaces which are the source of the X-ray radiation. It is known that the inclination of the emitting surface known as the target...
11/27/2007
7286628Phase-contrast enhanced computed tomography
A phase-contrast x-ray computed tomography scanner, a monochromatic diffraction computed tomography scanner, a rotatable monochromatic diffraction computed tomography scanner, and a combination phase-contrast and monochromatic computed tomography scanner are provide...
10/23/2007
7280634Beam conditioning system with sequential optic
An x-ray beam conditioning system with a first diffractive element and a second diffractive element. The two diffractive elements are arranged in a sequential configuration, and one of the diffractive elements is a crystal. The other diffractive element may be a mul...
10/09/2007
7263163X-ray lens
In an x-ray lens for focusing x-rays over a large energy range wherein the lens comprises a large number of lens elements, the lens elements have a quasi-parabolic profile Y(x) according to the equation Y(x)=x2/2[(r+f...
08/28/2007
7248670Optical unit and associated method
The invention relates to an optical assembly with a laterally graded reflective multilayer whose reflecting surface reflects incident X-rays under low incidence angles to produce a two-dimensional optical effect. The reflecting surface comprises a single surface con...
07/24/2007
7248667Illumination system with a grating element
An illumination system, particularly for wavelengths ≦100 nm, with an object plane and a field plane, comprises a grating element and a physical diaphragm in a diaphragm plane, which is arranged downstream to the grating element in the beam path from the object pl...
07/24/2007
7245699X-ray optical system with adjustable convergence
An x-ray optical device includes an optic and an adjustable aperture that selectively occludes a portion of an x-ray beam. The adjustable aperture may be positioned between the optic and a sample and may be integrated with the optic or located in close proximity to ...
07/17/2007
7244954Collector having unused region for illumination systems using a wavelength ≦193 nm
There is provided a collector for illumination systems for light having a wavelength ≦193 nm comprising. The collector includes (a) a first mirror shell adjacent to, and positioned inside of, a second mirror shell around a common axis of rotation, in which the fir...
07/17/2007
7242746Method for manufacturing a reflector for X-ray radiation
A method for manufacturing a reflector (5) for X-ray radiation (2, 3, 10, 11) which is curved in a non-circular arc shape, along a first cross-section (13) in a plane (XZ) which contains a x-direction, wherein the reflector (5) is also cu...
07/10/2007
7239443Condenser optic with sacrificial reflective surface
Employing collector optics that has a sacrificial reflective surface can significantly prolong the useful life of the collector optics and the overall performance of the condenser in which the collector optics are incorporated. The collector optics is normally subje...
07/03/2007
7236566In-situ X-ray diffraction system using sources and detectors at fixed angular positions
An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation—with a collimating optic disposed with respect to t...
06/26/2007
7190761X-ray image radiographing method and radiographing apparatus
A X-ray image radiographing method of detecting a X-ray image passing an object irradiated with X-ray emitted from a X-ray tube by a X-ray detector, includes a step of increasing a sharpness of an image lowered due to penumbra by enhancing an edge of the image with ...
03/13/2007
7187753Monochromator for an X-ray radiator allowing modification of the X-ray spectral composition
A monochromator to be used in an X-ray device having an X-ray source is formed by a crystal for spectral restriction of X-rays produced by the X-ray source. The monochromator includes a positioning device that can move the crystal so that it changes the spectral com...
03/06/2007
7162009X-ray multi-layer mirror and x-ray exposure apparatus
An X-ray multi-layer mirror having a reflection characteristic with a wider incident angle range is realized by conducting optimization processing on an Mo/Si alternate layer having a constant thickness. Film thickness distributions of Si layers and Mo layers in the...
01/09/2007
7149279Detecting unit for X-ray diffraction measurements
Detecting unit comprises position-sensitive detector 1 and collimating system 2, situated in front of its window 19. Collimating system being made in the form of honeycomb structure comprising multitude of tubular channels for transmittance of d...
12/12/2006
7135692Lithographic apparatus, illumination system and method for providing a projection beam of EUV radiation
A lithographic apparatus is disclosed. The lithographic apparatus includes an illumination system that provides a beam of radiation, and a support structure that supports a patterning structure. The patterning structure is configured to impart the beam of radiation ...
11/14/2006
7130375High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especi...
10/31/2006
7130370Method and apparatus for producing an image of the internal structure of an object
Inventions related to the intra-vision means, designed for production of visually sensed images of the internal structure of an object, in particular, of a biological object, are aimed at higher accuracy of determining the relative density indices of the object's su...
10/31/2006
7119953Phase contrast microscope for short wavelength radiation and imaging method
A phase contrast x-ray microscope has a phase plate that is placed in proximity of and attached rigidly to the objective to form a composite optic. This enables easier initial and long-term maintenance of alignment of the microscope. In one example, they are fabrica...
10/10/2006
7116405Maskless, microlens EUV lithography system with grazing-incidence illumination optics
An EUV lithography system achieves high-resolution printing without the use of photomasks, projection optics, multilayer mirrors, or an extremely high-power EUV source. The system comprises a xenon laser-produced-plasma (LPP) illumination source (requiring 93 W hemi...
10/03/2006
7113567Apparatus and method for the analysis of atomic and molecular elements by wavelength dispersive x-ray spectrometric devices
In an apparatus and a method for the analysis of atomic or molecular elements contained in a sample by wavelength dispersive X-ray spectrometry, wherein primary x ray or electron radiation is directed onto the sample whereby fluorescence radiation is emitted from th...
09/26/2006
7110503X-ray measuring and testing system
The complex is intended for carrying out research in the X-ray range at several analytical devices 5 simultaneously. The complex comprises a source 1 of divergent X-rays, for example an X-ray tube and x-ray lenses 2 for radiation transporting to...
09/19/2006
7099437Double crystal analyzer linkage
A double crystal analyzer linkage includes the fixed pivot point, a fixed pivot point shaft, and three sliding axis points constrained to allow only sliding motion along given linear, parallel paths. The three paths are arranged such that one path passes through the...
08/29/2006
7092488EUV, XUV, and X-ray wavelength sources created from laser plasma produced from liquid metal solutions
Metallic solutions at room temperature used a laser point source target droplets. Using the target metallic solutions results in damage free use to surrounding optical components since no debris are formed. The metallic solutions can produce plasma emissions in the ...
08/15/2006
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